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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 73, Iss. 3 — Mar. 1, 2006
  • pp: 183–187

Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets

A. V. Belyakov  »View Author Affiliations


Journal of Optical Technology, Vol. 73, Issue 3, pp. 183-187 (2006)
http://dx.doi.org/10.1364/JOT.73.000183


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Abstract

This paper shows a connection between the lines of extrema of a three-dimensional wavelet map obtained by means of symmetric wavelets and the position of the fringes of an interference pattern. An algorithm is proposed that makes it possible to discriminate the lines of extrema of interference-fringe patterns

Citation
A. V. Belyakov, "Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets," J. Opt. Technol. 73, 183-187 (2006)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-73-3-183

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