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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 78, Iss. 1 — Jan. 1, 2011
  • pp: 61–65

Digital microscopy from nano to macro, using the SIAMS image-analysis system

R. M. Kadushnikov, V. M. Alievskiĭ, S. V. Somina, A. L. Kozerchuk, and M. S. Petrov  »View Author Affiliations


Journal of Optical Technology, Vol. 78, Issue 1, pp. 61-65 (2011)
http://dx.doi.org/10.1364/JOT.78.000061


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Abstract

This article discusses the key features of new image-analysis systems, based on electronic-table technology for working with images. It is shown that image-analysis systems can be transformed from the category of visualization systems into the category of measurement facilities. Examples are given of the operation of the SIAMS image analyzer for analyzing the images of microstructures in a wide range of scales, obtained by various methods of digital microscopy.

© 2011 OSA

History
Original Manuscript: June 8, 2010
Published: January 31, 2011

Citation
R. M. Kadushnikov, V. M. Alievskiĭ, S. V. Somina, A. L. Kozerchuk, and M. S. Petrov, "Digital microscopy from nano to macro, using the SIAMS image-analysis system," J. Opt. Technol. 78, 61-65 (2011)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-78-1-61


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References

  1. "Analyzer of segments of the microstructure of solids," Certificate concerning the confirmation of the type of measurement facilities RU.C.31.005.A No. 36493. No. 27438-09.
  2. R. M. Kadushnikov, V. M. Alievskiĭ, I. G. Kamenin, and V. I. Grokhovskiĭ, V. A. Sukhomlin, ed., "Automatic image analysis using electronic-table technology," Modern Information Technologies and IT Education. A Teaching and Methods Textbook, Moscow, MAKS Press, 2005, pp. 603‒606.
  3. R. M. Kadushnikov, I. G. Kamenin, and A. N. Vylegzhanin, "The SIAMS 700 analyzer of segments of the microstructure of solids," Certificate for state registration of computer program No. 2008615275, 2008.
  4. S. V. Somina, R. M. Kadushnikov, V. I. Grokhovskiĭ, I. G. Kamenin, V. M. Alievskiĭ, A. P. Mikhaĭlovich, and I. V. Antonov, "Automatic methods for analyzing grains with twinnings in superalloys," Abstracts of Reports of the Eighteenth Ural School of Physical Metallurgists and Heat Treaters, 2006, Tol’yatti.
  5. V. M. Alievskiĭ, I. G. Kamenin, V. V. Gaĭdukov, R. M. Kadushnikov, V. I. Grokhovskiĭ, and S. V. Somina, "Technique for the construction of automatic systems for analyzing the structure of high-alloy steels," Abstracts of Reports of the Eighteenth Ural School of Physical Metallurgists and Heat Treaters, 2006, Tol’yatti.
  6. A. R. Makavetskas and M. S. Petrov, "Using the Mineral S7 image-analysis package to calculate the structural parameters of mineral raw material," The Seventh Congress on Additives of the Counties of the CIS: Materials of the Congress, March 3–5, 2009, 2009, Moscow, MISiS, Electronic version.
  7. M. S. Petrov, E. Yu. Nurkanov, A. L. Kozerchuk, and R. M. Kadushnikov, "Solving problems of technological mineralogy by means of automatic optical microscopy," The Seventh Congress on Additives of the Countries of the CIS: Materials of the Congress, March 3–5, 2009, 2009, Moscow, MISiS, Electronic version.
  8. R. Kadushnikov and V. Khvatkov, "Automated methods for visual analysis of carbon nanotubes," Second Joint Workshop on Measurement Issues in Carbon Nanotubes, 2005, Gaithersburg, Maryland, NIST.
  9. I. V. Antonov, V. M. Alievskiĭ, R. M. Kadushnikov, and V. I. Grokhovskiĭ, "Morphological study of nanoparticles by means of image analysis," Vest. UGTU–UPI Tsifr. Mikroskopiya Ekaterinburg 10(62), 63 (2005).
  10. M. V. Alfimov, R. M. Kadushnikov, and I. V. Antonov, "Structural hierarchy of the characteristics of nanoobjects in problems of the analysis and monitoring of promising materials," Abstracts of the Reports of the International Conference on Nanotechnology and Information Technologies—Technologies of the Twenty-First Century, 2006, Moscow, Izd. MGOU, pp. 31‒32.

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