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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 78, Iss. 1 — Jan. 1, 2011
  • pp: 61–65

Digital microscopy from nano to macro, using the SIAMS image-analysis system

R. M. Kadushnikov, V. M. Alievskiĭ, S. V. Somina, A. L. Kozerchuk, and M. S. Petrov  »View Author Affiliations


Journal of Optical Technology, Vol. 78, Issue 1, pp. 61-65 (2011)
http://dx.doi.org/10.1364/JOT.78.000061


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Abstract

This article discusses the key features of new image-analysis systems, based on electronic-table technology for working with images. It is shown that image-analysis systems can be transformed from the category of visualization systems into the category of measurement facilities. Examples are given of the operation of the SIAMS image analyzer for analyzing the images of microstructures in a wide range of scales, obtained by various methods of digital microscopy.

© 2011 OSA

History
Original Manuscript: June 8, 2010
Published: January 31, 2011

Citation
R. M. Kadushnikov, V. M. Alievskiĭ, S. V. Somina, A. L. Kozerchuk, and M. S. Petrov, "Digital microscopy from nano to macro, using the SIAMS image-analysis system," J. Opt. Technol. 78, 61-65 (2011)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-78-1-61

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