Estimating the polarization degree of polarimetric images in coherent illumination using maximum likelihood methods

• Abstract

• JOSA A, Vol. 26, Issue 6, pp. 1348-1359 (June 2009)
• Florent Chatelain, Jean-Yves Tourneret, Muriel Roche, Mehdi Alouini

Influence of air-filling fraction on forward Raman-like scattering by transversely trapped acoustic resonances in photonic crystal fibers

• Abstract

• JOSA B, Vol. 26, Issue 8, pp. 1641-1648 (August 2009)
• A. Brenn, G. S. Wiederhecker, M. S. Kang, H. Hundertmark, N. Joly, P. St.J. Russell

Liquid-crystal polarization rotator and a tunable polarizer

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1801-1803 (June 2009)
• Avner Safrani, I. Abdulhalim

Conversion of laser-frequency noise to optical-rotation noise in cesium vapor

• Abstract

• Optics Letters, Vol. 34, Issue 16, pp. 2519-2521 (August 2009)
• Ricardo Jiménez-Martínez, Svenja Knappe, W. Clark Griffith, John Kitching

Method for retrieving the polarization properties of a waveplate assembled in a multispectral, complete polarimeter

• Abstract

• Optics Letters, Vol. 34, Issue 17, pp. 2599-2601 (September 2009)
• André Hollstein, Thomas Ruhtz

Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure

• Abstract

• Optics Letters, Vol. 34, Issue 17, pp. 2661-2663 (September 2009)
• Petr Hlubina, Dalibor Ciprian, Jiri Lunacek

Total elimination of sampling errors in polarization imagery obtained with integrated microgrid polarimeters

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3187-3189 (October 2009)
• J. Scott Tyo, Charles F. LaCasse, Bradley M. Ratliff

Interpolation strategies for reducing IFOV artifacts in microgrid polarimeter imagery

• Abstract
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• Optics Express, Vol. 17, Issue 11, pp. 9112-9125 (May 2009)
• Bradley M. Ratliff, Charles F. LaCasse, J. Scott Tyo

Dynamic polarization states and birefringence distributions measurements in spatial elliptical polariscope using Fourier analysis method

• Abstract
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• Optics Express, Vol. 17, Issue 12, pp. 10144-10154 (June 2009)
• Piotr Kurzynowski, Slawomir Drobczynski, Wladyslaw A. Wozniak

Direct evidence of tilted Bragg grating azimuthal radiation mode coupling mechanisms

• Abstract
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• Optics Express, Vol. 17, Issue 16, pp. 14075-14087 (August 2009)
• Robert B. Walker, Stephen J. Mihailov, Dan Grobnic, Ping Lu, Xiaoyi Bao

Adapted polarization state contrast image

• Abstract
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• Optics Express, Vol. 17, Issue 16, pp. 14199-14210 (August 2009)
• Michael Richert, Xavier Orlik, Antonello De Martino

On polarization metrology (estimation) of the degree of coherence of optical waves

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15623-15634 (August 2009)
• O.V. Angelsky, S. G. Hanson, C.Yu. Zenkova, M.P. Gorsky, N.V. Gorodyns’ka

Measurement of linear birefringence and diattenuation properties of optical samples using polarimeter and Stokes parameters

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15860-15884 (August 2009)
• Po-Chun Chen, Yu-Lung Lo, Tsung-Chih Yu, Jing-Fung Lin, Tsung-Tse Yang

Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection

• Abstract
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• Optics Express, Vol. 17, Issue 24, pp. 21396-21407 (November 2009)
• Santosh Tripathi, Kimani C. Toussaint

Performance of three- and five-stack achromatic half-wave plates at millimeter wavelengths

• Abstract

• Applied Optics, Vol. 48, Issue 19, pp. 3614-3625 (July 2009)
• Tomotake Matsumura, Shaul Hanany, Peter Ade, Bradley R. Johnson, Terry J. Jones, Prashanth Jonnalagadda, Giorgio Savini

Optimization of system parameters for a complete multispectral polarimeter

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4767-4773 (August 2009)
• André Hollstein, Thomas Ruhtz, Jürgen Fischer, René Preusker

Accurate cross-sectional stress profiling of optical fibers

• Abstract

• Applied Optics, Vol. 48, Issue 26, pp. 4985-4995 (September 2009)
• Michael R. Hutsel, Reeve Ingle, Thomas K. Gaylord

Angle resolved Mueller polarimetry with a high numerical aperture and characterization of transparent biaxial samples

• Abstract

• Applied Optics, Vol. 48, Issue 27, pp. 5025-5034 (September 2009)
• Bicher Haj Ibrahim, Sami Ben Hatit, Antonello De Martino

Design and experimental validation of a snapshot polarization contrast imager

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5764-5773 (October 2009)
• Arnaud Bénière, Mehdi Alouini, François Goudail, Daniel Dolfi

Polarimetric stellar interferometry by use of birefringent retarders

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5774-5781 (October 2009)
• Naoshi Murakami, Naoko Ohishi, Jun Nishikawa, Masanori Yoshizawa