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Instrumentation, measurement, and metrology : Remote sensing and sensors


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  • Optics Letters, Vol. 39, Issue 6, pp. 1705-1708 (March 2014)
  • Ayush Bhandari, Achuta Kadambi, Refael Whyte, Christopher Barsi, Micha Feigin, Adrian Dorrington, Ramesh Raskar

  • Optics Express, Vol. 21, Issue 25, pp. 30874-30885 (December 2013)
  • Juliana C. Franco, Grasiele Gonçalves, Monique S. Souza, Samantha B. C. Rosa, Larissa M. Thiegue, Teresa D. Z. Atvars, Paulo T. V. Rosa, René A. Nome

  • Optics Express, Vol. 21, Issue 26, pp. 31990-31997 (December 2013)
  • Lee R. Burchett, Steven T. Fiorino

  • Optics Express, Vol. 21, Issue 26, pp. 32349-32357 (December 2013)
  • Bing-Hong Liu, Yong-Xiang Jiang, Xiao-Song Zhu, Xiao-Li Tang, Yi-Wei Shi

  • Optics Express, Vol. 22, Issue 3, pp. 2167-2173 (February 2014)
  • Qingming Chen, Chao Jin, Yuan Bao, Zhaohui Li, Jianping Li, Chao Lu, Liang Yang, Guifang Li

  • Optics Express, Vol. 22, Issue 6, pp. 7172-7177 (March 2014)
  • Albert Manninen, Teemu Kääriäinen, Tomi Parviainen, Scott Buchter, Miika Heiliö, Toni Laurila

  • Optics Express, Vol. 22, Issue 6, pp. 7290-7307 (March 2014)
  • Evangelos Theocharous, Christopher J. Chunnilall, Ryan Mole, David Gibbs, Nigel Fox, Naigui Shang, Guy Howlett, Ben Jensen, Rosie Taylor, Juan R. Reveles, Oliver B. Harris, Naseer Ahmed

  • Optics Express, Vol. 22, Issue 7, pp. 7587-7597 (April 2014)
  • He Wang, Qizhen Sun, Xiaolei Li, Jianghai Wo, Perry Ping Shum, Deming Liu

  • Optics Express, Vol. 22, Issue 7, pp. 8101-8113 (April 2014)
  • Sylvain Boudreau, Jérôme Genest

  • Applied Optics, Vol. 52, Issue 35, pp. 8581-8585 (December 2013)
  • Xiaonan Hui, Shilie Zheng, Jinhai Zhou, Chen Xu, Hao Chi, Xiaofeng Jin, Xianmin Zhang

  • Applied Optics, Vol. 53, Issue 4, pp. 702-708 (February 2014)
  • Olivier D. Bernal, Usman Zabit, Thierry Bosch

  • Applied Optics, Vol. 53, Issue 5, pp. 931-936 (February 2014)
  • Silvio Bianchi

  • Applied Optics, Vol. 53, Issue 7, pp. 1363-1380 (March 2014)
  • Pantazis Mouroulis, Byron Van Gorp, Robert O. Green, Heidi Dierssen, Daniel W. Wilson, Michael Eastwood, Joseph Boardman, Bo-Cai Gao, David Cohen, Brian Franklin, Frank Loya, Sarah Lundeen, Alan Mazer, Ian McCubbin, David Randall, Brandon Richardson, Jose I. Rodriguez, Charles Sarture, Eugenio Urquiza, Rudolph Vargas, Victor White, Karl Yee

  • Applied Optics, Vol. 53, Issue 10, pp. 2007-2011 (April 2014)
  • Feng De-Jun, Liu Guan-Xiu, Liu Xi-Lu, Jiang Ming-Shun, Sui Qing-Mei

  • Applied Optics, Vol. 53, Issue 11, pp. 2366-2374 (April 2014)
  • Kaihua Sun, Ling Yuan, Zhonghua Shen, Zhihong Xu, Qingping Zhu, Xiaowu Ni, Jian Lu

  • Applied Optics, Vol. 53, Issue 11, pp. 2437-2440 (April 2014)
  • Effie Plosker, Shlomi Arnon

  • Journal of Optical Technology, Vol. 80, Issue 12, pp. 772-777 (December 2013)
  • I. A. Konyakhin, T. V. Turgalieva

  • Journal of Optical Technology, Vol. 81, Issue 1, pp. 12-17 (January 2014)
  • Yu. V. Baëva, E. V. Lapovok, S. I. Khankov

  • Journal of Optical Technology, Vol. 81, Issue 1, pp. 18-23 (January 2014)
  • Kh. I. Abdusamatov, E. V. Lapovok, S. I. Khankov

  • Chinese Optics Letters, Vol. 11, Issue 12, pp. 120101-120101 (December 2013)
  • Honghua Huang, Chaolong Cui, Wenyue Zhu, Zaihong Hou, Yi Wu, Ruizhong Rao
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