Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

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Improved model-based infrared reflectrometry for measuring deep trench structures

• Abstract

• JOSA A, Vol. 26, Issue 11, pp. 2327-2335 (November 2009)
• Chuanwei Zhang, Shiyuan Liu, Tielin Shi, Zirong Tang

Flexible 3-D shape measurement using projector defocusing

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3080-3082 (October 2009)
• Shuangyan Lei, Song Zhang

Interferometric quasi-absolute tests for aspherics using a radial shear position

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3178-3180 (October 2009)
• Klaus Mantel, Eduard Geist, Irina Harder, Norbert Lindlein, Gerd Leuchs

Precise displacement measurement for a local surface

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3406-3408 (November 2009)
• Sheng Lih Yeh, Shyh Tsong Lin, Yu Hsin Chang

Silicon photonic wire biosensor array for multiplexed real-time and label-free molecular detection

• Abstract

• Optics Letters, Vol. 34, Issue 23, pp. 3598-3600 (December 2009)
• A. Densmore, M. Vachon, D.-X. Xu, S. Janz, R. Ma, Y.-H. Li, G. Lopinski, A. Delâge, J. Lapointe, C. C. Luebbert, Q. Y. Liu, P. Cheben, J. H. Schmid

Spectroscopic phase microscopy for quantifying hemoglobin concentrations in intact red blood cells

• Abstract

• Optics Letters, Vol. 34, Issue 23, pp. 3668-3670 (December 2009)
• YongKeun Park, Toyohiko Yamauchi, Wonshik Choi, Ramachandra Dasari, Michael S. Feld

Pressure measurements through image analysis

• Abstract
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• Optics Express, Vol. 17, Issue 20, pp. 17996-18002 (September 2009)
• Sergio Calixto, Francisco J. Sánchez-Marin, M. E. Sánchez-Morales

Large-area and high-resolution distortion measurement based on moiré fringe method for hot embossing process

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18394-18407 (October 2009)
• Zhiguang Xu, Hayden K. Taylor, Duane S. Boning, Soon Fatt Yoon, Kamal Youcef-Toumi

Extracting coupling and loss coefficients from a ring resonator

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18971-18982 (October 2009)
• W. R. McKinnon, D. X. Xu, C. Storey, E. Post, A. Densmore, A. Delâge, P. Waldron, J. H. Schmid, S. Janz

Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illumination

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 19278-19291 (October 2009)
• Wei Liu, Shiyuan Liu, Tingting Zhou, Lijuan Wang

Laser differential confocal ultra-long focal length measurement

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20051-20062 (October 2009)
• Weiqian Zhao, Ruoduan Sun, Lirong Qiu, Dingguo Sha

High resolution interferometer with multiple-pass optical configuration

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21042-21049 (November 2009)
• Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae-Wan Kim, Soohyun Kim

A simple technique for accurate and complete characterisation of a Fabry-Perot cavity

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21935-21943 (November 2009)
• C. R. Locke, D. Stuart, E. N. Ivanov, A. N. Luiten

THz photomixing synthesizer based on a fiber frequency comb

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 22031-22040 (November 2009)
• Gaël Mouret, Francis Hindle, Arnaud Cuisset, Chun Yang, Robin Bocquet, Michel Lours, Daniele Rovera

Design of zero reference codes using cross-entropy method

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 22163-22170 (November 2009)
• Jung-Chieh Chen

Long period grating refractive-index sensor: optimal design for single wavelength interrogation

• Abstract

• Applied Optics, Vol. 48, Issue 31, pp. G88-G94 (November 2009)
• Amita Kapoor, Enakshi K. Sharma

Automatic null ellipsometry with an interferometer

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6277-6280 (November 2009)
• Lionel R. Watkins

Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopy

• Abstract

• Applied Optics, Vol. 48, Issue 33, pp. 6432-6441 (November 2009)
• Shiguang Li, Jing Liu, Nam-Trung Nguyen, Zhong Ping Fang, Soon Fatt Yoon

Subdivision and direction recognition of λ/16 of orthogonal fringes for nanometric measurement

• Abstract

• Applied Optics, Vol. 48, Issue 33, pp. 6479-6484 (November 2009)
• Haijiang Hu, Xiaoqian Qiu, Jing Wang, Aisong Ju, Yunbo Zhang

Simultaneous composition and thickness measurement of paper using terahertz time-domain spectroscopy

• Abstract

• Applied Optics, Vol. 48, Issue 33, pp. 6541-6546 (November 2009)
• Payam Mousavi, Frank Haran, David Jez, Fadil Santosa, John Steven Dodge

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Select all      Select an action... ------------------------ Export Citation in:   ► BibTeX   ► EndNote (RIS)   ► Rich Text (.rtf)   ► Plain Text ------------------------ Save to:   ► Personal Library

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Results 1-20 of 743

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