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Optics InfoBase
Computation theory of partially coherent imaging by stacked pupil shift matrix
Analysis of Ag-superlens performances using spatial convolution formulation
Reduction of focal-spot size using dichromats in absorbance modulation
Diamond waveguides fabricated by reactive ion etching
PSM design for inverse lithography with partially coherent illumination
Fabrication of periodic nanovein structures by holography lithography technique
Pixel-based simultaneous source and mask optimization for resolution enhancement in optical lithography
Computation lithography: virtual reality and virtual virtuality
Micro/nano scale amorphization of silicon by femtosecond laser irradiation
Light Emitting Diodes as an alternative ambient illumination source in photolithography environment
Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illumination
Level-set-based inverse lithography for photomask synthesis
Silver superlens using antisymmetric surface plasmon modes
Coma measurement by use of an alternating phase-shifting mask mark with a specific phase width
Fast computation of constructive and destructive interference areas in partially coherent imaging for resolution enhancement in optical microlithography
Fabrication of microlens arrays based on the mass transport effect of SU-8 photoresist using a multiexposure two-beam interference technique
Translational-symmetry alternating phase shifting mask grating mark used in a linear measurement model of lithographic projection lens aberrations
Incoherently combining logarithmic aspheric lenses for extended depth of field
Imaging capability of patterned liquid crystals
Extended dual-grating alignment method for optical projection lithography
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Select a Journal: J. Opt. Soc. Am. AJ. Opt. Soc. Am. BApplied OpticsOptics LettersOptics ExpressAdv. Opt. Photon.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)Virtual J. Biomed. Opt.Optics News (1975-1989)J. Opt. Commun. Netw.J. Lightwave Technol.J. Opt. Technol.J. Display Technol.Chinese Optics LettersApplied SpectroscopyJ. Opt. Soc. Korea Year