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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 72, Iss. 11 — Nov. 1, 2005
  • pp: 849–854

The sensitivity threshold of IR devices based on array photodetectors

V. A. Markin  »View Author Affiliations


Journal of Optical Technology, Vol. 72, Issue 11, pp. 849-854 (2005)
http://dx.doi.org/10.1364/JOT.72.000849


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Abstract

A noise model of IR staring arrays is proposed that takes into account the combined action of the spatial and temporal components of the noise. It is used as a basis for obtaining simple relationships for calculating the sensitivity threshold of IR staring devices. How the residual spatial noise affects the relationship in the sensitivity between a staring array and a scanning linear array of photosensitive elements is considered. It is shown that the operation of IR staring devices under conditions of incomplete suppression of spatial noise makes it possible to narrow the spectral range.

Citation
V. A. Markin, "The sensitivity threshold of IR devices based on array photodetectors," J. Opt. Technol. 72, 849-854 (2005)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-72-11-849


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