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Journal of Optical Technology

Journal of Optical Technology

| SIMULTANEOUS RUSSIAN-ENGLISH PUBLICATION

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Instrumentation, measurement, and metrology : Displays


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  • Optics Letters, Vol. 39, Issue 12, pp. 3433-3436 (June 2014)
  • Yuji Matsumoto, Yasuhiro Takaki

  • Optics Express, Vol. 22, Issue 11, pp. 13484-13491 (June 2014)
  • Hong Hua, Bahram Javidi

  • Optics Express, Vol. 22, Issue 11, pp. 13492-13506 (June 2014)
  • Daisuke Iwai, Shoichi Takeda, Naoto Hino, Kosuke Sato

  • Optics Express, Vol. 22, Issue 12, pp. 14981-14992 (June 2014)
  • Felix Heide, James Gregson, Gordon Wetzstein, Ramesh Raskar, Wolfgang Heidrich

  • Optics Express, Vol. 22, Issue 12, pp. 15064-15074 (June 2014)
  • Francisco J. Martínez, Andrés Márquez, Sergi Gallego, Manuel Ortuño, Jorge Francés, Augusto Beléndez, Inmaculada Pascual

  • Optics Express, Vol. 22, Issue 14, pp. 17147-17157 (July 2014)
  • Vladimir Saveljev, Sung-Kyu Kim

  • Optics Express, Vol. 22, Issue 15, pp. 17823-17829 (July 2014)
  • Dalma Héricz, Tamás Sarkadi, Viktor Lucza, Viktor Kovács, Pál Koppa

  • Optics Express, Vol. 22, Issue 15, pp. 17897-17907 (July 2014)
  • Yujiao Chen, Xiaorui Wang, Jianlei Zhang, Shuo Yu, Qiping Zhang, Bingtao Guo

  • Optics Express, Vol. 22, Issue 15, pp. 18027-18035 (July 2014)
  • Byeongdae Choi, Seongkyu Song, Soon Moon Jeong, Seok-Hwan Chung, Anatoliy Glushchenko

  • Optics Express, Vol. 22, Issue 15, pp. 18499-18512 (July 2014)
  • Sujin Choi, Seungin Baek, Dajeong Im, Hyun Kook Kahng, Hwi Kim

  • Optics Express, Vol. 22, Issue 17, pp. 20705-20719 (August 2014)
  • Dewen Cheng, Yongtian Wang, Chen Xu, Weitao Song, Guofan Jin

  • Optics Express, Vol. 22, Issue 17, pp. 20757-20769 (August 2014)
  • JianLei Zhang, XiaoRui Wang, YuJiao Chen, QiPing Zhang, Shuo Yu, Ying Yuan, BingTao Guo

  • Applied Optics, Vol. 53, Issue 20, pp. 4450-4459 (July 2014)
  • Ki-Chul Kwon, Ji-Seong Jeong, Munkh-Uchral Erdenebat, Young-Tae Lim, Kwan-Hee Yoo, Nam Kim

  • Applied Optics, Vol. 53, Issue 22, pp. DT1-DT5 (August 2014)
  • Andy Y.-G. Fuh, Iam Choon Khoo, Tsung-Hsien Lin, Yi-Pai Huang, Liang-Chy Chien, Vladimir G. Chigrinov, Tsung-Hsun Yang

  • Applied Optics, Vol. 53, Issue 22, pp. E19-E25 (August 2014)
  • Manuel Martínez-Corral, Adrián Dorado, Héctor Navarro, Genaro Saavedra, Bahram Javidi

  • Applied Optics, Vol. 53, Issue 25, pp. 5640-5640 (September 2014)
  • Yia-Chung Chang, Li-Chuan Tang, Chun-Yi Yin

  • Applied Optics, Vol. 53, Issue 25, pp. 5654-5659 (September 2014)
  • JianLei Zhang, XiaoRui Wang, YuJiao Chen, Shuo Yu, QiPing Zhang, ZhaoHui Li

  • Applied Optics, Vol. 53, Issue 29, pp. H76-H84 (October 2014)
  • Wei-De Jeng, Yuan Ouyang, Ting-Wei Huang, Jeng-Ren Duann, Jin-Chern Chiou, Yu-Shun Tang, Mang Ou-Yang

  • Optical Materials Express, Vol. 4, Issue 7, pp. 1436-1443 (July 2014)
  • Yohan Kim, Christian Ippen, Tonino Greco, Jeongno Lee, Min Suk Oh, Chul Jong Han, Armin Wedel, Jiwan Kim

  • Optical Materials Express, Vol. 4, Issue 9, pp. 1824-1832 (September 2014)
  • Seok-Hwan Chung, Seongkyu Song, Kee-Jeong Yang, Soon Moon Jeong, Byeongdae Choi
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