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Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation


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  • JOSA B, Vol. 31, Issue 7, pp. 1499-1507 (July 2014)
  • Patrick Ehlers, Junyang Wang, Isak Silander, Ove Axner

  • Optics Letters, Vol. 39, Issue 8, pp. 2270-2273 (April 2014)
  • A. Sargsyan, A. Tonoyan, R. Mirzoyan, D. Sarkisyan, A. M. Wojciechowski, A. Stabrawa, W. Gawlik

  • Optics Letters, Vol. 39, Issue 9, pp. 2688-2690 (May 2014)
  • D. A. Long, A. J. Fleisher, K. O. Douglass, S. E. Maxwell, K. Bielska, J. T. Hodges, D. F. Plusquellic

  • Optics Letters, Vol. 39, Issue 10, pp. 2967-2970 (May 2014)
  • Yongkang Dong, Taofei Jiang, Lei Teng, Hongying Zhang, Liang Chen, Xiaoyi Bao, Zhiwei Lu

  • Optics Letters, Vol. 39, Issue 11, pp. 3270-3273 (June 2014)
  • Yuwei Jin, Simona M. Cristescu, Frans J. M. Harren, Julien Mandon

  • Optics Letters, Vol. 39, Issue 14, pp. 4124-4127 (July 2014)
  • S. R. Domingue, D. G. Winters, R. A. Bartels

  • Optics Letters, Vol. 39, Issue 14, pp. 4227-4230 (July 2014)
  • Greg Bostrom, Andrew Rice, Dean Atkinson

  • Optics Express, Vol. 22, Issue 7, pp. 7711-7721 (April 2014)
  • Elias Kristensson, Joakim Bood, Marcus Alden, Emil Nordström, Jiajian Zhu, Sven Huldt, Per-Erik Bengtsson, Hampus Nilsson, Edouard Berrocal, Andreas Ehn

  • Optics Express, Vol. 22, Issue 7, pp. 8165-8189 (April 2014)
  • Yong-Le Pan, Steven C. Hill, Joshua L. Santarpia, Kelly Brinkley, Todd Sickler, Mark Coleman, Chatt Williamson, Kris Gurton, Melvin Felton, Ronald G. Pinnick, Neal Baker, Jonathan Eshbaugh, Jerry Hahn, Emily Smith, Ben Alvarez, Amber Prugh, Warren Gardner

  • Optics Express, Vol. 22, Issue 9, pp. 10519-10534 (May 2014)
  • Toby K. Boyson, Dylan R. Rittman, Thomas G. Spence, Maria E. Calzada, Abhijit G. Kallapur, Ian R. Petersen, K. Paul Kirkbride, David S. Moore, Charles C. Harb

  • Optics Express, Vol. 22, Issue 10, pp. 11660-11669 (May 2014)
  • Mikael Lassen, David Balslev-Clausen, Anders Brusch, Jan C. Petersen

  • Optics Express, Vol. 22, Issue 11, pp. 13014-13021 (June 2014)
  • Jie Li, Bo Gao, Chun Qi, Jingping Zhu, Xun Hou

  • Optics Express, Vol. 22, Issue 11, pp. 13170-13189 (June 2014)
  • Yabai He, Chunjiang Jin, Ruifeng Kan, Jianguo Liu, Wenqing Liu, Julian Hill, Ian M. Jamie, Brian J. Orr

  • Optics Express, Vol. 22, Issue 11, pp. 13889-13895 (June 2014)
  • Chadi Abd Alrahman, Amir Khodabakhsh, Florian M. Schmidt, Zhechao Qu, Aleksandra Foltynowicz

  • Optics Express, Vol. 22, Issue 12, pp. 14575-14587 (June 2014)
  • Peng Wang, Rajesh Menon

  • Optics Express, Vol. 22, Issue 13, pp. 15668-15678 (June 2014)
  • Vladimir Ya. Molchanov, Konstantin B. Yushkov

  • Optics Express, Vol. 22, Issue 14, pp. 17430-17439 (July 2014)
  • Daesuk Kim, Yoonho Seo, Moonseob Jin, Yonghee Yoon, Won Chegal, Yong Jae Cho, Hyun Mo Cho, Dahi G. Abdelsalam, Robert Magnusson

  • Optics Express, Vol. 22, Issue 15, pp. 18299-18309 (July 2014)
  • A. Reyes-Reyes, Z. Hou, E. van Mastrigt, R. C. Horsten, J. C. de Jongste, M. W. Pijnenburg, H. P. Urbach, N. Bhattacharya

  • Applied Optics, Vol. 53, Issue 13, pp. 2793-2801 (May 2014)
  • Yasuaki Hori, Akiko Hirai, Kaoru Minoshima

  • Applied Optics, Vol. 53, Issue 19, pp. 4117-4122 (July 2014)
  • Sébastien B. Morales, Edouard Pangui, Xavier Landsheere, Ha Tran, Jean-Michel Hartmann
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