Instrumentation, measurement, and metrology : Interferometry

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Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2503-2511 (December 2009)
• Kamel Houairi, Frédéric Cassaing

Ultrasensitive direct-field retrieval of femtosecond pulses by modified interferometric field autocorrelation

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3065-3067 (October 2009)
• Shang-Da Yang, Chen-Shao Hsu, Shih-Lun Lin, You-Sheng Lin, Carsten Langrock, M. M. Fejer

Interferometric quasi-absolute tests for aspherics using a radial shear position

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3178-3180 (October 2009)
• Klaus Mantel, Eduard Geist, Irina Harder, Norbert Lindlein, Gerd Leuchs

Experimental demonstration of a suspended diffractively coupled optical cavity

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3184-3186 (October 2009)
• M. P. Edgar, B. W. Barr, J. Nelson, M. V. Plissi, K. A. Strain, O. Burmeister, M. Britzger, K. Danzmann, R. Schnabel, T. Clausnitzer, F. Brückner, E.-B. Kley, A. Tünnermann

Two-beam SPIDER for dual-pulse single-shot characterization

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3415-3417 (November 2009)
• Doug French, Christophe Dorrer, Igor Jovanovic

Microbending behavior of large-effective-area Bragg fibers

• Abstract

• Optics Letters, Vol. 34, Issue 22, pp. 3490-3492 (November 2009)
• Catherine Baskiotis, Yves Jaouën, Renaud Gabet, Géraud Bouwmans, Yves Quiquempois, Marc Douay, Pierre Sillard

Modal interferometer based on hollow-core photonic crystal fiber for strain and temperature measurement

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18669-18675 (October 2009)
• S. H. Aref, R. Amezcua-Correa, J. P. Carvalho, O. Frazão, P. Caldas, J. L. Santos, F. M. Araújo, H. Latifi, F. Farahi, L. A. Ferreira, J. C. Knight

Wavelength swept amplified spontaneous emission source

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18794-18807 (October 2009)
• Christoph M. Eigenwillig, Benjamin R. Biedermann, Wolfgang Wieser, Robert Huber

Ultraviolet refractometry using field-based light scattering spectroscopy

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18878-18886 (October 2009)
• Dan Fu, Wonshik Choi, Yongjin Sung, Seungeun Oh, Zahid Yaqoob, Yongkeun Park, Ramachandra R. Dasari, Michael S. Feld

Stabilization of a long-armed fiber-optic single-photon interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 19027-19032 (October 2009)
• Seok-Beom Cho, Tae-Gon Noh

Dual-frequency heterodyne ellipsometer for characterizing generalized elliptically birefringent media

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 19213-19224 (October 2009)
• Chih-Jen Yu, Chu-En Lin, Ying-Chang Li, Li-Dek Chou, Jheng-Syong Wu, Cheng-Chung Lee, Chien Chou

Spatial phase-shifting characteristic of double grating interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20415-20429 (October 2009)
• Yang Song, YunYun Chen, Anzhi He, Zhimin Zhao

High resolution interferometer with multiple-pass optical configuration

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21042-21049 (November 2009)
• Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae-Wan Kim, Soohyun Kim

Frequency comb swept lasers

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21257-21270 (November 2009)
• Tsung-Han Tsai, Chao Zhou, Desmond C. Adler, James G. Fujimoto

Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5561-5566 (October 2009)
• Takamasa Suzuki, Tsutomu Takahashi, Osami Sasaki

Polarimetric stellar interferometry by use of birefringent retarders

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5774-5781 (October 2009)
• Naoshi Murakami, Naoko Ohishi, Jun Nishikawa, Masanori Yoshizawa

Long-term stabilization of a heterodyne metrology interferometer down to a noise level of 20 pm over an hour

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6105-6110 (November 2009)
• Yoshito Niwa, Koji Arai, Akitoshi Ueda, Masaaki Sakagami, Naoteru Gouda, Yukiyasu Kobayashi, Yoshiyuki Yamada, Taihei Yano

Diode-laser-based high-precision absolute distance interferometer of 20 m range

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6188-6194 (November 2009)
• Florian Pollinger, Karl Meiners-Hagen, Martin Wedde, Ahmed Abou-Zeid

Automatic null ellipsometry with an interferometer

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6277-6280 (November 2009)
• Lionel R. Watkins

Spatial coherence profilometry on tilted surfaces

• Abstract

• Applied Optics, Vol. 48, Issue 34, pp. H40-H47 (December 2009)
• Pavel Pavliček, Marek Halouzka, Zhihui Duan, Mitsuo Takeda

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