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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 78, Iss. 1 — Jan. 1, 2011
  • pp: 19–24

Investigating the optical properties of nanostructures by modulation interference microscopy

P. S. Ignat’ev, A. V. Loparev, K. V. Indukaev, and P. A. Osipov  »View Author Affiliations


Journal of Optical Technology, Vol. 78, Issue 1, pp. 19-24 (2011)
http://dx.doi.org/10.1364/JOT.78.000019


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Abstract

A modulation interference microscope has been developed with record-breaking lateral resolution (10–100 nm) and high image-production rate (up to 250 frames per second). The optical layout of the device, the operating principles, and the problems of superhigh optical resolution in phase images are described. Possible ways of developing a method for modulation interference microscopy are discussed, along with areas in which the method can be used to study nanostructured materials, the topology of integrated microcircuits, and the morphology of biological objects.

© 2011 OSA

History
Original Manuscript: April 19, 2010
Published: January 31, 2011

Citation
P. S. Ignat’ev, A. V. Loparev, K. V. Indukaev, and P. A. Osipov, "Investigating the optical properties of nanostructures by modulation interference microscopy," J. Opt. Technol. 78, 19-24 (2011)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-78-1-19


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