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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea

| PUBLISHED BY THE OPTICAL SOCIETY OF KOREA

  • Vol. 13, Iss. 3 — Sep. 25, 2009
  • pp: 341–348

Scientific and Engineering Applications of Full-field Swept-source Optical Coherence Tomography

Dalip Singh Mehta, Tulsi Anna, and Chandra Shakher  »View Author Affiliations


Journal of the Optical Society of Korea, Vol. 13, Issue 3, pp. 341-348 (2009)


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Abstract

We report the development of full-field swept-source optical coherence tomography (SS-OCT) in the wavelength range of 815-870 nm using a unique combination of super-luminescent diode (SLD) as broad-band light source and acousto-optic tunable filter (AOTF) as a frequency-scanning device. Some new applications of full-field SS-OCT in forensic sciences and engineering materials have been demonstrated. Results of simultaneous topography and tomography of latent fingerprints, silicon microelectronic circuits and composite materials are presented. The main advantages of the present system are completely non-mechanical scanning, wide-field, compact and low-cost.

© 2009 Optical Society of Korea

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.0180) Medical optics and biotechnology : Microscopy
(170.4500) Medical optics and biotechnology : Optical coherence tomography

History
Original Manuscript: June 3, 2009
Revised Manuscript: August 29, 2009
Manuscript Accepted: August 31, 2009
Published: September 25, 2009

Citation
Dalip Singh Mehta, Tulsi Anna, and Chandra Shakher, "Scientific and Engineering Applications of Full-field Swept-source Optical Coherence Tomography," J. Opt. Soc. Korea 13, 341-348 (2009)
http://www.opticsinfobase.org/josk/abstract.cfm?URI=josk-13-3-341


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