OSA's Digital Library

Journal of Optical Technology

Journal of Optical Technology


  • Vol. 80, Iss. 1 — Jan. 1, 2013
  • pp: 12–17

Using the difference spectrum of the modes when determining the parameters of planar waveguides

D. V. Svistunov  »View Author Affiliations

Journal of Optical Technology, Vol. 80, Issue 1, pp. 12-17 (2013)

View Full Text Article

Acrobat PDF (333 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



This paper proposes to include the construction and analysis of the difference spectrum of the modes in the usual procedure of determining the parameters of planar waveguides from the results of measurements of the spectrum of the waveguide modes. It is shown that analyzing the difference spectrum of the modes makes it possible to efficiently detect erroneous results of the measurements and to select the most suitable technique for calculating the refractive-index distribution of the test sample. Using the results of the analysis increases the reliability of reconstructing the profile of a planar lightguide and of the parameters of the kinetics of the process of forming a gradient layer determined from this analysis. This is especially useful when creating waveguides based on new materials.

© 2013 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(130.0130) Integrated optics : Integrated optics
(160.3130) Materials : Integrated optics materials
(230.7390) Optical devices : Waveguides, planar

Original Manuscript: July 11, 2012
Published: January 1, 2013

D. V. Svistunov, "Using the difference spectrum of the modes when determining the parameters of planar waveguides," J. Opt. Technol. 80, 12-17 (2013)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. T. Tamir, ed., Integrated Optics (Mir, Moscow, 1978; Springer Verlag, New York, 1979).
  2. M. J. Adams, An Introduction to Optical Waveguides (Wiley, New York, 1981; Mir, Moscow, 1984).
  3. J. M. White and P. F. Heidrich, “Optical-waveguide refractive-index profiles determined from measurement of mode indices: a simple analysis,” Appl. Opt. 15, 151 (1976). [CrossRef]
  4. P. Mathey and P. Jullien, “Numerical analysis of a WKB inverse method in view of index-profile reconstruction in diffused waveguides,” Opt. Commun. 122, 127 (1996). [CrossRef]
  5. K. K. Evstrop’ev, Diffusion Processes in Glass (Stroiizdat, Leningrad, 1970).
  6. K. A. Landa and G. T. Petrovski?, Amorphous Planar Waveguides(Krasnoyarsk. Univ., Krasnoyarsk, 1987).
  7. J. Linares, X. Prieto, and C. Montero, “A novel refractive-index profile for characterization of nonlinear diffusion processes and planar waveguides in glass,” Opt. Mater. 3, 229 (1994). [CrossRef]
  8. A. A. Lipovskii, D. V. Svistunov, D. K. Tagantsev, and V. V. Zhurihina, “Diffusion nonlinearity in aluminum–boron silicate glasses for ion-exchanged GRIN structures: A simple technique to evaluate diffusion nonlinearity of glasses,” Opt. Mater. 28, 276 (2006). [CrossRef]
  9. B. I. Boltaks, Diffusion in Semiconductors (Fizmatgiz, Moscow, 1961).
  10. S. D. Gertsriken and I. Ya. Dekhtyar, Diffusion in Metals and Alloys in the Solid Phase (Fizmatgiz, Moscow, 1960).
  11. R. Sh. Malkovich, The Mathematics of Diffusion in Semiconductors(Nauka, St. Petersburg, 1999).
  12. H. Mehrer, Diffusion in Solids: Fundamentals, Methods, Materials, Diffusion-controlled Processes (Springer, London, 2007; Intellekt, Dolgoprudnyi, 2011).
  13. J. Crank, The Mathematics of Diffusion (Clarendon Press, Oxford, 1956).
  14. K. S. Chiang, “Construction of refractive-index profiles of planar dielectric waveguides from the distribution of effective indexes,” J. Lightwave Technol. 3, 385 (1985). [CrossRef]
  15. F. Gonella, F. Caccavale, and A. Quaranta, “Secondary ion mass spectrometry applied to the study of ion-exchanged glass waveguides with a few modes,” Int. J. Optoelectron. 9, 359 (1994).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited