Abstract
Using as an example SiO<sub>2</sub>/Cu/SiO<sub>2</sub> and Al<sub>2</sub>O<sub>3</sub>/Cu/Al<sub>2</sub>O<sub>3</sub> coatings in the wavelength range lambda=0.35-2.5 µm, the optical properties of the metal layers in three-layer insulator/metal/insulator systems have been studied. The indicated coatings are obtained by the method of layer-by-layer electron-beam sputtering on silicate glass. The dispersion dependences of the refractive index n and absorption index k of the intermediate copper layer in SiO<sub>2</sub>/Cu/SiO<sub>2</sub> and Al<sub>2</sub>O<sub>3</sub>/Cu/Al<sub>2</sub>O<sub>3</sub> coatings is determined for the first time, using a computational matrix method to calculate the optical constants (n and k) of the separate layers that make up the layered system. It is shown that the properties of the metal films in the coatings under consideration are mainly determined by microstructural effects.
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