Abstract

This paper discusses methods of accelerated preparation of samples on a transparent substrate suitable for the diffraction method of measuring the geometrical structure parameters of opaque fabrics. Two methods of obtaining copies from the material of interest are experimentally considered: by xerography, and by computer scanning. It is shown that the former method reduces the time for sample preparation by a factor of tens while maintaining the accuracy of the calculation of data corresponding to the experimental formulas proposed earlier. The applicability of these formulas is theoretically justified in terms of the Fresnel?Kirchhoff integral.

Sampling, Mixing, and Grinding Techniques in the Preparation of Samples for Quantitative Analysis by X-Ray Diffraction and Spectrographic Methods*1

James W. Ballard, H. I. Oshry, and H. H. Schrenk
J. Opt. Soc. Am. 33(12) 667-675 (1943)

Weave-repeat identification by structural analysis of fabric images

Miquel Ralló, Jaume Escofet, and María S. Millán
Appl. Opt. 42(17) 3361-3372 (2003)

Modeling of woven fabric structures based on Fourier image analysis

Jaume Escofet, María S. Millán, and Miquel Ralló
Appl. Opt. 40(34) 6170-6176 (2001)

Quasi-geometrical method for Fraunhofer diffraction calculations for three-dimensional bodies

Yu. V. Chugui, V. P. Koronkevitch, B. E. Krivenkov, and S. V. Mikhlyaev
J. Opt. Soc. Am. 71(4) 483-489 (1981)

Method for computationally efficient design of dielectric laser accelerator structures

Tyler Hughes, Georgios Veronis, Kent P. Wootton, R. Joel England, and Shanhui Fan
Opt. Express 25(13) 15414-15427 (2017)