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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea

| PUBLISHED BY THE OPTICAL SOCIETY OF KOREA

  • Vol. 15, Iss. 2 — Jun. 1, 2011
  • pp: 146–151

Precise Test Sieves Calibration Method Based on Off-axis Digital Holography

Dahi Ghareab Abdelsalam, Byung-Joon Baek, and Dae-Suk Kim  »View Author Affiliations


Journal of the Optical Society of Korea, Vol. 15, Issue 2, pp. 146-151 (2011)


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Abstract

We describe, throughout a Mach-Zehnder interferometric configuration, a new test sieves calibration method based on off-axis digital holography. The experiment is conducted on a test sieve of square openings. The nominal sieve opening is 1.00 mm with maximum individual opening of 1.14 mm in size. The recorded off-axis hologram is numerically processed using Fresnel transforms to obtain an object wave (amplitude and phase). From the reconstructed phase, the average size of the illuminated openings has been measured precisely. The proposed method can provide a real time solution for calibrating test sieves very precisely and with moderate accuracy.

© 2011 Optical Society of Korea

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(090.1995) Holography : Digital holography

History
Original Manuscript: December 1, 2010
Revised Manuscript: March 8, 2011
Manuscript Accepted: April 5, 2011
Published: June 25, 2011

Citation
Dahi Ghareab Abdelsalam, Byung-Joon Baek, and Dae-Suk Kim, "Precise Test Sieves Calibration Method Based on Off-axis Digital Holography," J. Opt. Soc. Korea 15, 146-151 (2011)
http://www.opticsinfobase.org/josk/abstract.cfm?URI=josk-15-2-146


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