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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

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Instrumentation, measurement, and metrology : Detection


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  • Optics Letters, Vol. 38, Issue 19, pp. 3708-3711 (October 2013)
  • Neil A. Macleod, Rebecca Rose, Damien Weidmann

  • Optics Letters, Vol. 39, Issue 5, pp. 1231-1234 (March 2014)
  • Dongfeng Shi, Shunxing Hu, Yingjian Wang

  • Optics Letters, Vol. 39, Issue 6, pp. 1429-1432 (March 2014)
  • Yury Lobanov, Michael Shcherbatenko, Alexander Shurakov, Alexander V. Rodin, Artem Klimchuk, Alexander I. Nadezhdinsky, Sergey Maslennikov, Pavel Larionov, Matvey Finkel, Alexander Semenov, Aleksandr A. Verevkin, Boris M. Voronov, Yakov Ponurovsky, Teunis M. Klapwijk, Gregory N. Gol’tsman

  • Optics Letters, Vol. 39, Issue 6, pp. 1609-1612 (March 2014)
  • Hitoshi Iida, Moto Kinoshita, Kuniaki Amemiya, Yozo Shimada

  • Optics Letters, Vol. 39, Issue 12, pp. 3638-3641 (June 2014)
  • Anthony M. D. Lee, Hamid Pahlevaninezhad, Victor X. D. Yang, Stephen Lam, Calum MacAulay, Pierre Lane

  • Optics Letters, Vol. 39, Issue 14, pp. 4092-4095 (July 2014)
  • Alexander V. Borodin, Mikhail N. Esaulkov, Alexander A. Frolov, Alexander P. Shkurinov, Vladislav Ya. Panchenko

  • Optics Letters, Vol. 39, Issue 14, pp. 4278-4281 (July 2014)
  • Sungho Choi, Kyung-Young Jhang

  • Optics Express, Vol. 22, Issue 9, pp. 11351-11366 (May 2014)
  • Danielle M. R. Wuchenich, Christoph Mahrdt, Benjamin S. Sheard, Samuel P. Francis, Robert E. Spero, John Miller, Conor M. Mow-Lowry, Robert L. Ward, William M. Klipstein, Gerhard Heinzel, Karsten Danzmann, David E. McClelland, Daniel A. Shaddock

  • Optics Express, Vol. 22, Issue 12, pp. 14450-14463 (June 2014)
  • Tobias Haist, Shihao Dong, Thomas Arnold, Mark Gronle, Wolfgang Osten

  • Optics Express, Vol. 22, Issue 15, pp. 18078-18092 (July 2014)
  • Tommaso Lunghi, Boris Korzh, Bruno Sanguinetti, Hugo Zbinden

  • Optics Express, Vol. 22, Issue 19, pp. 23661-23672 (September 2014)
  • Dino Ott, S. Nader, S. Reihani, Lene B. Oddershede

  • Applied Optics, Vol. 52, Issue 33, pp. 8054-8059 (November 2013)
  • E. Theocharous, S. P. Theocharous, J. H. Lehman

  • Applied Optics, Vol. 53, Issue 1, pp. 44-50 (January 2014)
  • Alexis Matwyschuk

  • Applied Optics, Vol. 53, Issue 3, pp. 347-350 (January 2014)
  • Chia-Yu Chang, Jow-Tsong Shy

  • Applied Optics, Vol. 53, Issue 6, pp. 1166-1172 (February 2014)
  • Mengchao Ma, Fang Guo, Zhaolou Cao, Keyi Wang

  • Journal of Optical Technology, Vol. 81, Issue 4, pp. 196-198 (April 2014)
  • V. A. Golovkov, V. V. Pronin

  • Journal of Optical Technology, Vol. 81, Issue 9, pp. 493-498 (September 2014)
  • M. F. Borisov, O. A. Lebedev, N. I. Pavlov, A. Ya. Prilipko

  • Journal of Optical Technology, Vol. 81, Issue 9, pp. 499-503 (September 2014)
  • B. O. Efimenko, N. I. Pavlov, V. E. Poleshchuk, A. Ya. Prilipko, A. A. Tulinov

  • Journal of the Optical Society of Korea, Vol. 17, Issue 6, pp. 481-485 (December 2013)
  • Jiansen Ye, Zhuo Li

  • Journal of the Optical Society of Korea, Vol. 17, Issue 6, pp. 513-517 (December 2013)
  • Minwook Kang, Dong Won Kang, Jae W. Hahn
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