Instrumentation, measurement, and metrology : Interferometry

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Longitudinal-differential interferometry: direct imaging of axial superluminal phase propagation

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 305-307 (February 2012)
• Myun-Sik Kim, Toralf Scharf, Christoph Etrich, Carsten Rockstuhl, Hans Herzig Peter

Single-shot profilometry of rough surfaces using hyperspectral interferometry

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 350-352 (February 2012)
• Taufiq Widjanarko, Jonathan M. Huntley, Pablo D. Ruiz

Ultrahigh-resolution full-field optical coherence tomography using spatial coherence gating and quasi-monochromatic illumination

• Abstract

• Optics Letters, Vol. 37, Issue 4, pp. 458-460 (February 2012)
• Avner Safrani, Ibrahim Abdulhalim

Polarization phase-shifting Newton interferometer for plane optical surface measurements

• Abstract

• Optics Letters, Vol. 37, Issue 4, pp. 467-469 (February 2012)
• Shyh-Tsong Lin, Liang-Chia Chen, Sheng-Lih Yeh, Hu’ng-Xuân Trinh, Hung-Pin Chen

Real time ablation rate measurement during high aspect-ratio hole drilling with a 120-ps fiber laser

• Abstract
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• Optics Express, Vol. 20, Issue 1, pp. 663-671 (January 2012)
• Francesco P. Mezzapesa, Teresa Sibillano, Francesca Di Niso, Antonio Ancona, Pietro M. Lugarà, Maurizio Dabbicco, Gaetano Scamarcio

Image continuity at different levels of zoom for fringe patterns

• Abstract
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• Optics Express, Vol. 20, Issue 1, pp. 7-16 (January 2012)
• Mehrdad Abolbashari, Awad S. Gerges, Angela Davies, Faramarz Farahi

Arm-length stabilisation for interferometric gravitational-wave detectors using frequency-doubled auxiliary lasers

• Abstract
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• Optics Express, Vol. 20, Issue 1, pp. 81-89 (January 2012)
• Adam J. Mullavey, Bram J. J. Slagmolen, John Miller, Matthew Evans, Peter Fritschel, Daniel Sigg, Sam J. Waldman, Daniel A. Shaddock, David E. McClelland

System analysis of a tilted field-widened Michelson interferometer for high spectral resolution lidar

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1406-1420 (January 2012)
• Dong Liu, Chris Hostetler, Ian Miller, Anthony Cook, Johnathan Hair

Use of numerical orthogonal transformation for the Zernike analysis of lateral shearing interferograms

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1530-1544 (January 2012)
• Fengzhao Dai, Feng Tang, Xiangzhao Wang, Peng Feng, Osami Sasaki

Self-referenced composite Fabry-Pérot cavity vapor sensors

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 966-971 (January 2012)
• Karthik Reddy, Xudong Fan

Evaluation of polarization mode dispersion in a telecommunication wavelength selective switch using quantum interferometry

• Abstract
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• Optics Express, Vol. 20, Issue 3, pp. 2025-2033 (January 2012)
• A. Fraine, O. Minaeva, D. S. Simon, R. Egorov, A. V. Sergienko

Space position measurement using long-path heterodyne interferometer with optical frequency comb

• Abstract
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• Optics Express, Vol. 20, Issue 3, pp. 2725-2732 (January 2012)
• Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

Optical monitoring for power law fluids during spin coating

• Abstract
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• Optics Express, Vol. 20, Issue 3, pp. 3166-3175 (January 2012)
• P. L. G. Jardim, A. F. Michels, F. Horowitz

Polarization phase shifting dispersed fringe sensor

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 3703-3710 (February 2012)
• Gene Olczak

Statistical analysis for windowed Fourier ridge algorithm in fringe pattern analysis

• Abstract

• Applied Optics, Vol. 51, Issue 3, pp. 328-337 (January 2012)
• Wenjing Gao, Qian Kemao

White-light interferometry on rough surfaces—measurement uncertainty caused by noise

• Abstract

• Applied Optics, Vol. 51, Issue 4, pp. 465-473 (February 2012)
• Pavel Pavliček, Ondřej Hýbl

Wavelength dispersion measurement of electro-optic coefficients in the range of 520 to 930 nm in rubidium titanyl phosphate using spectral interferometry

• Abstract

• Applied Optics, Vol. 51, Issue 5, pp. 594-599 (February 2012)
• Olivier Gobert, Nikita Fedorov, Gabriel Mennerat, Dominique Lupinski, Delphine Guillaumet, Michel Perdrix, Antoine Bourgeade, Michel Comte

Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 1, pp. 010901- (January 2012)
• Juanjuan Zheng, Baoli Yao, Romano A. Rupp, Tong Ye, Peng Gao, Junwei Min, Rongli Guo

Compact fiber optic accelerometer

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 1, pp. 011201- (January 2012)
• Feng Peng, Jun Yang, Bing Wu, Yonggui Yuan, Xingliang Li, Ai Zhou, Libo Yuan

Slow light Mach-Zehnder fiber interferometer

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 2, pp. 021201- (February 2012)
• Yundong Zhang, Jinfang Wang, Xuenan Zhang, Hao Wu, Yuanxue Cai, Jing Zhang, Ping Yuan

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