Instrumentation, measurement, and metrology : Phase measurement

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Differential phase decoder in a polarized optical heterodyne interferometer

• Abstract

• JOSA A, Vol. 25, Issue 11, pp. 2630-2635 (November 2008)
• Chien Chou, Hui-Kang Teng, Chien-Chung Tsai, Jheng-Syong Wu

Large step-height measurements using multiple-wavelength holographic interferometry with tunable laser diodes

• Abstract

• JOSA A, Vol. 25, Issue 12, pp. 3013-3020 (December 2008)
• Atsushi Wada, Makoto Kato, Yukihiro Ishii

Slow-light interferometry: practical limitations to spectroscopic performance

• Abstract

• JOSA B, Vol. 25, Issue 12, pp. C136-C143 (December 2008)
• Zhimin Shi, Robert W. Boyd

Phase-locked generation and field-resolved detection of widely tunable terahertz pulses with amplitudes exceeding 100 MV/cm

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2767-2769 (December 2008)
• Alexander Sell, Alfred Leitenstorfer, Rupert Huber

Spectral phase measurements for broad Raman sidebands by using spectral interferometry

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2809-2811 (December 2008)
• Takayuki Suzuki, Naoki Sawayama, Masayuki Katsuragawa

Coherent optical frequency transfer over 50-km physical distance using a 120-km-long installed telecom fiber network

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16459-16466 (October 2008)
• Mitsuru Musha, Feng-Lei Hong, Ken'ichi Nakagawa, Ken-ichi Ueda

A focal-spot diagnostic for on-shot characterization of high-energy petawatt lasers

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16561-16572 (October 2008)
• J. Bromage, S.-W. Bahk, D. Irwin, J. Kwiatkowski, A. Pruyne, M. Millecchia, M. Moore, J. D. Zuegel

Near- to far-field imaging of phase evolution of light emanating from a metal nanoslit

• Abstract
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• Optics Express, Vol. 16, Issue 23, pp. 18881-18888 (November 2008)
• Yun Suk Jung, Yonggang Xi, Jeff Wuenschell, Hong Koo Kim

Algorithm for multiple-beam Fizeau interferograms with arbitrary phase shifts

• Abstract
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• Optics Express, Vol. 16, Issue 23, pp. 18922-18932 (November 2008)
• Jiancheng Xu, Qiao Xu, Liqun Chai, Hansheng Peng

Phase-difference detection based on a double position sensing detector configuration for coherent combination

• Abstract

• Applied Optics, Vol. 47, Issue 27, pp. 4868-4873 (September 2008)
• Pu Zhou, Zejin Liu, Xiaojun Xu

Intersatellite range monitoring using optical interferometry

• Abstract

• Applied Optics, Vol. 47, Issue 27, pp. 5007-5019 (September 2008)
• R. Pierce, J. Leitch, M. Stephens, P. Bender, R. Nerem

Infrared Mueller matrix acquisition and preprocessing system

• Abstract

• Applied Optics, Vol. 47, Issue 27, pp. 5019-5027 (September 2008)
• Arthur H. Carrieri, David J. Owens, Jonathan C. Schultz

Phase retrieval of singular scalar light fields using a two-dimensional directional wavelet transform and a spatial carrier

• Abstract

• Applied Optics, Vol. 47, Issue 28, pp. 5201-5207 (October 2008)
• Alejandro Federico, Guillermo H. Kaufmann

Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5400-5407 (October 2008)
• Shien Ri, Motoharu Fujigaki, Yoshiharu Morimoto

Windowed Fourier transform for fringe pattern analysis: theoretical analyses

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5408-5419 (October 2008)
• Qian Kemao, Haixia Wang, Wenjing Gao

Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5420-5428 (October 2008)
• Qian Kemao, Wenjing Gao, Haixia Wang

Spatial carrier phase-shifting algorithm based on least-squares iteration

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5446-5453 (October 2008)
• Jiancheng Xu, Qiao Xu, Hansheng Peng

Dual-wavelength low-coherence instantaneous phase-shifting interferometer to measure the shape of a segmented mirror with subnanometer precision

• Abstract

• Applied Optics, Vol. 47, Issue 29, pp. 5473-5491 (October 2008)
• Rainer Wilhelm, Bruno Luong, Alain Courteville, Sébastien Estival, Frédéric Gonté, Nicolas Schuhler

Resolution-enhanced subpixel phase retrieval method

• Abstract

• Applied Optics, Vol. 47, Issue 32, pp. 6079-6087 (November 2008)
• Xiaojun-Hu , Shengyi-Li , Yulie-Wu

Closed-loop phase-shifting homodyne interferometry using heterodyne phase detection

• Abstract

• Applied Optics, Vol. 47, Issue 33, pp. 6219-6225 (November 2008)
• Youichi Bitou

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