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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea


  • Vol. 10, Iss. 4 — Dec. 25, 2006
  • pp: 188–195

Third-Harmonic Generation Microscopy for Material Characterization

Arnaud Royon, Bruno Bousquet, Lionel Canioni, Mona Treguer, Thierry Cardinal, Evelyne Fargin, Dae-Geun Kim, and Seung-Han Park  »View Author Affiliations

Journal of the Optical Society of Korea, Vol. 10, Issue 4, pp. 188-195 (2006)

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Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then applied to characterize different types of materials in terms of electronic third-order susceptibility. Examples of bulk glasses, poled glasses, laser-induced modifications in glasses and nanoparticles in solution are given in order to give a survey of the broad application field of THG microscopy in material characterization.

© 2006 Optical Society of Korea

OCIS Codes
(180.0180) Microscopy : Microscopy
(190.4180) Nonlinear optics : Multiphoton processes
(300.6420) Spectroscopy : Spectroscopy, nonlinear

Original Manuscript: December 15, 2006
Revised Manuscript: December 20, 2006
Published: December 25, 2006

Arnaud Royon, Bruno Bousquet, Lionel Canioni, Mona Treguer, Thierry Cardinal, Evelyne Fargin, Dae-Geun Kim, and Seung-Han Park, "Third-Harmonic Generation Microscopy for Material Characterization," J. Opt. Soc. Korea 10, 188-195 (2006)

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