Instrumentation, measurement, and metrology : Interferometry

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Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2503-2511 (December 2009)
• Kamel Houairi, Frédéric Cassaing

Effect of input spectrum on the spectral switch characteristics in a white-light Michelson interferometer

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2592-2599 (December 2009)
• Maruthi M. Brundavanam, Nirmal K. Viswanathan, D. Narayana Rao

Interferometric quasi-absolute tests for aspherics using a radial shear position

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3178-3180 (October 2009)
• Klaus Mantel, Eduard Geist, Irina Harder, Norbert Lindlein, Gerd Leuchs

Two-beam SPIDER for dual-pulse single-shot characterization

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3415-3417 (November 2009)
• Doug French, Christophe Dorrer, Igor Jovanovic

Microbending behavior of large-effective-area Bragg fibers

• Abstract

• Optics Letters, Vol. 34, Issue 22, pp. 3490-3492 (November 2009)
• Catherine Baskiotis, Yves Jaouën, Renaud Gabet, Géraud Bouwmans, Yves Quiquempois, Marc Douay, Pierre Sillard

Phase-shift extraction for generalized phase-shifting interferometry

• Abstract

• Optics Letters, Vol. 34, Issue 22, pp. 3553-3555 (November 2009)
• Peng Gao, Baoli Yao, Norbert Lindlein, Klaus Mantel, Irina Harder, Eduard Geist

Optoacoustic imaging using fiber-optic interferometric sensors

• Abstract

• Optics Letters, Vol. 34, Issue 23, pp. 3695-3697 (December 2009)
• Horacio Lamela, Daniel Gallego, Alexander Oraevsky

Spatial phase-shifting characteristic of double grating interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20415-20429 (October 2009)
• Yang Song, YunYun Chen, Anzhi He, Zhimin Zhao

High resolution interferometer with multiple-pass optical configuration

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21042-21049 (November 2009)
• Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae-Wan Kim, Soohyun Kim

Frequency comb swept lasers

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21257-21270 (November 2009)
• Tsung-Han Tsai, Chao Zhou, Desmond C. Adler, James G. Fujimoto

Delay control in attosecond pump-probe experiments

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21459-21464 (November 2009)
• Michael Chini, Hiroki Mashiko, He Wang, Shouyuan Chen, Chenxia Yun, Shane Scott, Steve Gilbertson, Zenghu Chang

Fabrication of optical mosaic gratings with phase and attitude adjustments employing latent fringes and a red-wavelength dual-beam interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21530-21543 (November 2009)
• Lei Shi, Lijiang Zeng, Lifeng Li

Thermally stabilized PCF-based sensor for temperature measurements up to 1000ºC

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21551-21559 (November 2009)
• Gianluca Coviello, Vittoria Finazzi, Joel Villatoro, Valerio Pruneri

The general theory of phase shifting algorithms

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21867-21881 (November 2009)
• M. Servin, J. C. Estrada, J. A. Quiroga

Polarimetric stellar interferometry by use of birefringent retarders

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5774-5781 (October 2009)
• Naoshi Murakami, Naoko Ohishi, Jun Nishikawa, Masanori Yoshizawa

Long-term stabilization of a heterodyne metrology interferometer down to a noise level of 20 pm over an hour

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6105-6110 (November 2009)
• Yoshito Niwa, Koji Arai, Akitoshi Ueda, Masaaki Sakagami, Naoteru Gouda, Yukiyasu Kobayashi, Yoshiyuki Yamada, Taihei Yano

Diode-laser-based high-precision absolute distance interferometer of 20 m range

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6188-6194 (November 2009)
• Florian Pollinger, Karl Meiners-Hagen, Martin Wedde, Ahmed Abou-Zeid

Automatic null ellipsometry with an interferometer

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6277-6280 (November 2009)
• Lionel R. Watkins

Subdivision and direction recognition of λ/16 of orthogonal fringes for nanometric measurement

• Abstract

• Applied Optics, Vol. 48, Issue 33, pp. 6479-6484 (November 2009)
• Haijiang Hu, Xiaoqian Qiu, Jing Wang, Aisong Ju, Yunbo Zhang

Spatial coherence profilometry on tilted surfaces

• Abstract

• Applied Optics, Vol. 48, Issue 34, pp. H40-H47 (December 2009)
• Pavel Pavliček, Marek Halouzka, Zhihui Duan, Mitsuo Takeda

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