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Optics InfoBase
Multilevel screen design using direct binary search
Minimizing stochastic moiré in frequency-modulated halftones by means of green-noise masks
Dot pattern generation technique using molecular dynamics
Clustered-minority-pixel error diffusion
Luminance correlations define human sensitivity to contrast resolution in natural images
Extending the Clapper-Yule model to rough printing supports
Processing halftone color images by vector space methods
Applying the Yule-Nielsen equation with negative n
Reflectance and transmittance model for recto-verso halftone prints
High-fidelity lenticular screening by means of iterative tone correction
Computing light statistics in heterogeneous media based on a mass weighted probability density function method
Ranked dither for high-quality robust printing
Reflectance and transmittance model for recto-verso halftone prints: spectral predictions with multi-ink halftones
Stochastic modeling of light scattering with fluorescence using a Monte Carlo-based multiscale approach
Glass patterns as moiré effects: new surprising results
Simple multilevel halftoning excelled in gradation reproducibility
Model-based error diffusion for high fidelity lenticular screening
Watermarks encrypted in a concealogram and deciphered by a modified joint-transform correlator
Spectral prediction model for color prints on paper with fluorescent additives
A robust method for inverse halftoning via two-dimensional nonlinear pyramid
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Select a Journal: J. Opt. Soc. Am. AJ. Opt. Soc. Am. BApplied OpticsOptics LettersOptics ExpressAdv. Opt. Photon.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)Virtual J. Biomed. Opt.Optics & Photonics NewsOptics NewsJ. Opt. Commun. Netw.J. Lightwave Technol.J. Opt. Technol.J. Display Technol.Chinese Optics LettersApplied Spectroscopy
Select a Journal: J. Opt. Soc. Am. AJ. Opt. Soc. Am. BApplied OpticsOptics LettersOptics ExpressAdv. Opt. Photon.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)Virtual J. Biomed. Opt.Optics NewsJ. Opt. Commun. Netw.J. Lightwave Technol.J. Opt. Technol.J. Display Technol.Chinese Optics LettersApplied Spectroscopy Year