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Instrumentation, measurement, and metrology : Remote sensing and sensors


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  • Optics Letters, Vol. 39, Issue 13, pp. 3822-3825 (July 2014)
  • George Y. Chen, Christophe A. Codemard, Richard J. Lewis, Lukasz Jankowski, Jaclyn S. Chan, Philip M. Gorman, Michalis N. Zervas

  • Optics Letters, Vol. 39, Issue 14, pp. 4128-4131 (July 2014)
  • Marco Consales, Gaia Berruti, Anna Borriello, Michele Giordano, Salvatore Buontempo, Giovanni Breglio, Alajos Makovec, Paolo Petagna, Andrea Cusano

  • Optics Letters, Vol. 39, Issue 16, pp. 4796-4799 (August 2014)
  • Ralf Bauer, George Stewart, Walter Johnstone, Euan Boyd, Michael Lengden

  • Optics Express, Vol. 22, Issue 7, pp. 7587-7597 (April 2014)
  • He Wang, Qizhen Sun, Xiaolei Li, Jianghai Wo, Perry Ping Shum, Deming Liu

  • Optics Express, Vol. 22, Issue 11, pp. 13170-13189 (June 2014)
  • Yabai He, Chunjiang Jin, Ruifeng Kan, Jianguo Liu, Wenqing Liu, Julian Hill, Ian M. Jamie, Brian J. Orr

  • Optics Express, Vol. 22, Issue 13, pp. 15932-15940 (June 2014)
  • Zhaohui Li, Bo Chen, Kefei Song, Xiaodong Wang, Shijie Liu, Liang Yang, Qinglong Hu, Ke Qiao, Liping Zhang, Guodong Wu, Ping Yu

  • Optics Express, Vol. 22, Issue 14, pp. 16778-16783 (July 2014)
  • Alexander L. Tomashuk, Mikhail V. Grekov, Sergei A. Vasiliev, Vyacheslav V. Svetukhin

  • Optics Express, Vol. 22, Issue 14, pp. 17030-17038 (July 2014)
  • Luca Ciaffoni, John Couper, Gus Hancock, Robert Peverall, Peter A. Robbins, Grant A. D. Ritchie

  • Optics Express, Vol. 22, Issue 14, pp. 17349-17359 (July 2014)
  • Takeshi Yasui, Makoto Fujio, Shuko Yokoyama, Tsutomu Araki

  • Optics Express, Vol. 22, Issue 18, pp. 21280-21291 (September 2014)
  • Hao Zhang, Yazhou Yang, Weidong Jin, Chujian Liu, Weibiao Hsu

  • Optics Express, Vol. 22, Issue 105, pp. A1203-A1221 (August 2014)
  • Xiankang Dou, Yuli Han, Dongsong Sun, Haiyun Xia, Zhifeng Shu, Ruocan Zhao, Mingjia Shangguan, Jie Guo

  • Applied Optics, Vol. 53, Issue 11, pp. 2366-2374 (April 2014)
  • Kaihua Sun, Ling Yuan, Zhonghua Shen, Zhihong Xu, Qingping Zhu, Xiaowu Ni, Jian Lu

  • Applied Optics, Vol. 53, Issue 11, pp. 2437-2440 (April 2014)
  • Effie Plosker, Shlomi Arnon

  • Applied Optics, Vol. 53, Issue 13, pp. C64-C71 (May 2014)
  • Torbjørn Skauli, Hans Erling Torkildsen, Stephane Nicolas, Thomas Opsahl, Trym Haavardsholm, Ingebjørg Kåsen, Atle Rognmo

  • Applied Optics, Vol. 53, Issue 15, pp. 3301-3310 (May 2014)
  • Zhongping Lee, Shaoling Shang, Chuanmin Hu, Giuseppe Zibordi

  • Applied Optics, Vol. 53, Issue 23, pp. 5169-5178 (August 2014)
  • Iman Khodadad, Nigel Clarke, Mohammadreza Khorasaninejad, Dale Henneke, Simarjeet S. Saini

  • Applied Optics, Vol. 53, Issue 23, pp. 5211-5221 (August 2014)
  • Alexander M. Liudchik

  • Applied Optics, Vol. 53, Issue 29, pp. H85-H90 (October 2014)
  • Jianying Yuan, Chun-Liu Zhao, Yumeng Zhou, Xiangdong Yu, Juan Kang, Jianfeng Wang, Shangzhong Jin

  • Journal of Optical Technology, Vol. 81, Issue 7, pp. 382-387 (July 2014)
  • H. Abdussamatov, Y. Lapovok, S. Khankov

  • Optical Materials Express, Vol. 4, Issue 6, pp. 1128-1139 (June 2014)
  • Anuj Dhawan, Yashna Sharma, Leandra Brickson, John F. Muth
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