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Optics InfoBase
Validity criterion for the Born approximation convergence in microscopy imaging
Modeling phase microscopy of transparent three-dimensional objects: a product-of-convolutions approach
Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging
Reconstruction of high-resolution holographic microscopic images
Improving resolution by the second-order correlation of light fields
Common-path multimodal optical microscopy
Digital holographic microscopy with physical phase compensation
Real-time slit scanning microscopy in the meridional plane
Demonstration of spatially inhomogeneous vector beams with elliptical symmetry
Far-field superresolution imaging with dual-dye-doped nanoparticles
On illumination schemes for wide-field CARS microscopy
Investigation of angular multiplexing and de-multiplexing of digital holograms recorded in microscope configuration
Highly sensitive size discrimination of sub-micron objects using optical Fourier processing based on two-dimensional Gabor filters
Two-point-separation in a sub-micron nonscanning IR super-resolution microscope based on transient fluorescence detected IR spectroscopy
Effect of aberration on height calibration in three-dimensional localization-based microscopy and particle tracking
Multimodal optical imaging of microvessel network convective oxygen transport dynamics
Rapid measurement of a Mueller matrix for biological tissues
Optical tweezers with tips grown at the end of fibers by photopolymerization
Ultraviolet-to-visible image conversion microscopy using photoluminescence from self-assembled CdSe/ZnCdMgSe quantum dots and quantum wells
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Select a Journal: J. Opt. Soc. Am. AJ. Opt. Soc. Am. BApplied OpticsOptics LettersOptics ExpressAdv. Opt. Photon.J. Opt. Netw. (2002-2009)J. Opt. Soc. Am. (1917-1983)Virtual J. Biomed. Opt.J. Opt. Commun. Netw.J. Lightwave Technol.J. Opt. Technol.J. Display Technol.Chinese Optics LettersApplied Spectroscopy Year