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Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology


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  • JOSA A, Vol. 31, Issue 4, pp. 794-801 (April 2014)
  • Mohammad Vali Arbabmir, Seyyed Mohammad Mohammadi, Sadegh Salahshour, Farshad Somayehee

  • Optics Letters, Vol. 39, Issue 7, pp. 1949-1952 (April 2014)
  • Arjan J. H. Meskers, Jo W. Spronck, Robert H. Munnig Schmidt

  • Optics Letters, Vol. 39, Issue 7, pp. 1996-1999 (April 2014)
  • Matthew T. Rinehart, Volker Jaedicke, Adam Wax

  • Optics Express, Vol. 22, Issue 7, pp. 8041-8046 (April 2014)
  • Jan L. Chaloupka, Maurice Woods, Jacob Aas, Jessamyn Hutchins, Jonathan D. Thistle

  • Optics Express, Vol. 22, Issue 7, pp. 8277-8290 (April 2014)
  • Shawn Divitt, Zachary J. Lapin, Lukas Novotny

  • Optics Express, Vol. 22, Issue 8, pp. 9004-9015 (April 2014)
  • Yves Kayser, Simon Rutishauser, Tetsuo Katayama, Haruhiko Ohashi, Takashi Kameshima, Uwe Flechsig, Makina Yabashi, Christian David

  • Optics Express, Vol. 22, Issue 8, pp. 9291-9300 (April 2014)
  • Kai Sun, Shengkai Wang, Ritobrata Sur, Xing Chao, Jay B. Jeffries, Ronald K. Hanson

  • Optics Express, Vol. 22, Issue 8, pp. 9314-9323 (April 2014)
  • Gleb Vdovin, Oleg Soloviev, Mikhail Loktev

  • Optics Express, Vol. 22, Issue 8, pp. 9324-9333 (April 2014)
  • Daniel Schütze, Vitali Müller, Gunnar Stede, Benjamin S. Sheard, Gerhard Heinzel, Karsten Danzmann, Andrew J. Sutton, Daniel A. Shaddock

  • Optics Express, Vol. 22, Issue 8, pp. 9871-9886 (April 2014)
  • Ming Zhang, Liang Zhang, Jincai Wu, Shiji Yang, Xiong Wan, Zhiping He, Jianjun Jia, D. S. Citrin, Jianyu Wang

  • Optics Express, Vol. 22, Issue 8, pp. 9887-9901 (April 2014)
  • Dong Li, Jonathan Kofman

  • Applied Optics, Vol. 53, Issue 10, pp. 2206-2212 (April 2014)
  • Kajpanya Suwansukho, Sarun Sumriddetchkajorn, Prathan Buranasiri

  • Applied Optics, Vol. 53, Issue 10, pp. 2246-2255 (April 2014)
  • Xiaomei Chen, Andrew Longstaff, Simon Fletcher, Alan Myers

  • Applied Optics, Vol. 53, Issue 10, pp. B196-B204 (April 2014)
  • V. P. Lukin, V. V. Nosov, A. V. Torgaev

  • Applied Optics, Vol. 53, Issue 11, pp. 2267-2272 (April 2014)
  • Octavio Olvera-R, Moisés Cywiak, Joel Cervantes-L, Arquímedes Morales

  • Applied Optics, Vol. 53, Issue 11, pp. 2331-2344 (April 2014)
  • Sharika Mohanan, Atul Srivastava

  • Applied Optics, Vol. 53, Issue 12, pp. 2562-2582 (April 2014)
  • Sven van Haver, Wim M. J. Coene, Koen D’havé, Niels Geypen, Paul van Adrichem, Laurens de Winter, Augustus J. E. M. Janssen, Shaunee Cheng

  • Applied Optics, Vol. 53, Issue 12, pp. 2730-2740 (April 2014)
  • Petr Pokorny

  • Chinese Optics Letters, Vol. 12, Issue 4, pp. 043002- (April 2014)
  • Faizar Abdurrahman, Norhana Arsad, Sabiran , Harry Ramza

  • Optical Materials Express, Vol. 4, Issue 5, pp. 976-981 (May 2014)
  • Tadayuki Imai, Jun Miyazu, Junya Kobayashi
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