Determining the thickness of thick transparent films by multiangle ellipsometry
Journal of Optical Technology, Vol. 69, Issue 1, pp. 58- (2002)
http://dx.doi.org/10.1364/JOT.69.000058
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Abstract
Citation
V. A. Tolmachev, "Determining the thickness of thick transparent
films by multiangle ellipsometry," J. Opt. Technol. 69, 58- (2002)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-69-1-58
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