OSA's Digital Library

Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 72, Iss. 2 — Feb. 1, 2005
  • pp: 163–166

Using ellipsometric methods to study adsorbed layers of molecules

Yu. I. Asalkhanov, É. L. Saneev, É. Ch. Daribazaron, and E. S. Chagdurova  »View Author Affiliations


Journal of Optical Technology, Vol. 72, Issue 2, pp. 163-166 (2005)
http://dx.doi.org/10.1364/JOT.72.000163


View Full Text Article

Acrobat PDF (55 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The change of the polarization state of light reflected from single crystals of Si (111) has been recorded during the breakdown of the equilibrium state of molecules adsorbed on their surfaces. When samples in vacuum undergo pulsed illumination with the light of a mercury lamp, the time for the adsorbed layer to return to the equilibrium state is several minutes. © 2005 Optical Society of America

Citation
Yu. I. Asalkhanov, É. L. Saneev, É. Ch. Daribazaron, and E. S. Chagdurova, "Using ellipsometric methods to study adsorbed layers of molecules," J. Opt. Technol. 72, 163-166 (2005)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-72-2-163


Sort:  Journal  |  Reset

References

References are not available for this paper.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited