Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

<< Previous

Results 1-20 of 735

Next >>

Export and save citations. Select articles then choose an action.
Select all      Select an action... ------------------------ Export Citation in:   ► BibTeX   ► EndNote (RIS)   ► Rich Text (.rtf)   ► Plain Text ------------------------ Save to:   ► Personal Library

Improved model-based infrared reflectrometry for measuring deep trench structures

• Abstract

• JOSA A, Vol. 26, Issue 11, pp. 2327-2335 (November 2009)
• Chuanwei Zhang, Shiyuan Liu, Tielin Shi, Zirong Tang

Flexible 3-D shape measurement using projector defocusing

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3080-3082 (October 2009)
• Shuangyan Lei, Song Zhang

Interferometric quasi-absolute tests for aspherics using a radial shear position

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3178-3180 (October 2009)
• Klaus Mantel, Eduard Geist, Irina Harder, Norbert Lindlein, Gerd Leuchs

Precise displacement measurement for a local surface

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3406-3408 (November 2009)
• Sheng Lih Yeh, Shyh Tsong Lin, Yu Hsin Chang

Phase-controlled integrated photonic quantum circuits

• Abstract
• 

• Optics Express, Vol. 17, Issue 16, pp. 13516-13525 (August 2009)
• Brian J. Smith, Dmytro Kundys, Nicholas Thomas-Peter, P. G. R. Smith, I. A. Walmsley

Monitoring and dynamic control of distance and tilt angle measurements in micro-alignment instrument using an imaging approach

• Abstract
• 

• Optics Express, Vol. 17, Issue 17, pp. 14722-14728 (August 2009)
• C. C. Jeng, C. H. Wu, C. Z. Li, J. H. Chen

White-light scanning interferometer for absolute nano-scale gap thickness measurement

• Abstract
• 

• Optics Express, Vol. 17, Issue 17, pp. 15104-15117 (August 2009)
• Zhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, Soon Fatt Yoon

Surface plasmon resonance (SPR) sensors: approaching their limits?

• Abstract
• 

• Optics Express, Vol. 17, Issue 19, pp. 16505-16517 (September 2009)
• Marek Piliarik, Jiří Homola

A distance meter using a terahertz intermode beat in an optical frequency comb

• Abstract
• 

• Optics Express, Vol. 17, Issue 20, pp. 17324-17337 (September 2009)
• Shuko Yokoyama, Toshiyuki Yokoyama, Yuki Hagihara, Tsutomu Araki, Takeshi Yasui

Pressure measurements through image analysis

• Abstract
• 

• Optics Express, Vol. 17, Issue 20, pp. 17996-18002 (September 2009)
• Sergio Calixto, Francisco J. Sánchez-Marin, M. E. Sánchez-Morales

Large-area and high-resolution distortion measurement based on moiré fringe method for hot embossing process

• Abstract
• 

• Optics Express, Vol. 17, Issue 21, pp. 18394-18407 (October 2009)
• Zhiguang Xu, Hayden K. Taylor, Duane S. Boning, Soon Fatt Yoon, Kamal Youcef-Toumi

Extracting coupling and loss coefficients from a ring resonator

• Abstract
• 

• Optics Express, Vol. 17, Issue 21, pp. 18971-18982 (October 2009)
• W. R. McKinnon, D. X. Xu, C. Storey, E. Post, A. Densmore, A. Delâge, P. Waldron, J. H. Schmid, S. Janz

Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illumination

• Abstract
• 

• Optics Express, Vol. 17, Issue 21, pp. 19278-19291 (October 2009)
• Wei Liu, Shiyuan Liu, Tingting Zhou, Lijuan Wang

Laser differential confocal ultra-long focal length measurement

• Abstract
• 

• Optics Express, Vol. 17, Issue 22, pp. 20051-20062 (October 2009)
• Weiqian Zhao, Ruoduan Sun, Lirong Qiu, Dingguo Sha

High resolution interferometer with multiple-pass optical configuration

• Abstract
• 

• Optics Express, Vol. 17, Issue 23, pp. 21042-21049 (November 2009)
• Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae-Wan Kim, Soohyun Kim

Optimization of system parameters for a complete multispectral polarimeter

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4767-4773 (August 2009)
• André Hollstein, Thomas Ruhtz, Jürgen Fischer, René Preusker

One-dimensional single-mode fiber-optic displacement sensors for submillimeter measurements

• Abstract

• Applied Optics, Vol. 48, Issue 26, pp. 4851-4857 (September 2009)
• Vincent Trudel, Yves St-Amant

Long period grating refractive-index sensor: optimal design for single wavelength interrogation

• Abstract

• Applied Optics, Vol. 48, Issue 31, pp. G88-G94 (November 2009)
• Amita Kapoor, Enakshi K. Sharma

Automatic null ellipsometry with an interferometer

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6277-6280 (November 2009)
• Lionel R. Watkins

New method for calibration of sun photometers

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 9, pp. 760-763 (September 2009)
• H. H. Asadov, I. G. Chobanzadeh

Export and save citations. Select articles then choose an action.
Select all      Select an action... ------------------------ Export Citation in:   ► BibTeX   ► EndNote (RIS)   ► Rich Text (.rtf)   ► Plain Text ------------------------ Save to:   ► Personal Library

<< Previous

Results 1-20 of 735

Next >>