Interpretation of generalized grating imaging

• Abstract

• JOSA A, Vol. 25, Issue 9, pp. 2244-2250 (September 2008)
• Koichi Iwata

Interpretation of generalized grating imaging: further analysis and numerical calculation

• Abstract

• JOSA A, Vol. 25, Issue 12, pp. 2939-2944 (December 2008)
• Koichi Iwata

Multiple annular linear diffractive axicons

• Abstract

• JOSA A, Vol. 28, Issue 4, pp. 523-533 (April 2011)
• Emilie Bialic, Jean-Louis de Bougrenet de la Tocnaye

Discrete plasmonic Talbot effect in subwavelength metal waveguide arrays

• Abstract

• Optics Letters, Vol. 35, Issue 5, pp. 685-687 (March 2010)
• Yueke Wang, Keya Zhou, Xueru Zhang, Kun Yang, Yuxiao Wang, Yinglin Song, Shutian Liu

Use of a moiré deflectometer on a telescope for atmospheric turbulence measurements

• Abstract

• Optics Letters, Vol. 35, Issue 9, pp. 1470-1472 (May 2010)
• Saifollah Rasouli

Two-dimensional gratings-based phase-contrast imaging using a conventional x-ray tube

• Abstract

• Optics Letters, Vol. 36, Issue 18, pp. 3551-3553 (September 2011)
• Genta Sato, Takeshi Kondoh, Hidenosuke Itoh, Soichiro Handa, Kimiaki Yamaguchi, Takashi Nakamura, Kentaro Nagai, Chidane Ouchi, Takayuki Teshima, Yutaka Setomoto, Toru Den

Quantitative phase contrast imaging of THz electric fields in a dielectric waveguide

• Abstract
• 

• Optics Express, Vol. 17, Issue 11, pp. 9219-9225 (May 2009)
• Qiang Wu, Christopher A. Werley, Kung-Hsuan Lin, August Dorn, Moungi G. Bawendi, Keith A. Nelson

Small-angle scattering computed tomography (SAS-CT) using a Talbot-Lau interferometer
and a rotating anode x-ray tube:
theory and experiments

• Abstract
• 

• Optics Express, Vol. 18, Issue 12, pp. 12960-12970 (June 2010)
• Guang-Hong Chen, Nicholas Bevins, Joseph Zambelli, Zhihua Qi

On the origin of visibility contrast in x-ray Talbot interferometry

• Abstract
• 

• Optics Express, Vol. 18, Issue 16, pp. 16890-16901 (August 2010)
• W. Yashiro, Y. Terui, K. Kawabata, A. Momose

An adjustable, high sensitivity, wide dynamic range two channel wave-front sensor based on moiré deflectometry

• Abstract
• 

• Optics Express, Vol. 18, Issue 23, pp. 23906-23915 (November 2010)
• Saifollah Rasouli, Anamparambu N. Ramaprakash, Mohsen Dashti

Observation of the Talbot effect using broadband hard x-ray beam

• Abstract
• 

• Optics Express, Vol. 18, Issue 24, pp. 24975-24982 (November 2010)
• Jae Myung Kim, In Hwa Cho, Su Yong Lee, Hyon Chol Kang, Ray Conley, Chian Liu, Albert T. Macrander, Do Young Noh

Displacement Talbot lithography: a new method for high-resolution patterning of large areas

• Abstract
• 

• Optics Express, Vol. 19, Issue 11, pp. 10686-10691 (May 2011)
• Harun H. Solak, Christian Dais, Francis Clube

Reduction of phase artifacts in differential phase contrast computed tomography

• Abstract
• 

• Optics Express, Vol. 19, Issue 14, pp. 13604-13611 (July 2011)
• Iwan Jerjen, Vincent Revol, Philipp Schuetz, Christian Kottler, Rolf Kaufmann, Thomas Luethi, Konstantins Jefimovs, Claus Urban, Urs Sennhauser

Iterative reconstruction in x-ray computed laminography from differential phase measurements

• Abstract
• 

• Optics Express, Vol. 19, Issue 17, pp. 16560-16573 (August 2011)
• Sébastien Harasse, Wataru Yashiro, Atsushi Momose

X-ray shearing interferometer and generalized grating imaging

• Abstract

• Applied Optics, Vol. 48, Issue 5, pp. 886-892 (February 2009)
• Koichi Iwata

Transmission-grating-based wavefront tilt sensor

• Abstract

• Applied Optics, Vol. 48, Issue 20, pp. 3961-3966 (July 2009)
• Koichi Iwata, Hiroki Fukuda, Kousuke Moriwaki

Compact sensor for measuring two-dimensional tilt using a two-dimensional transmission grating and the Talbot effect

• Abstract

• Applied Optics, Vol. 50, Issue 3, pp. 261-266 (January 2011)
• Koichi Iwata, Kazuo Satoh, Kousuke Moriwaki

Application of “parallel” moiré deflectometry and the single beam Z-scan technique in the measurement of the nonlinear refractive index

• Abstract
• 

• Applied Optics, Vol. 50, Issue 16, pp. 2356-2360 (June 2011)
• Saifollah Rasouli, H. Ghasemi, M. T. Tavassoly, H. R. Khalesifard

Multispectral imaging axicons

• Abstract

• Applied Optics, Vol. 50, Issue 20, pp. 3638-3645 (July 2011)
• Emilie Bialic, Jean-Louis de Bougrenet de la Tocnaye

Application of generalized grating imaging to pattern projection in three-dimensional profilometry

• Abstract

• Applied Optics, Vol. 50, Issue 26, pp. 5115-5121 (September 2011)
• Koichi Iwata, Yusuke Sando, Kazuo Satoh, Kousuke Moriwaki