Abstract

Ellipsometric studies of the properties of the surface layer that arises during prolonged mechanical polishing of K8 optical glass have been carried out. It is established that, with relatively nonprolonged polishing of the glass, the homogeneous-dielectric-layer model can be applied to the polished layer; the refractive index and the thickness are determined from this as parameters of the layer. The refractive index of the layer is somewhat smaller than that of the undisturbed glass, while the thickness varies within the limits 200-700nm, depending on the duration of the polishing. Manifestations of inhomogeneity of the polished glass are detected on deeply polished samples, and these can be described by a transition layer about 50nm thick on the outer boundary of the polished layer.

© 2008 Optical Society of America

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