Abstract

This paper presents a comparative analysis of the stability criteria of the spectral characteristics of multilayer dielectric systems against possible changes of the optical thickness of the individual layers. The proposed technique is based on an introduced stability criterion of synthesized interference coatings that makes it possible to investigate how the spectra change when there are actual errors in the film thicknesses. Using certain types of interference coatings as an example, a comparative analysis of known techniques with the technique proposed here is carried out, and it is shown that the introduced criterion more accurately describes the stability of the coating and makes it possible to correct its spectra during fabrication.

© 2013 Optical Society of America

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