Examples are used to show the development trends of optoelectronic complexes for the diagnosis and certification of continuous-spectrum radiation sources under laboratory, shop, and field conditions. Questions of the metrological assurance of the measurements are considered.
© 2010 Optical Society of America
E. I. Dmitriev, A. V. Pudikov, A. S. Sakyan, N. V. Sidorovskiĭ, A. N. Starchenko, and V. G. Filippov, "Multispectral measurement complexes and their metrological assurance," J. Opt. Technol. 77, 188-193 (2010)