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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea

| PUBLISHED BY THE OPTICAL SOCIETY OF KOREA

  • Vol. 17, Iss. 2 — Apr. 1, 2013
  • pp: 136–141

Determination of Transverse Magnifications by Distortion Analysis

Sukmock Lee and Byungoh Kim  »View Author Affiliations


Journal of the Optical Society of Korea, Vol. 17, Issue 2, pp. 136-141 (2013)


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Abstract

A method to determine the transverse magnification (TM) of an imaging system is discussed. This method is different in that TM can be determined accurately by using distortion analysis. We demonstrate the validity of the method via numerical simulation with accompanying experimental data for a thick bi-convex lens.

© 2013 Optical Society of Korea

OCIS Codes
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(080.2468) Geometric optics : First-order optics

History
Original Manuscript: January 31, 2013
Manuscript Accepted: March 6, 2013
Published: April 25, 2013

Citation
Sukmock Lee and Byungoh Kim, "Determination of Transverse Magnifications by Distortion Analysis," J. Opt. Soc. Korea 17, 136-141 (2013)
http://www.opticsinfobase.org/josk/abstract.cfm?URI=josk-17-2-136


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