Large step-height measurements using multiple-wavelength holographic interferometry with tunable laser diodes

• Abstract

• JOSA A, Vol. 25, Issue 12, pp. 3013-3020 (December 2008)
• Atsushi Wada, Makoto Kato, Yukihiro Ishii

Time-domain surface profile imaging via a hyperspectral Fourier transform spectrometer

• Abstract

• Optics Letters, Vol. 33, Issue 12, pp. 1368-1370 (June 2008)
• Julia Rentz Dupuis, M. Selim Ünlü

Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry

• Abstract

• Optics Letters, Vol. 34, Issue 4, pp. 416-418 (February 2009)
• Bing Pan, Qian Kemao, Lei Huang, Anand Asundi

Experimental observation of pulse trains' destructive interference with a femtosecond optical frequency-comb-based interferometer

• Abstract

• Optics Letters, Vol. 34, Issue 18, pp. 2775-2777 (September 2009)
• Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

Three dimensional sidewall measurements by laser fluorescent confocal microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 6, pp. 4001-4014 (March 2008)
• Shiguang Li, Zhiguang Xu, Ivan Reading, Soon Fatt Yoon, Zhong Ping Fang, Jianhong Zhao

White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4495-4499 (March 2009)
• Maitreyee Roy, Joanna Schmit, Parameswaran Hariharan

Analysis of the temporal coherence function of a femtosecond optical frequency comb

• Abstract
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• Optics Express, Vol. 17, Issue 9, pp. 7011-7018 (April 2009)
• Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

Monitoring and dynamic control of distance and tilt angle measurements in micro-alignment instrument using an imaging approach

• Abstract
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• Optics Express, Vol. 17, Issue 17, pp. 14722-14728 (August 2009)
• C. C. Jeng, C. H. Wu, C. Z. Li, J. H. Chen

A generalized reference-plane-based calibration method in optical triangular profilometry

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 20735-20746 (November 2009)
• Suochao Cui, Xiao Zhu

Determination of three-dimensional displacement using two-dimensional digital image correlation

• Abstract

• Applied Optics, Vol. 47, Issue 4, pp. 583-593 (February 2008)
• Chenggen Quan, Cho Jui Tay, Wei Sun, Xiaoyuan He

Simulation, implementation, and analysis of an optical fiber bundle distance sensor with single mode illumination

• Abstract

• Applied Optics, Vol. 47, Issue 9, pp. 1302-1309 (March 2008)
• Haiying Huang, Uday Tata

Multiple-wavelength digital holographic interferometry using tunable laser diodes

• Abstract

• Applied Optics, Vol. 47, Issue 12, pp. 2053-2060 (April 2008)
• Atsushi Wada, Makoto Kato, Yukihiro Ishii

Three-dimensional profiling using the Fourier transform method with a hexagonal grating projection

• Abstract

• Applied Optics, Vol. 47, Issue 12, pp. 2103-2108 (April 2008)
• Koichi Iwata, Fuminori Kusunoki, Kousuke Moriwaki, Hiroki Fukuda, Takaharu Tomii

Application of the astigmatic method to the thickness measurement of glass substrates

• Abstract

• Applied Optics, Vol. 47, Issue 21, pp. 3968-3972 (July 2008)
• Chien-Hung Liu, Zong-Han Li

Improved speckle projection profilometry for out-of-plane shape measurement

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5527-5533 (October 2008)
• Bing Pan, Huimin Xie, Jianxin Gao, Anand Asundi

Three-dimensional shape measurement with a fast and accurate approach

• Abstract

• Applied Optics, Vol. 48, Issue 6, pp. 1052-1061 (February 2009)
• Zhaoyang Wang, Hua Du, Seungbae Park, Huimin Xie

Superimposed fringe projection for three-dimensional shape acquisition by image analysis

• Abstract

• Applied Optics, Vol. 48, Issue 13, pp. 2410-2420 (May 2009)
• Marco Sasso, Gianluca Chiappini, Giacomo Palmieri, Dario Amodio

Three-dimensional profilometry using a Dammann grating

• Abstract

• Applied Optics, Vol. 48, Issue 19, pp. 3709-3715 (July 2009)
• Jun Zhang, Changhe Zhou, Xiaoxin Wang

Linear optical characterization of transparent thin films by the Z-scan technique

• Abstract

• Applied Optics, Vol. 48, Issue 21, pp. 4124-4129 (July 2009)
• Georges Boudebs, Kamil Fedus

Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopy

• Abstract

• Applied Optics, Vol. 48, Issue 33, pp. 6432-6441 (November 2009)
• Shiguang Li, Jing Liu, Nam-Trung Nguyen, Zhong Ping Fang, Soon Fatt Yoon