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Multiple successive two-beam interference of light on a semiconductor metallic layer

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Abstract

It is shown that it is possible in practice to carry out multiple successive two-beam interference of light on a semitransparent metallic layer. Semitransparent layers made from certain metals give interference fringes of equal slope that are virtually coincident in phase on the two images of the source in a two-beam interferometer. This makes it possible to again superimpose the output beams on such a layer. A semitransparent chromium layer and a Mach-Zehnder interferometer with additional superpositions of the beams were used for this work. Patterns of the superposition of several systems of contrast interference fringes and the results of photometry are presented. The possibility of creating wide-angle stages for a narrow-band optical filter is discussed as the first use of this form of interference.

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