Multispectral measurement complexes and their metrological assurance
Journal of Optical Technology, Vol. 77, Issue 3, pp. 188-193 (2010)
http://dx.doi.org/10.1364/JOT.77.000188
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Abstract
Examples are used to show the development trends of optoelectronic complexes for the diagnosis and certification of continuous-spectrum radiation sources under laboratory, shop, and field conditions. Questions of the metrological assurance of the measurements are considered.
© 2010 Optical Society of America
Citation
E. I. Dmitriev, A. V. Pudikov, A. S. Sakyan, N. V. Sidorovskiĭ, A. N. Starchenko, and V. G. Filippov, "Multispectral measurement complexes and their metrological assurance," J. Opt. Technol. 77, 188-193 (2010)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-77-3-188
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