Using ellipsometric methods to study adsorbed layers of molecules

Yu. I. Asalkhanov, É. L. Saneev, É. Ch. Daribazaron, and E. S. Chagdurova

J. Opt. Technol. 72(2), 163-166 (2005)  View: PDF

How the photoluminescence of submicron epitaxial n^+-n-i structures of III-V compounds depends on their electrophysical characteristics

Yu. S. Emel'yanenko, S. A. Malyshev, and A. I. Pokryshkin

J. Opt. Technol. 72(2), 167-171 (2005)  View: PDF

The effect of the moisture of the air on the asymmetry index and coefficient of the light-scattering distribution of radially inhomogeneous aerosol particles in the boundary layer over the sea

A. M. Kokorin

J. Opt. Technol. 72(2), 172-176 (2005)  View: PDF

Aberrational properties of optical systems consisting of confocal surfaces

A. P. Grammatin and E. A. Demidova

J. Opt. Technol. 72(2), 177-181 (2005)  View: PDF

The optical system of a very large telescope

A. V. Bakholdin, V. A. Zverev, and G. É. Romanova

J. Opt. Technol. 72(2), 182-185 (2005)  View: PDF

Prospects of using LEDs in the illuminating systems of microscopes

M. A. Volkova, S. V. Zlatina, S. N. Natarovskii, O. N. Nemkova, T. F. Selezneva, N. B. Skobeleva, D. N. Frolov, L. M. Kogan, and B. P. Papchenko

J. Opt. Technol. 72(2), 186-190 (2005)  View: PDF

Irradiance distribution formed by a light beam reflected from a flat retroreflective coating

Yu. N. Bugaev and R. E. Il'inskii

J. Opt. Technol. 72(2), 191-195 (2005)  View: PDF

Producing holographic filters in the UV region 320-430 nm

G. B. Semenov, A. K. Aristov, T. V. Shchedrunova, A. V. Varnaev, A. P. Zhevlakov, and V. M. Grozdilov

J. Opt. Technol. 72(2), 196-198 (2005)  View: PDF

Implementing a linear predictor model by Fourier holography

A. V. Pavlov

J. Opt. Technol. 72(2), 199-202 (2005)  View: PDF

Holographic methods of three-dimensional visualization of microscopic phase objects

T. V. Tishko, V. P. Titar', and D. N. Tishko

J. Opt. Technol. 72(2), 203-209 (2005)  View: PDF

The nature of photostimulated processes in As2Se3 layers used in fabricating the elements of diffraction optics

E. A. Vandyukov, F. A. Sattarov, M. Yu. Znamenskii, V. L. Filippov, A. V. Lukin, A. P. Sobolev, and I. I. Vandyukova

J. Opt. Technol. 72(2), 210-213 (2005)  View: PDF

Optical transparency of crystalline germanium

I. A. Kaplunov, Yu. M. Smirnov, and A. I. Kolesnikov

J. Opt. Technol. 72(2), 214-220 (2005)  View: PDF

Spirallike structure in the conoscopic figures of optically active crystals

O. Yu. Pikul', K. A. Rudoi, A. I. Livashvili, V. I. Doronin, and V. I. Stroganov

J. Opt. Technol. 72(2), 221-222 (2005)  View: PDF

Features of the reflection of optical rays from a plane-parallel crystalline plate

A. A. Muryi, P. V. Senin, V. I. Stroganov, and V. I. Doronin

J. Opt. Technol. 72(2), 223-224 (2005)  View: PDF

An ellipsometric method for measuring the parameters of thin magnetic films

O. I. Bakradze

J. Opt. Technol. 72(2), 225-226 (2005)  View: PDF