Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy

• Abstract

• JOSA A, Vol. 25, Issue 8, pp. 2102-2113 (August 2008)
• Brynmor J. Davis, P. Scott Carney

Partially coherent illumination in full-field interferometric synthetic aperture microscopy

• Abstract

• JOSA A, Vol. 26, Issue 2, pp. 376-386 (February 2009)
• Daniel L. Marks, Brynmor J. Davis, Stephen A. Boppart, P. Scott Carney

Extended focused imaging of a microparticle field with digital holographic microscopy

• Abstract

• Optics Letters, Vol. 33, Issue 14, pp. 1626-1628 (July 2008)
• Maciej Antkowiak, Natacha Callens, Catherine Yourassowsky, Frank Dubois

Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator

• Abstract

• Optics Letters, Vol. 33, Issue 14, pp. 1629-1631 (July 2008)
• Reto Fiolka, Markus Beck, Andreas Stemmer

Trimodal imaging system capable of quantitative phase imaging without 2π ambiguities: erratum

• Abstract

• Optics Letters, Vol. 33, Issue 16, pp. 1923-1923 (August 2008)
• Kert Edward, Terrill W. Mayes, Bob Hocken, Faramarz Farahi

Dual-interference-channel quantitative-phase microscopy of live cell dynamics

• Abstract
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• Optics Letters, Vol. 34, Issue 6, pp. 767-769 (March 2009)
• Natan T. Shaked, Matthew T. Rinehart, Adam Wax

Optical properties of tissues quantified by Fourier-transform light scattering

• Abstract

• Optics Letters, Vol. 34, Issue 9, pp. 1372-1374 (May 2009)
• Huafeng Ding, Freddy Nguyen, Stephen A. Boppart, Gabriel Popescu

Phase contrast coherence microscopy based on transverse scanning

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1750-1752 (June 2009)
• Michael Pircher, Bernhard Baumann, Erich Götzinger, Harald Sattmann, Christoph K. Hitzenberger

A new scanning heterodyne interferometer scheme for mapping both surface structure and effective local reflection coefficient

• Abstract
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• Optics Express, Vol. 16, Issue 17, pp. 13456-13464 (August 2008)
• Kang Hyuck Kwon, Bong Soo Kim, Kyuman Cho

Probing dielectric interfaces on the nanoscale with elastic scattering patterns of single gold nanorods

• Abstract
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• Optics Express, Vol. 16, Issue 19, pp. 14635-14644 (September 2008)
• Tina Züchner, Antonio Virgilio Failla, Mathias Steiner, Alfred J. Meixner

Spectroscopic ultrahigh-resolution full-field optical coherence microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 17082-17091 (October 2008)
• Arnaud Dubois, Julien Moreau, Claude Boccara

Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 22, pp. 17186-17195 (October 2008)
• S. M. Motaghian Nezam, C. Joo, G. J. Tearney, J. F. de Boer

Simultaneous dual-band ultra-high resolution full-field optical coherence tomography

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19434-19446 (November 2008)
• Delphine Sacchet, Julien Moreau, Patrick Georges, Arnaud Dubois

Partially coherent image formation in differential interference contrast (DIC) microscope

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19462-19479 (November 2008)
• Shalin B. Mehta, Colin J. Sheppard

Digital reconstruction based on angular spectrum diffraction with the ridge of wavelet transform in holographic phase-contrast microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 26, pp. 21971-21981 (December 2008)
• Jiawen Weng, Jingang Zhong, Cuiying Hu

Computational signal-to-noise ratio analysis for optical quadrature microscopy

• Abstract
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• Optics Express, Vol. 17, Issue 4, pp. 2400-2422 (February 2009)
• William C. Warger II, Charles A. DiMarzio

Diffraction Phase Cytometry: blood on a CD-ROM

• Abstract
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• Optics Express, Vol. 17, Issue 4, pp. 2579-2585 (February 2009)
• Mustafa Mir, Zhuo Wang, Krishnarao Tangella, Gabriel Popescu

White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4495-4499 (March 2009)
• Maitreyee Roy, Joanna Schmit, Parameswaran Hariharan

Phase, amplitude, and polarization microscopy with a sampling field sensor

• Abstract

• Applied Optics, Vol. 47, Issue 19, pp. D96-D109 (July 2008)
• Remy Tumbar

Iterative least square phase-measuring method that tolerates extended finite bandwidth illumination

• Abstract

• Applied Optics, Vol. 48, Issue 6, pp. 1158-1167 (February 2009)
• Florin Munteanu, Joanna Schmit