OSA's Digital Library

Journal of Optical Technology

Journal of Optical Technology


  • Vol. 72, Iss. 2 — Feb. 1, 2005
  • pp: 225–226

An ellipsometric method for measuring the parameters of thin magnetic films

O. I. Bakradze  »View Author Affiliations

Journal of Optical Technology, Vol. 72, Issue 2, pp. 225-226 (2005)

View Full Text Article

Acrobat PDF (36 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



This paper discusses an ellipsometric method for measuring the optical constants and the magnetooptical parameter of thin magnetic films in a single experiment at a constant angle of incidence of the light. It is shown that the variation of the ellipsometric angles is affected by the optical and magnetooptic interference. An analysis is given of the equatorial Kerr effect in thin magnetic films. © 2005 Optical Society of America

O. I. Bakradze, "An ellipsometric method for measuring the parameters of thin magnetic films," J. Opt. Technol. 72, 225-226 (2005)

Sort:  Journal  |  Reset


References are not available for this paper.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article

OSA is a member of CrossRef.

CrossCheck Deposited