General theoretical formulation of image formation in digital Fresnel holography

• Abstract

• JOSA A, Vol. 25, Issue 7, pp. 1744-1761 (July 2008)
• Pascal Picart, Julien Leval

General theoretical formulation of image formation in digital Fresnel holography: erratum

• Abstract

• JOSA A, Vol. 26, Issue 2, pp. 244-244 (February 2009)
• Pascal Picart, Julien Leval

Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis

• Abstract

• Optics Letters, Vol. 33, Issue 17, pp. 1990-1992 (September 2008)
• Ravikiran Attota, Thomas A. Germer, Richard M. Silver

Optical efficiency of solar concentrators by a reverse optical path method

• Abstract

• Optics Letters, Vol. 33, Issue 18, pp. 2044-2046 (September 2008)
• A. Parretta, A. Antonini, E. Milan, M. Stefancich, G. Martinelli, M. Armani

Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2794-2796 (December 2008)
• Xiang Yu, Yukihiro Araki, Kentaro Iwami, Norihiro Umeda

Characterization of high-Q optical microcavities using confocal microscopy

• Abstract

• Optics Letters, Vol. 33, Issue 24, pp. 2931-2933 (December 2008)
• Rajan P. Kulkarni, Scott E. Fraser, Andrea M. Armani

Interferometer for precise and flexible asphere testing

• Abstract

• Optics Letters, Vol. 33, Issue 24, pp. 2973-2975 (December 2008)
• Eugenio Garbusi, Christof Pruss, Wolfgang Osten

Kinetics of photorefractive recording for circular light beams

• Abstract

• Optics Letters, Vol. 34, Issue 7, pp. 1036-1038 (April 2009)
• M. Kösters, B. Sturman, D. Haertle, K. Buse

Subsurface microscopy of integrated circuits with angular spectrum and polarization control

• Abstract

• Optics Letters, Vol. 34, Issue 8, pp. 1261-1263 (April 2009)
• F. H. Köklü, S. B. Ippolito, B. B. Goldberg, M. S. Ünlü

Widefield subsurface microscopy of integrated circuits

• Abstract
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• Optics Express, Vol. 16, Issue 13, pp. 9501-9506 (June 2008)
• Fatih Hakan Köklü, Justin I. Quesnel, Anthony N. Vamivakas, Stephen B. Ippolito, Bennett B. Goldberg, M. Selim Ünlü

Statistical parameters and analysis of local contrast gloss

• Abstract
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• Optics Express, Vol. 16, Issue 16, pp. 12415-12422 (August 2008)
• Antti Oksman, Mikko Juuti, Kai-Erik Peiponen

Optical sensitivity analysis of deformed mirrors for microcantilever array IR imaging

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4367-4381 (March 2009)
• Haitao Shi, Qingchuan Zhang, Jian Qian, Liang Mao, Teng Cheng, Jie Gao, Xiaoping Wu, Dapeng Chen, Binbin Jiao

Large-area and high-resolution distortion measurement based on moiré fringe method for hot embossing process

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 18394-18407 (October 2009)
• Zhiguang Xu, Hayden K. Taylor, Duane S. Boning, Soon Fatt Yoon, Kamal Youcef-Toumi

Photogrammetric endoscope for measurement of inner cylindrical surfaces using fringe projection

• Abstract

• Applied Optics, Vol. 47, Issue 21, pp. 3868-3876 (July 2008)
• Armando G. Albertazzi, Jr., Allan C. Hofmann, Analucia V. Fantin, João M. C. Santos

Concurrent measurement of linear and circular birefringence using rotating-wave-plate Stokes polarimeter

• Abstract

• Applied Optics, Vol. 47, Issue 25, pp. 4529-4539 (September 2008)
• Jing-Fung Lin

In situ monitoring of surface postprocessing in large-aperture fused silica optics with optical coherence tomography

• Abstract

• Applied Optics, Vol. 47, Issue 25, pp. 4569-4573 (September 2008)
• Gabe M. Guss, Isaac L. Bass, Richard P. Hackel, Christian Mailhiot, Stavros G. Demos

Exact wavefront recovery with tilt from lateral shear interferograms

• Abstract

• Applied Optics, Vol. 48, Issue 14, pp. 2760-2766 (May 2009)
• Zi-qiang Yin

Optical density measurement of thin-film transistor liquid crystal display by a monochrome light-emitting diode

• Abstract

• Applied Optics, Vol. 48, Issue 17, pp. 3165-3169 (June 2009)
• Fu-Ming Tzu, Jung-Hua Chou

Feasibility study of imaging spectroscopy to monitor the quality of online welding

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4735-4742 (August 2009)
• Jesús Mirapeix, P. Beatriz García-Allende, Adolfo Cobo, Olga M. Conde, José M. López-Higuera

Measurement of low-derivative surface lenses by two-laser holography with Bi₁₂TiO₂₀ crystals

• Abstract

• Applied Optics, Vol. 48, Issue 27, pp. 5114-5120 (September 2009)
• Eduardo A. Barbosa, Camila B. F. de Sousa, Wellington M. Maffei