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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 80, Iss. 5 — May. 1, 2013
  • pp: 325–328

Using a Tm:YLF laser to determine the diffusion coefficient of chromium in ZnSe

S. A. Rodin, S. S. Balabanov, E. M. Gavrishchuk, and O. N. Eremeykin  »View Author Affiliations


Journal of Optical Technology, Vol. 80, Issue 5, pp. 325-328 (2013)
http://dx.doi.org/10.1364/JOT.80.000325


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Abstract

This paper presents an express technique for determining the diffusion coefficients of chromium in ZnSe, using a Tm:YLF laser that emits at 1.908 ?m. The diffusion coefficients of chromium in ZnSe obtained by deposition from the vapor phase are determined to be D=(9.5±0.6)×10?9??cm2/s and D=(1.0±0.1)×10?9??cm2/s at 1100°C and 900°C, respectively. The absorption cross section of Cr2+ ions in zinc selenide at 1.908 ?m was 4.6×10?19??cm2.

© 2013 Optical Society of America

OCIS Codes
(140.3070) Lasers and laser optics : Infrared and far-infrared lasers
(160.3380) Materials : Laser materials
(160.5690) Materials : Rare-earth-doped materials

History
Original Manuscript: November 20, 2012
Published: May 21, 2013

Citation
S. A. Rodin, S. S. Balabanov, E. M. Gavrishchuk, and O. N. Eremeykin, "Using a Tm:YLF laser to determine the diffusion coefficient of chromium in ZnSe," J. Opt. Technol. 80, 325-328 (2013)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-80-5-325

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