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Instrumentation, measurement, and metrology : Optical constants


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  • JOSA A, Vol. 31, Issue 4, pp. 836-845 (April 2014)
  • Ri-Liang Heng, Euntaek Lee, Laurent Pilon

  • Optics Letters, Vol. 38, Issue 19, pp. 3704-3707 (October 2013)
  • A. H. Cordes, D. H. Thomas, J. P. von der Weid

  • Optics Letters, Vol. 38, Issue 24, pp. 5438-5441 (December 2013)
  • Wenfeng Sun, Bin Yang, Xinke Wang, Yan Zhang, Robert Donnan

  • Optics Letters, Vol. 39, Issue 11, pp. 3086-3089 (June 2014)
  • R. Ramaseshan, S. Tripura Sundari, A. K. Balamurugan, Sitaram Dash, A. K. Tyagi, Y. Sato, T. Nakayama, H. Suematsu

  • Optics Express, Vol. 21, Issue 14, pp. 16670-16682 (July 2013)
  • Chan-Shan Yang, Chan-Ming Chang, Po-Han Chen, Peichen Yu, Ci-Ling Pan

  • Optics Express, Vol. 21, Issue 18, pp. 21254-21263 (September 2013)
  • Ilya L. Snetkov, Dmitry E. Silin, Oleg V. Palashov, Efim A. Khazanov, Hideki Yagi, Takagimi Yanagitani, Hitoki Yoneda, Akira Shirakawa, Ken-ichi Ueda, Alexander A. Kaminskii

  • Optics Express, Vol. 21, Issue 19, pp. 22194-22205 (September 2013)
  • Aleksandar D. Rakić, Thomas Taimre, Karl Bertling, Yah Leng Lim, Paul Dean, Dragan Indjin, Zoran Ikonić, Paul Harrison, Alexander Valavanis, Suraj P. Khanna, Mohammad Lachab, Stephen J. Wilson, Edmund H. Linfield, A. Giles Davies

  • Optics Express, Vol. 21, Issue 19, pp. 22389-22399 (September 2013)
  • Lingfeng Chen, Xiaofei Guo, Jinjian Hao

  • Optics Express, Vol. 21, Issue 19, pp. 22754-22761 (September 2013)
  • M. Baum, I. Alexeev, M. Latzel, S. H. Christiansen, M. Schmidt

  • Optics Express, Vol. 21, Issue 20, pp. 23272-23285 (October 2013)
  • Abdoulghafar Omari, Pieter Geiregat, Dries Van Thourhout, Zeger Hens

  • Optics Express, Vol. 21, Issue 20, pp. 23631-23639 (October 2013)
  • Xiaodong Yang, Changyu Hu, Huixu Deng, Daniel Rosenmann, David A. Czaplewski, Jie Gao

  • Optics Express, Vol. 21, Issue 23, pp. 27537-27549 (November 2013)
  • J. I. Larruquert, L. V. Rodríguez-de Marcos, J. A. Méndez, P. J. Martin, A. Bendavid

  • Optics Express, Vol. 22, Issue 5, pp. 5124-5132 (March 2014)
  • X. D. Li, T. P. Chen, Y. Liu, K. C. Leong

  • Optics Express, Vol. 22, Issue 15, pp. 18633-18647 (July 2014)
  • Thomas Taimre, Karl Bertling, Yah Leng Lim, Paul Dean, Dragan Indjin, Aleksandar D. Rakić

  • Applied Optics, Vol. 52, Issue 17, pp. 4054-4061 (June 2013)
  • Oleg Krupych, Viktoriya Savaryn, Andriy Krupych, Ivan Klymiv, Rostyslav Vlokh

  • Applied Optics, Vol. 53, Issue 4, pp. A42-A47 (February 2014)
  • Sungjin Park, Jai Dong Lim, Pazhanisami Peranantham, Hee Young Kang, Chang Kwon Hwangbo, SuYoung Lee, Seong-Su Kim

  • Applied Optics, Vol. 53, Issue 10, pp. B1-B7 (April 2014)
  • Oleg Krupych, Viktoriya Savaryn, Rostyslav Vlokh

  • Applied Optics, Vol. 53, Issue 13, pp. 2793-2801 (May 2014)
  • Yasuaki Hori, Akiko Hirai, Kaoru Minoshima

  • Applied Optics, Vol. 53, Issue 21, pp. 4804-4810 (July 2014)
  • Peep Adamson

  • Optical Materials Express, Vol. 4, Issue 8, pp. 1641-1656 (August 2014)
  • Daniel Franta, David Nečas, Lenka Zajíčková, Ivan Ohlídal
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