Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Methods of fabricating and testing optical nanoprobes for near-field scanning optical microscopes

Not Accessible

Your library or personal account may give you access

Abstract

This paper discusses the main methods of fabricating nanosize light-emitting, -collecting, and -scattering optical probes for near-field scanning optical microscopes. Methods for monitoring the geometrical and optical characteristics of the probes are briefly described. The technologies developed for fabricating optical probes ensured the rapid progress and spread of near-field microscopy because of the high spatial resolution, low signal-detection threshold, and unique possibility of simultaneously recording the topology and optical properties of the surface of materials with nanometer resolution.

PDF Article
More Like This
Fabrication and characterization of optical-fiber nanoprobes for scanning near-field optical microscopy

N. Essaidi, Y. Chen, V. Kottler, E. Cambril, C. Mayeux, N. Ronarch, and C. Vieu
Appl. Opt. 37(4) 609-615 (1998)

Offset-apertured near-field scanning optical microscope probes

M. C. Quong and A. Y. Elezzabi
Opt. Express 15(16) 10163-10174 (2007)

Comparison of test images obtained from various configurations of scanning near-field optical microscopes

Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin
Appl. Opt. 42(4) 691-700 (2003)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved