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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

  • Vol. 80, Iss. 8 — Aug. 1, 2013
  • pp: 515–519

Ellipsometric studies of the natural oxide film on the surface of cadmium telluride

V. A. Odarich, A. Z. Evmenova, and F. F. Sizov  »View Author Affiliations


Journal of Optical Technology, Vol. 80, Issue 8, pp. 515-519 (2013)
http://dx.doi.org/10.1364/JOT.80.000515


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Abstract

It is established by ellipsometric measurements that the interaction process of a sheared surface of single-crystal cadmium telluride with atmospheric air has two stages. In the first 7–10 days, the character of the change of the measured ellipsometric parameters corresponds to the formation of an absorbing layer with a thickness of one or two monatomic layers. Beginning at 20 days, a transparent film appears, possibly an oxide, whose refractive index is close to 2.2, while the thickness increases to 5–6 nm in an oxidation time of up to 1 year. Starting from literature data, it is assumed that the inner film is a layer of free tellurium, while the outer film is formed by cadmium or tellurium oxides or a mixture of them.

© 2013 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

History
Original Manuscript: December 13, 2012
Published: October 15, 2013

Citation
V. A. Odarich, A. Z. Evmenova, and F. F. Sizov, "Ellipsometric studies of the natural oxide film on the surface of cadmium telluride," J. Opt. Technol. 80, 515-519 (2013)
http://www.opticsinfobase.org/jot/abstract.cfm?URI=jot-80-8-515

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