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Instrumentation, measurement, and metrology : Phase measurement


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  • Optics Letters, Vol. 39, Issue 14, pp. 4080-4083 (July 2014)
  • Felix Rohde, Erik Benkler, Thomas Puppe, Reinhard Unterreitmayer, Armin Zach, Harald R. Telle

  • Optics Letters, Vol. 39, Issue 15, pp. 4549-4552 (August 2014)
  • Yujie Lu, Yunhui Liu, Tak Kit Lau

  • Optics Express, Vol. 22, Issue 13, pp. 15437-15446 (June 2014)
  • Cristoffer J. Blackhall, Kaye S. Morgan, Daniele Pelliccia

  • Optics Express, Vol. 22, Issue 13, pp. 15918-15923 (June 2014)
  • Razvan G. Ungureanu, Gabriel V. Cojocaru, Romeo A. Banici, Daniel Ursescu

  • Optics Express, Vol. 22, Issue 13, pp. 16087-16098 (June 2014)
  • Yu Takiguchi, Tomoko Otsu, Takashi Inoue, Haruyoshi Toyoda

  • Optics Express, Vol. 22, Issue 14, pp. 17172-17186 (July 2014)
  • Chao Zuo, Qian Chen, Lei Huang, Anand Asundi

  • Optics Express, Vol. 22, Issue 14, pp. 17430-17439 (July 2014)
  • Daesuk Kim, Yoonho Seo, Moonseob Jin, Yonghee Yoon, Won Chegal, Yong Jae Cho, Hyun Mo Cho, Dahi G. Abdelsalam, Robert Magnusson

  • Optics Express, Vol. 22, Issue 15, pp. 18203-18213 (July 2014)
  • Yangjin Kim, Kenichi Hibino, Naohiko Sugita, Mamoru Mitsuishi

  • Optics Express, Vol. 22, Issue 15, pp. 18214-18223 (July 2014)
  • Thomas S. Schwarze, Oliver Gerberding, Felipe Guzmán Cervantes, Gerhard Heinzel, Karsten Danzmann

  • Optics Express, Vol. 22, Issue 15, pp. 18310-18324 (July 2014)
  • Chao Zuo, Qian Chen, Hongru Li, Weijuan Qu, Anand Asundi

  • Optics Express, Vol. 22, Issue 16, pp. 18870-18880 (August 2014)
  • Gregory A. Howland, Daniel J. Lum, John C. Howell

  • Applied Optics, Vol. 53, Issue 19, pp. 4150-4157 (July 2014)
  • Rahul G. Waghmare, Deepak Mishra, G. R. K. Sai Subrahmanyam, Earu Banoth, Sai Siva Gorthi

  • Applied Optics, Vol. 53, Issue 19, pp. 4334-4342 (July 2014)
  • Peter J. de Groot

  • Applied Optics, Vol. 53, Issue 20, pp. 4565-4579 (July 2014)
  • Visa Korkiakoski, Christoph U. Keller, Niek Doelman, Matthew Kenworthy, Gilles Otten, Michel Verhaegen

  • Applied Optics, Vol. 53, Issue 21, pp. 4628-4636 (July 2014)
  • Leslie L. Deck

  • Applied Optics, Vol. 53, Issue 22, pp. 4881-4885 (August 2014)
  • Lyle E. Roberts, Robert L. Ward, Andrew J. Sutton, Roland Fleddermann, Glenn de Vine, Emmanuel A. Malikides, Danielle M. R. Wuchenich, David E. McClelland, Daniel A. Shaddock

  • Applied Optics, Vol. 53, Issue 27, pp. G33-G43 (September 2014)
  • Chris Edwards, Renjie Zhou, Suk-Won Hwang, Steven J. McKeown, Kaiyuan Wang, Basanta Bhaduri, Raman Ganti, Peter J. Yunker, Arjun G. Yodh, John A. Rogers, Lynford L. Goddard, Gabriel Popescu

  • Applied Optics, Vol. 53, Issue 27, pp. G44-G63 (September 2014)
  • Wolfgang Osten, Ahmad Faridian, Peng Gao, Klaus Körner, Dinesh Naik, Giancarlo Pedrini, Alok Kumar Singh, Mitsuo Takeda, Marc Wilke

  • Chinese Optics Letters, Vol. 12, Issue 7, pp. 071801- (July 2014)
  • Liang Xue, Shouyu Wang, Keding Yan, Nan Sun, Zhenhua Li, Fei Liu

  • Optica, Vol. 1, Issue 1, pp. 39-44 (July 2014)
  • Matthew D. Seaberg, Bosheng Zhang, Dennis F. Gardner, Elisabeth R. Shanblatt, Margaret M. Murnane, Henry C. Kapteyn, Daniel E. Adams
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