Optics InfoBase
Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry
Electronic speckle-pattern interferometer using holographic optical elements for vibration measurements
Mode-shape measurement of piezoelectric plate using temporal speckle pattern interferometry and temporal standard deviation
The oriented spatial filter masks for electronic speckle pattern interferometry phase patterns
High-speed, sub-Nyquist interferometry
Dynamic phase retrieval in temporal speckle pattern interferometry using least squares method and windowed Fourier filtering
Adaptive noise reduction method for DSPI fringes based on bi-dimensional ensemble empirical mode decomposition
Anisotropic coupled diffusion filter and binarization for the electronic speckle pattern interferometry fringes
Quantitative shearography: error reduction by using more than three measurement channels
Measurement of nanometric displacements by correlating two speckle interferograms
Application of the radial basis function interpolation to phase extraction from a single electronic speckle pattern interferometric fringe
Enlarging the angle of view in Michelson-interferometer-based shearography by embedding a 4f system
Double-exposure phase calculation method in electronic speckle pattern interferometry based on holographic object illumination
Localized Fourier transform filter for noise removal in electronic speckle pattern interferometry wrapped phase patterns
Speckle and fringe dynamics in imaging-speckle-pattern interferometry for spatial-filtering velocimetry
Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry
Overview of anisotropic filtering methods based on partial differential equations for electronic speckle pattern interferometry
Speckle-noise-reduction method of projecting interferometry fringes based on power spectrum density
Application of two oriented partial differential equation filtering models on speckle fringes with poor quality and their numerically fast algorithms
Toward fast malaria detection by secondary speckle sensing microscopy
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Adv. Opt. Photon.Applied OpticsApplied SpectroscopyBiomed. Opt. ExpressChinese Optics LettersJ. Display Technol.J. Lightwave Technol.J. Opt. Commun. Netw.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)J. Opt. Soc. Am. AJ. Opt. Soc. Am. BJ. Opt. Soc. KoreaJ. Opt. Technol.MeetingsOptics & Photonics NewsOpt. Mater. ExpressOptics ExpressOptics LettersOptics News (1975-1989)
Select a Journal: Adv. Opt. Photon.Applied OpticsApplied SpectroscopyBiomed. Opt. ExpressChinese Optics LettersJ. Display Technol.J. Lightwave Technol.J. Opt. Commun. Netw.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)J. Opt. Soc. Am. AJ. Opt. Soc. Am. BJ. Opt. Soc. KoreaJ. Opt. Technol.MeetingsOpt. Mater. ExpressOptics ExpressOptics LettersOptics News (1975-1989) Year