Revised metrology for enhanced accuracy in complex optical constant determination by THz-time-domain spectrometry

• Abstract

• JOSA A, Vol. 30, Issue 5, pp. 979-986 (May 2013)
• Oleksandr Sushko, Kastriot Shala, Rostyslav Dubrovka, Robert Donnan

Double-negative atomic vapor assisted by two-photon quantum coherence

• Abstract

• JOSA B, Vol. 29, Issue 11, pp. 3192-3200 (November 2012)
• Jian Qi Shen

Indefinite permittivity in KTP single crystal at infrared frequency

• Abstract

• JOSA B, Vol. 30, Issue 2, pp. 324-327 (February 2013)
• Hongya Wu, Jingbo Sun, Ji Zhou, Bo Li, Longtu Li

Ultraviolet dynamical optical limiting in a glass containing NaNbO₃ nanocrystals

• Abstract

• JOSA B, Vol. 30, Issue 5, pp. 1284-1289 (May 2013)
• Euclides Almeida, Kelly C. Jorge, Leonardo de S. Menezes, Cid B. de Araújo, Andrey A. Lipovskii

Full-field imaging-based instantaneous hyperspectral absolute refractive index measurement

• Abstract

• Optics Letters, Vol. 37, Issue 9, pp. 1520-1522 (May 2012)
• Justin S. Baba, Philip R. Boudreaux

Phase retrieval of reflectance for nanoparticle optical identification

• Abstract

• Optics Letters, Vol. 37, Issue 12, pp. 2202-2204 (June 2012)
• Jarkko J. Saarinen, Jun Uozumi, Erik M. Vartiainen, Kai-Erik Peiponen

Optical model enabling the use of Abbe-type refractometers on turbid suspensions

• Abstract

• Optics Letters, Vol. 38, Issue 5, pp. 775-777 (March 2013)
• Augusto García-Valenzuela, Humberto Contreras-Tello

Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

• Abstract

• Optics Letters, Vol. 38, Issue 9, pp. 1563-1565 (May 2013)
• C. W. Gayer, D. Hemmers, C. Stelzmann, G. Pretzler

Simultaneous measurement of electro-optical and converse-piezoelectric coefficients of PMN-PT ceramics

• Abstract

• Optics Express, Vol. 20, Issue 13, pp. 13833-13840 (June 2012)
• Pingping Xiao, Xianping Wang, Jingjing Sun, Meizhen Huang, Xianfeng Chen, Zhuangqi Cao

THz conductivities of indium-tin-oxide nanowhiskers as a graded-refractive-index structure

• Abstract

• Optics Express, Vol. 20, Issue 104, pp. A441-A451 (July 2012)
• Chan-Shan Yang, Chia-Hua Chang, Mao-Hsiang Lin, Peichen Yu, Osamu Wada, Ci-Ling Pan

Measurement of nonlinear refractive index coefficient using emission spectrum of filament induced by gigawatt-femtosecond pulse in BK7 glass

• Abstract

• Applied Optics, Vol. 51, Issue 12, pp. 2045-2050 (April 2012)
• Xing Lu, Qingcao Liu, Zuoye Liu, Shaohua Sun, Pengji Ding, Baowei Ding, Bitao Hu

Double slit interferometry to measure the EUV refractive indices of solids using high harmonics

• Abstract

• Applied Optics, Vol. 51, Issue 12, pp. 2057-2061 (April 2012)
• Lucy A. Wilson, Andrew K. Rossall, Erik Wagenaars, Cephise M. Cacho, Emma Springate, I. C. Edmond Turcu, Greg J. Tallents

Method for improving terahertz band absorption spectrum measurement accuracy using noncontact sample thickness measurement

• Abstract

• Applied Optics, Vol. 51, Issue 20, pp. 4879-4884 (July 2012)
• Zhi Li, Zhaohui Zhang, Xiaoyan Zhao, Haixia Su, Fang Yan, Han Zhang

Fine structures in refractive index of sapphire at the L_II,III absorption edge of aluminum determined by soft x-ray resonant reflectivity

• Abstract

• Applied Optics, Vol. 51, Issue 30, pp. 7402-7410 (October 2012)
• Arijeet Das, Rajkumar K. Gupta, Mohammed H. Modi, Chandrachur Mukherjee, Sanjay K. Rai, Aniruddha Bose, Tapas Ganguli, Satish C. Joshi, Gyan S. Lodha, Sudip K. Deb

Refractive index measurement by fiber point diffraction longitudinal shearing interferometry

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3655-3661 (June 2013)
• Lingfeng Chen, Xiaofei Guo, Jinjian Hao

Design and performance of an absolute gas refractometer based on a synthetic pseudo-wavelength method

• Abstract

• Applied Optics, Vol. 52, Issue 16, pp. 3671-3679 (June 2013)
• Jitao Zhang, Pei Huang, Yan Li, Haoyun Wei

Determination of piezo-optic coefficients of crystals by means of four-point bending

• Abstract

• Applied Optics, Vol. 52, Issue 17, pp. 4054-4061 (June 2013)
• Oleg Krupych, Viktoriya Savaryn, Andriy Krupych, Ivan Klymiv, Rostyslav Vlokh

Determination of Optical Constants of Thin Films in Extreme Ultraviolet Wavelength Region by an Indirect Optical Method

• Abstract

• Journal of the Optical Society of Korea, Vol. 17, Issue 1, pp. 38-43 (February 2013)
• Hee Young Kang, Jai Dong Lim, Pazhanisami Peranantham, Chang Kwon HwangBo

The dielectric function of PbS quantum dots in a glass matrix

• Abstract

• Optical Materials Express, Vol. 2, Issue 5, pp. 496-500 (May 2012)
• Iwan Moreels, Detlef Kruschke, Peter Glas, Jens W. Tomm

Tailoring the optical constants of diamond by ion implantation

• Abstract

• Optical Materials Express, Vol. 2, Issue 5, pp. 644-649 (May 2012)
• M. A. Draganski, E. Finkman, B. C. Gibson, B. A. Fairchild, K. Ganesan, N. Nabatova-Gabain, S. Tomljenovic-Hanic, A. D. Greentree, S. Prawer