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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea


  • Vol. 9, Iss. 2 — Jun. 25, 2005
  • pp: 49–53

Reflection-type Optical Waveguide Index Profiling Technique

YoungChun Youk and Dug Young Kim  »View Author Affiliations

Journal of the Optical Society of Korea, Vol. 9, Issue 2, pp. 49-53 (2005)

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We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode (LED) at 650 nm wavelength instead of a laser diode (LD) or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. We have obtained spatial resolution of 700 nm and an index precision of <TEX>$2\times10^{-4}$</TEX>. To verify the system's capability, the refractive index profiles of a conventional multimode fiber and a home-made four-mode fiber were examined with our proposed measurement method.

© 2005 Optical Society of Korea

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2300) Fiber optics and optical communications : Fiber measurements
(180.1790) Microscopy : Confocal microscopy

Original Manuscript: March 15, 2005
Revised Manuscript: April 4, 2005
Published: June 1, 2005

YoungChun Youk and Dug Young Kim, "Reflection-type Optical Waveguide Index Profiling Technique," J. Opt. Soc. Korea 9, 49-53 (2005)

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