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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 72, Iss. 2 — Feb. 1, 2005
  • pp: 225–226

An ellipsometric method for measuring the parameters of thin magnetic films

O. I. Bakradze  »View Author Affiliations


Journal of Optical Technology, Vol. 72, Issue 2, pp. 225-226 (2005)
http://dx.doi.org/10.1364/JOT.72.000225


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Abstract

This paper discusses an ellipsometric method for measuring the optical constants and the magnetooptical parameter of thin magnetic films in a single experiment at a constant angle of incidence of the light. It is shown that the variation of the ellipsometric angles is affected by the optical and magnetooptic interference. An analysis is given of the equatorial Kerr effect in thin magnetic films. © 2005 Optical Society of America

Citation
O. I. Bakradze, "An ellipsometric method for measuring the parameters of thin magnetic films," J. Opt. Technol. 72, 225-226 (2005)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-72-2-225


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