Strategy of computed tomography sinogram inpainting based on sinusoid-like curve decomposition and eigenvector-guided interpolation

• Abstract

• JOSA A, Vol. 29, Issue 1, pp. 153-163 (January 2012)
• Yinsheng Li, Yang Chen, Yining Hu, Ahmed Oukili, Limin Luo, Wufan Chen, Christine Toumoulin

Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography

• Abstract

• Optics Letters, Vol. 36, Issue 12, pp. 2227-2229 (June 2011)
• Stephan O. Hruszkewycz, Martin V. Holt, Ash Tripathi, Jörg Maser, Paul H. Fuoss

Single shot phase contrast imaging using laser-produced Betatron x-ray beams

• Abstract

• Optics Letters, Vol. 36, Issue 13, pp. 2426-2428 (July 2011)
• S. Fourmaux, S. Corde, K. Ta Phuoc, P. Lassonde, G. Lebrun, S. Payeur, F. Martin, S. Sebban, V. Malka, A. Rousse, J. C. Kieffer

Imaging of the angular-dependent coherent-scatter cross section with analyzer crystal: a Monte Carlo simulation

• Abstract

• Optics Letters, Vol. 36, Issue 15, pp. 2785-2787 (August 2011)
• Sergei Gasilov, Paul Claude Diemoz, Emmanuel Brun, Paola Coan

Reduction of phase artifacts in differential phase contrast computed tomography

• Abstract
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• Optics Express, Vol. 19, Issue 14, pp. 13604-13611 (July 2011)
• Iwan Jerjen, Vincent Revol, Philipp Schuetz, Christian Kottler, Rolf Kaufmann, Thomas Luethi, Konstantins Jefimovs, Claus Urban, Urs Sennhauser

Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 16542-16549 (August 2011)
• Chun Hong Yoon, Peter Schwander, Chantal Abergel, Inger Andersson, Jakob Andreasson, Andrew Aquila, Saša Bajt, Miriam Barthelmess, Anton Barty, Michael J. Bogan, Christoph Bostedt, John Bozek, Henry N. Chapman, Jean-Michel Claverie, Nicola Coppola, Daniel P. DePonte, Tomas Ekeberg, Sascha W. Epp, Benjamin Erk, Holger Fleckenstein, Lutz Foucar, Heinz Graafsma, Lars Gumprecht, Janos Hajdu, Christina Y. Hampton, Andreas Hartmann, Elisabeth Hartmann, Robert Hartmann, Gunter Hauser, Helmut Hirsemann, Peter Holl, Stephan Kassemeyer, Nils Kimmel, Maya Kiskinova, Mengning Liang, Ne-Te Duane Loh, Lukas Lomb, Filipe R. N. C. Maia, Andrew V. Martin, Karol Nass, Emanuele Pedersoli, Christian Reich, Daniel Rolles, Benedikt Rudek, Artem Rudenko, Ilme Schlichting, Joachim Schulz, Marvin Seibert, Virginie Seltzer, Robert L. Shoeman, Raymond G. Sierra, Heike Soltau, Dmitri Starodub, Jan Steinbrener, Gunter Stier, Lothar Strüder, Martin Svenda, Joachim Ullrich, Georg Weidenspointner, Thomas A. White, Cornelia Wunderer, Abbas Ourmazd

Novel Fourier-domain constraint for fast phase retrieval in coherent diffraction imaging

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19330-19339 (September 2011)
• Tatiana Latychevskaia, Jean-Nicolas Longchamp, Hans-Werner Fink

Quantitative single-exposure x-ray phase contrast imaging using a single attenuation grid

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19781-19789 (September 2011)
• Kaye S. Morgan, David M. Paganin, Karen K. W. Siu

Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

• Abstract
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• Optics Express, Vol. 19, Issue 21, pp. 19919-19924 (October 2011)
• Tsung-Yu Chen, Yu-Tung Chen, Cheng-Liang Wang, Ivan M. Kempson, Wah-Keat Lee, Yong S. Chu, Y. Hwu, G. Margaritondo

Phase tomography from x-ray coherent diffractive imaging projections

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21345-21357 (October 2011)
• Manuel Guizar-Sicairos, Ana Diaz, Mirko Holler, Miriam S. Lucas, Andreas Menzel, Roger A. Wepf, Oliver Bunk

Non-linear iterative phase retrieval based on Frechet derivative

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 22809-22819 (November 2011)
• V. Davidoiu, B. Sixou, M. Langer, F. Peyrin

Improving image quality of x-ray in-line phase contrast imaging using an image restoration method

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 23460-23468 (November 2011)
• Xue-jun Guo, Xiao-lin Liu, Chen Ni, Bo Liu, Shi-ming Huang, Mu Gu

Image reconstruction in phase-contrast tomography exploiting the second-order statistical properties of the projection data

• Abstract
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• Optics Express, Vol. 19, Issue 24, pp. 24396-24410 (November 2011)
• Cheng-Ying Chou, Pin-Yu Huang

A tilted grating interferometer for full vector field differential x-ray phase contrast tomography

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 24890-24896 (December 2011)
• Simon Rutishauser, Tilman Donath, Christian David, Franz Pfeiffer, Federica Marone, Peter Modregger, Marco Stampanoni

Non-linear regularized phase retrieval for unidirectional X-ray differential phase contrast radiography

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 25545-25558 (December 2011)
• Thomas Thüring, Peter Modregger, Bernd R. Pinzer, Zhentian Wang, Marco Stampanoni

Theoretical comparison of three X-ray phase-contrast imaging techniques: propagation-based imaging, analyzer-based imaging and grating interferometry

• Abstract
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• Optics Express, Vol. 20, Issue 3, pp. 2789-2805 (January 2012)
• P. C. Diemoz, A. Bravin, P. Coan

Optical features of a LiF crystal soft x-ray imaging detector irradiated by free electron laser pulses

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 3424-3433 (February 2012)
• Tatiana Pikuz, Anatoly Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yashinori Senba, Tadashi Togashi, Tetsuya Ishikawa

Femtosecond free-electron laser x-ray diffraction data sets for algorithm development

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 4149-4158 (February 2012)
• Stephan Kassemeyer, Jan Steinbrener, Lukas Lomb, Elisabeth Hartmann, Andrew Aquila, Anton Barty, Andrew V. Martin, Christina Y. Hampton, Saša Bajt, Miriam Barthelmess, Thomas R.M. Barends, Christoph Bostedt, Mario Bott, John D. Bozek, Nicola Coppola, Max Cryle, Daniel P. DePonte, R. Bruce Doak, Sascha W. Epp, Benjamin Erk, Holger Fleckenstein, Lutz Foucar, Heinz Graafsma, Lars Gumprecht, Andreas Hartmann, Robert Hartmann, Günter Hauser, Helmut Hirsemann, André Hömke, Peter Holl, Olof Jönsson, Nils Kimmel, Faton Krasniqi, Mengning Liang, Filipe R.N.C. Maia, Stefano Marchesini, Karol Nass, Christian Reich, Daniel Rolles, Benedikt Rudek, Artem Rudenko, Carlo Schmidt, Joachim Schulz, Robert L. Shoeman, Raymond G. Sierra, Heike Soltau, John C. H. Spence, Dmitri Starodub, Francesco Stellato, Stephan Stern, Gunter Stier, Martin Svenda, Georg Weidenspointner, Uwe Weierstall, Thomas A. White, Cornelia Wunderer, Matthias Frank, Henry N. Chapman, Joachim Ullrich, Lothar Strüder, Michael J. Bogan, Ilme Schlichting

Three-dimensional modeling using x-ray shape-from-silhouette

• Abstract

• Applied Optics, Vol. 50, Issue 19, pp. 3282-3288 (July 2011)
• Emanuele Simioni, Filippo Ratti, Irene Calliari, Luca Poletto

Optical modeling of Fresnel zoneplate microscopes

• Abstract

• Applied Optics, Vol. 50, Issue 20, pp. 3678-3684 (July 2011)
• Patrick P. Naulleau, Iacopo Mochi, Kenneth A. Goldberg