Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets
Journal of Optical Technology, Vol. 73, Issue 3, pp. 183-187 (2006)
http://dx.doi.org/10.1364/JOT.73.000183
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Abstract
This paper shows a connection between the lines of extrema of a three-dimensional wavelet map obtained by means of symmetric wavelets and the position of the fringes of an interference pattern. An algorithm is proposed that makes it possible to discriminate the lines of extrema of interference-fringe patterns
Citation
A. V. Belyakov, "Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets," J. Opt. Technol. 73, 183-187 (2006)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-73-3-183
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