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Journal of the Optical Society of Korea

Journal of the Optical Society of Korea

| PUBLISHED BY THE OPTICAL SOCIETY OF KOREA

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Instrumentation, measurement, and metrology : Thermal effects


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  • JOSA A, Vol. 32, Issue 1, pp. 61-74 (January 2015)
  • Dorota Korte, Mladen Franko

  • Optics Letters, Vol. 39, Issue 22, pp. 6438-6441 (November 2014)
  • Hang Zhou Yang, Xue Guang Qiao, S. Das, Mukul Chandra Paul

  • Optics Letters, Vol. 39, Issue 23, pp. 6743-6746 (December 2014)
  • Jinxin Guo, Ryuta Fujii, Takanori Ono, Jürgen Klepp, Christian Pruner, Martin Fally, Yasuo Tomita

  • Optics Letters, Vol. 40, Issue 2, pp. 205-208 (January 2015)
  • Rudolf Saathof, Gerrit Jan M. Schutten, Jo W. Spronck, Robert H. Munnig Schmidt

  • Optics Letters, Vol. 40, Issue 6, pp. 1049-1052 (March 2015)
  • Tiegen Liu, Jinde Yin, Junfeng Jiang, Kun Liu, Shuang Wang, Shengliang Zou

  • Optics Express, Vol. 22, Issue 21, pp. 26098-26102 (October 2014)
  • Anton Ryabtsev, Shahram Pouya, Manoochehr Koochesfahani, Marcos Dantus

  • Optics Express, Vol. 23, Issue 3, pp. 2879-2888 (February 2015)
  • Ling-Xiu Zou, Yong-Zhen Huang, Bo-Wen Liu, Xiao-Meng Lv, Xiu-Wen Ma, Yue-De Yang, Jin-Long Xiao, Yun Du

  • Optics Express, Vol. 23, Issue 4, pp. 5134-5146 (February 2015)
  • Xiaojiao Dai, Yanyi Jiang, Chao Hang, Zhiyi Bi, Longsheng Ma

  • Optics Express, Vol. 23, Issue 6, pp. 7237-7247 (March 2015)
  • Guigen Liu, Ming Han, Weilin Hou

  • Optics Express, Vol. 23, Issue 7, pp. 9329-9338 (April 2015)
  • A. J. Trindade, B. Guilhabert, E. Y. Xie, R. Ferreira, J. J. D. McKendry, D. Zhu, N. Laurand, E. Gu, D. J. Wallis, I. M. Watson, C. J. Humphreys, M. D. Dawson

  • Applied Optics, Vol. 53, Issue 24, pp. 5448-5452 (August 2014)
  • Peng-cheng Hu, Peng Chen, Xue-mei Ding, Jiu-bin Tan

  • Applied Optics, Vol. 53, Issue 27, pp. 6243-6255 (September 2014)
  • Ji Zhou, Zhihong He, Yu Ma, Shikui Dong

  • Applied Optics, Vol. 53, Issue 27, pp. 6274-6279 (September 2014)
  • Chang Songtao, Zhang Yaoyu, Sun Zhiyuan, Li Min

  • Applied Optics, Vol. 54, Issue 4, pp. 728-738 (February 2015)
  • T. J. Pinkert, O. Böll, L. Willmann, G. S. M. Jansen, E. A. Dijck, B. G. H. M. Groeneveld, R. Smets, F. C. Bosveld, W. Ubachs, K. Jungmann, K. S. E. Eikema, J. C. J. Koelemeij

  • Applied Optics, Vol. 54, Issue 5, pp. 1032-1040 (February 2015)
  • Rana Tabassum, Banshi D. Gupta

  • Applied Optics, Vol. 54, Issue 8, pp. 1861-1869 (March 2015)
  • Xiaorong Zhang, Bincheng Li

  • Applied Optics, Vol. 54, Issue 8, pp. 2046-2056 (March 2015)
  • Hagen Lorenz, Erik Beckert, René Schödel

  • Applied Optics, Vol. 54, Issue 11, pp. 3162-3172 (April 2015)
  • Hangzhou Wang, Hong Song, Ying Chen, Samuel R. Laney

  • Applied Optics, Vol. 54, Issue 13, pp. D74-D81 (May 2015)
  • Amirhossein Ahadi, M. Ziad Saghir

  • Optical Materials Express, Vol. 4, Issue 11, pp. 2280-2289 (November 2014)
  • D. Quiñonez-Urias, A. Vera-Marquina, D. Berman-Mendoza, A. L. Leal-Cruz, L. A. García-Delgado, I. E. Zaldívar-Huerta, A. García-Juárez, A. G. Rojas-Hernández, R. Gómez-Fuentes
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