This paper discusses an ellipsometric method for measuring the optical constants and the magnetooptical parameter of thin magnetic films in a single experiment at a constant angle of incidence of the light. It is shown that the variation of the ellipsometric angles is affected by the optical and magnetooptic interference. An analysis is given of the equatorial Kerr effect in thin magnetic films. © 2005 Optical Society of America
O. I. Bakradze, "An ellipsometric method for measuring the parameters of thin magnetic films," J. Opt. Technol. 72, 225-226 (2005)
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