Instrumentation, measurement, and metrology : Interferometry

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Differential phase decoder in a polarized optical heterodyne interferometer

• Abstract

• JOSA A, Vol. 25, Issue 11, pp. 2630-2635 (November 2008)
• Chien Chou, Hui-Kang Teng, Chien-Chung Tsai, Jheng-Syong Wu

Slow-light interferometry: practical limitations to spectroscopic performance

• Abstract

• JOSA B, Vol. 25, Issue 12, pp. C136-C143 (December 2008)
• Zhimin Shi, Robert W. Boyd

Low-coherent light-source angular interferometer using a square prism and the angular-scanning technique

• Abstract

• Optics Letters, Vol. 33, Issue 20, pp. 2344-2346 (October 2008)
• Shyh-Tsong Lin, Sheng-Lih Yeh, Chien-Wei Chang

Optical measurements of angle and axis of rotation

• Abstract

• Optics Letters, Vol. 33, Issue 21, pp. 2419-2421 (November 2008)
• Ghazanfar Hussain, Masroor Ikram

Application of the T-matrix method to determine the structure of spheroidal cell nuclei with angle-resolved light scattering

• Abstract

• Optics Letters, Vol. 33, Issue 21, pp. 2452-2454 (November 2008)
• Michael G. Giacomelli, Kevin J. Chalut, Julie H. Ostrander, Adam Wax

Miniature fiber-optic high temperature sensor based on a hybrid structured Fabry–Perot interferometer

• Abstract

• Optics Letters, Vol. 33, Issue 21, pp. 2455-2457 (November 2008)
• Hae Young Choi, Kwan Seob Park, Seong Jun Park, Un-Chul Paek, Byeong Ha Lee, Eun Seo Choi

Rapid and reliable reference sphere calibration for Fizeau interferometry

• Abstract

• Optics Letters, Vol. 33, Issue 21, pp. 2536-2538 (November 2008)
• Jan Burke

Compact optical short-pass filters based on microfibers

• Abstract

• Optics Letters, Vol. 33, Issue 21, pp. 2565-2567 (November 2008)
• Yuan Chen, Zhe Ma, Qing Yang, Li-Min Tong

One-shot phase-shifting interferometry: five, seven, and nine interferograms

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2788-2790 (December 2008)
• Gustavo Rodriguez-Zurita, Noel-Ivan Toto-Arellano, Cruz Meneses-Fabian, José F. Vázquez-Castillo

Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2794-2796 (December 2008)
• Xiang Yu, Yukihiro Araki, Kentaro Iwami, Norihiro Umeda

Spectral phase measurements for broad Raman sidebands by using spectral interferometry

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2809-2811 (December 2008)
• Takayuki Suzuki, Naoki Sawayama, Masayuki Katsuragawa

Si lattice parameter measurement by centimeter X-ray interferometry

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16877-16888 (October 2008)
• Luca Ferroglio, Giovanni Mana, Enrico Massa

Integrated optical sensor using a liquid-core waveguide in a Mach-Zehnder interferometer

• Abstract
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• Optics Express, Vol. 16, Issue 22, pp. 18164-18172 (October 2008)
• Patrick Dumais, Claire L. Callender, Julian P. Noad, Christopher J. Ledderhof

Algorithm for multiple-beam Fizeau interferograms with arbitrary phase shifts

• Abstract
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• Optics Express, Vol. 16, Issue 23, pp. 18922-18932 (November 2008)
• Jiancheng Xu, Qiao Xu, Liqun Chai, Hansheng Peng

Deep microstructure topography characterization with optical vortex interferometer

• Abstract
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• Optics Express, Vol. 16, Issue 23, pp. 19179-19191 (November 2008)
• Jan Masajada, Monika Leniec, Elzbieta Jankowska, Hugo Thienpont, Heidi Ottevaere, Virginia Gomez

Phase shifts in the Fourier spectra of phase gratings and phase grids: an application for one-shot phase-shifting interferometry

• Abstract
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• Optics Express, Vol. 16, Issue 23, pp. 19330-19341 (November 2008)
• Noel-Ivan Toto-Arellano, Gustavo Rodriguez-Zurita, Cruz Meneses-Fabian, Jose F. Vazquez-Castillo

Distance measurements by combined method based on a femtosecond pulse laser

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19799-19806 (November 2008)
• Ki-Nam Joo, Yunseok Kim, Seung-Woo Kim

Interferometric null test of a deep parabolic reflector generating a Hertzian dipole field

• Abstract

• Applied Optics, Vol. 47, Issue 30, pp. 5570-5584 (October 2008)
• Gerd Leuchs, Klaus Mantel, Andreas Berger, Hildegard Konermann, Markus Sondermann, Ulf Peschel, Norbert Lindlein, Johannes Schwider

Closed-loop phase-shifting homodyne interferometry using heterodyne phase detection

• Abstract

• Applied Optics, Vol. 47, Issue 33, pp. 6219-6225 (November 2008)
• Youichi Bitou

Nanodisplacement measurement using spectral shifts in a white-light interferometer

• Abstract

• Applied Optics, Vol. 47, Issue 34, pp. 6334-6339 (December 2008)
• Maruthi M. Brundavanam, Nirmal K. Viswanathan, D. Narayana Rao

Export and save citations. Select articles then choose an action.
Select all      Select an action... ------------------------ Export Citation in:   ► BibTeX   ► EndNote (RIS)   ► Rich Text (.rtf)   ► Plain Text ------------------------ Save to:   ► Personal Library

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