OSA's Digital Library

Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 77, Iss. 3 — Mar. 1, 2010
  • pp: 188–193

Multispectral measurement complexes and their metrological assurance

E. I. Dmitriev, A. V. Pudikov, A. S. Sakyan, N. V. Sidorovskiĭ, A. N. Starchenko, and V. G. Filippov  »View Author Affiliations


Journal of Optical Technology, Vol. 77, Issue 3, pp. 188-193 (2010)
http://dx.doi.org/10.1364/JOT.77.000188


View Full Text Article

Acrobat PDF (357 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Examples are used to show the development trends of optoelectronic complexes for the diagnosis and certification of continuous-spectrum radiation sources under laboratory, shop, and field conditions. Questions of the metrological assurance of the measurements are considered.

© 2010 Optical Society of America

Citation
E. I. Dmitriev, A. V. Pudikov, A. S. Sakyan, N. V. Sidorovskiĭ, A. N. Starchenko, and V. G. Filippov, "Multispectral measurement complexes and their metrological assurance," J. Opt. Technol. 77, 188-193 (2010)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-77-3-188

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited