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Instrumentation, measurement, and metrology : Optical inspection


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  • Optics Letters, Vol. 39, Issue 12, pp. 3547-3550 (June 2014)
  • Sandy Peterhänsel, Hannu Laamanen, Markku Kuittinen, Jari Turunen, Christof Pruss, Wolfgang Osten, Jani Tervo

  • Optics Letters, Vol. 39, Issue 13, pp. 3853-3856 (July 2014)
  • J. L. M. van Mechelen, A. B. Kuzmenko, H. Merbold

  • Optics Letters, Vol. 39, Issue 16, pp. 4727-4730 (August 2014)
  • Karol Karnowski, Ireneusz Grulkowski, Nishant Mohan, Ian Cox, Maciej Wojtkowski

  • Optics Express, Vol. 22, Issue 9, pp. 10914-10922 (May 2014)
  • Manuel Servin, Guillermo Garnica, Julio C. Estrada, J. M. Padilla

  • Optics Express, Vol. 22, Issue 11, pp. 13250-13262 (June 2014)
  • S. Roy, A. C. Assafrão, S. F. Pereira, H. P. Urbach

  • Optics Express, Vol. 22, Issue 11, pp. 13472-13483 (June 2014)
  • José A. Rodrigo, Tatiana Alieva

  • Optics Express, Vol. 22, Issue 13, pp. 15804-15819 (June 2014)
  • Rong Su, Mikhail Kirillin, Ernest W. Chang, Ekaterina Sergeeva, Seok H. Yun, Lars Mattsson

  • Optics Express, Vol. 22, Issue 13, pp. 15969-15974 (June 2014)
  • Haiteng Xu, Dawei He, Ming Fu, Wenshuo Wang, Hongpeng Wu, Yongsheng Wang

  • Optics Express, Vol. 22, Issue 14, pp. 17370-17381 (July 2014)
  • Soonyang Kwon, Namyoon Kim, Taeyong Jo, Heui Jae Pahk

  • Optics Express, Vol. 22, Issue 18, pp. 22043-22055 (September 2014)
  • Guan Xu, Lina Sun, Xiaotao Li, Jian Su, Zhaobing Hao, Xue Lu

  • Applied Optics, Vol. 53, Issue 11, pp. 2477-2486 (April 2014)
  • Wenrui Cai, Ping Zhou, Chunyu Zhao, James H. Burge

  • Applied Optics, Vol. 53, Issue 20, pp. 4604-4610 (July 2014)
  • Jong-Ahn Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Ho Suhng Suh, Jae Wan Kim

  • Applied Optics, Vol. 53, Issue 22, pp. 4922-4929 (August 2014)
  • Yanjun Du, Yanjun Ding, Yufeng Liu, Lijuan Lan, Zhimin Peng

  • Applied Optics, Vol. 53, Issue 23, pp. 5131-5140 (August 2014)
  • Lu Li, Dong Liu, Pin Cao, Shibin Xie, Yang Li, Yangjie Chen, Yongying Yang

  • Applied Optics, Vol. 53, Issue 23, pp. 5230-5237 (August 2014)
  • Plinio Jesús Pinzón, Isabel Pérez, José Manuel Sánchez-Pena, Carmen Vázquez

  • Applied Optics, Vol. 53, Issue 24, pp. 5283-5289 (August 2014)
  • Wei-Hung Su, Cho-Yo Kuo, Fu-Jen Kao

  • Applied Optics, Vol. 53, Issue 24, pp. 5510-5516 (August 2014)
  • Dawei Tang, Feng Gao, X. Jiang

  • Applied Optics, Vol. 53, Issue 25, pp. 5694-5700 (September 2014)
  • Dali Liu, Yun Wang, Lirong Qiu, Xinyue Mao, Weiqian Zhao

  • Applied Optics, Vol. 53, Issue 27, pp. 6280-6286 (September 2014)
  • Ke Kou, Xingfei Li, Li Li, Hongbiao Xiang

  • Applied Optics, Vol. 53, Issue 27, pp. G33-G43 (September 2014)
  • Chris Edwards, Renjie Zhou, Suk-Won Hwang, Steven J. McKeown, Kaiyuan Wang, Basanta Bhaduri, Raman Ganti, Peter J. Yunker, Arjun G. Yodh, John A. Rogers, Lynford L. Goddard, Gabriel Popescu
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