Masked fake face detection using radiance measurements

• Abstract

• JOSA A, Vol. 26, Issue 4, pp. 760-766 (April 2009)
• Youngshin Kim, Jaekeun Na, Seongbeak Yoon, Juneho Yi

Measurement of a bidirectional reflectance distribution and system achievement based on a hemi-parabolic mirror

• Abstract

• Optics Letters, Vol. 35, Issue 9, pp. 1458-1460 (May 2010)
• Ju Ren, Jianlin Zhao

Temporal cross-correlation of x-ray free electron and optical lasers using soft x-ray pulse induced transient reflectivity

• Abstract

• Optics Express, Vol. 20, Issue 10, pp. 11396-11406 (May 2012)
• O. Krupin, M. Trigo, W. F. Schlotter, M. Beye, F. Sorgenfrei, J. J. Turner, D. A. Reis, N. Gerken, S. Lee, W. S. Lee, G. Hays, Y. Acremann, B. Abbey, R. Coffee, M. Messerschmidt, S. P. Hau-Riege, G. Lapertot, J. Lüning, P. Heimann, R. Soufli, M. Fernández-Perea, M. Rowen, M. Holmes, S. L. Molodtsov, A. Föhlisch, W. Wurth

Efficiency improvement in InGaN-based solar cells by indium tin oxide nano dots covered with ITO films

• Abstract

• Optics Express, Vol. 20, Issue 106, pp. A991-A996 (November 2012)
• Dong-Ju Seo, Jae-Phil Shim, Sang-Bae Choi, Tae Hoon Seo, Eun-Kyung Suh, Dong-Seon Lee

Experimental demonstration of reflectarray antennas at terahertz frequencies

• Abstract

• Optics Express, Vol. 21, Issue 3, pp. 2875-2889 (February 2013)
• Tiaoming Niu, Withawat Withayachumnankul, Benjamin S.-Y. Ung, Hakan Menekse, Madhu Bhaskaran, Sharath Sriram, Christophe Fumeaux

Enhanced luminous efficacy in phosphor-converted white vertical light-emitting diodes using low index layer

• Abstract

• Optics Express, Vol. 21, Issue 5, pp. 6353-6359 (March 2013)
• Seung Hwan Kim, Young Ho Song, Seong Ran Jeon, Tak Jeong, Ja Yeon Kim, Jun Seok Ha, Wan Ho Kim, Jong Hyeob Baek, Gye Mo Yang, Hyung Jo Park

Pore size dependence of diffuse light scattering from anodized aluminum solar cell backside reflectors

• Abstract

• Optics Express, Vol. 21, Issue 101, pp. A84-A95 (January 2013)
• Yao-Chung Tsao, Thomas Søndergaard, Esben Skovsen, Leonid Gurevich, Kjeld Pedersen, Thomas Garm Pedersen

Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials

• Abstract

• Applied Optics, Vol. 50, Issue 17, pp. 2773-2783 (June 2011)
• Peep Adamson

Remote identification of the invasive tunicate Didemnum vexillum using reflectance spectroscopy

• Abstract

• Applied Optics, Vol. 52, Issue 8, pp. 1758-1763 (March 2013)
• Thomas Leeuw, Seth O. Newburg, Emmanuel S. Boss, Wayne H. Slade, Michael G. Soroka, Judith Pederson, Chryssostomos Chryssostomidis, Franz S. Hover