Correlation technique for the compensation of diffraction widening of optical reference signals

• Abstract

• JOSA A, Vol. 26, Issue 9, pp. 1901-1906 (September 2009)
• José Sáez-Landete, José Alonso, Luis Miguel Sanchez-Brea, Tomás Morlanes, Eusebio Bernabeu

Two-wavelength interferometry: extended range and accurate optical path difference analytical estimator

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2503-2511 (December 2009)
• Kamel Houairi, Frédéric Cassaing

Perturbation methods in optics: application to the interferometric measurement of surfaces

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2538-2549 (December 2009)
• Eugenio Garbusi, Wolfgang Osten

Stable radio frequency transfer in 114 km urban optical fiber link

• Abstract

• Optics Letters, Vol. 34, Issue 19, pp. 2949-2951 (October 2009)
• Motohiro Kumagai, Miho Fujieda, Shigeo Nagano, Mizuhiko Hosokawa

Precise displacement measurement for a local surface

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3406-3408 (November 2009)
• Sheng Lih Yeh, Shyh Tsong Lin, Yu Hsin Chang

Ultrabroadband optical chirp linearization for precision metrology applications

• Abstract

• Optics Letters, Vol. 34, Issue 23, pp. 3692-3694 (December 2009)
• Peter A. Roos, Randy R. Reibel, Trenton Berg, Brant Kaylor, Zeb W. Barber, Wm. Randall Babbitt

Classical Hartmann test with scanning

• Abstract
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• Optics Express, Vol. 17, Issue 16, pp. 13959-13973 (August 2009)
• Rufino Díaz-Uribe, Fermín Granados-Agustín, Alejandro Cornejo-Rodríguez

Single shot amplitude and phase characterization of optical arbitrary waveforms

• Abstract
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• Optics Express, Vol. 17, Issue 16, pp. 14434-14443 (August 2009)
• V. R. Supradeepa, Daniel E. Leaird, Andrew M. Weiner

White-light scanning interferometer for absolute nano-scale gap thickness measurement

• Abstract
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• Optics Express, Vol. 17, Issue 17, pp. 15104-15117 (August 2009)
• Zhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, Soon Fatt Yoon

A distance meter using a terahertz intermode beat in an optical frequency comb

• Abstract
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• Optics Express, Vol. 17, Issue 20, pp. 17324-17337 (September 2009)
• Shuko Yokoyama, Toshiyuki Yokoyama, Yuki Hagihara, Tsutomu Araki, Takeshi Yasui

Large-area and high-resolution distortion measurement based on moiré fringe method for hot embossing process

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18394-18407 (October 2009)
• Zhiguang Xu, Hayden K. Taylor, Duane S. Boning, Soon Fatt Yoon, Kamal Youcef-Toumi

A simple and robust method to extend the dynamic range of an aberrometer

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 19055-19061 (October 2009)
• C. Leroux, C. Dainty

Few-cycle oscillator pulse train with constant carrier-envelope- phase and 65 as jitter

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20282-20290 (October 2009)
• Stefan Rausch, Thomas Binhammer, Anne Harth, Emilia Schulz, Martin Siegel, Uwe Morgner

Device based in-chip critical dimension and overlay metrology

• Abstract
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• Optics Express, Vol. 17, Issue 23, pp. 21336-21343 (November 2009)
• Young-Nam Kim, Jong-Sun Paek, Silvio Rabello, Sangbong Lee, Jiangtao Hu, Zhuan Liu, Yudong Hao, William McGahan

Design of zero reference codes using cross-entropy method

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 22163-22170 (November 2009)
• Jung-Chieh Chen

Simultaneous measurement of refractive index and wedge angle of optical windows using Fizeau interferometry and a cyclic path optical configuration

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4756-4761 (August 2009)
• Y. Pavan Kumar, Sanjib Chatterjee

Optical encoder based on a nondiffractive beam III

• Abstract

• Applied Optics, Vol. 48, Issue 27, pp. 5015-5024 (September 2009)
• Ariel Lutenberg, Fernando Perez-Quintián

Application of Fresnel diffraction from a phase step to the measurement of film thickness

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5497-5501 (October 2009)
• Mohammad Taghi Tavassoly, Iman Moaddel Haghighi, Khosrow Hassani

Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5561-5566 (October 2009)
• Takamasa Suzuki, Tsutomu Takahashi, Osami Sasaki

Adaptive thresholding and dynamic windowing method for automatic centroid detection of digital Shack-Hartmann wavefront sensor

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6088-6098 (November 2009)
• Xiaoming Yin, Xiang Li, Liping Zhao, Zhongping Fang