Automated analysis of differential interference contrast microscopy images of the foveal cone mosaic

• Abstract

• JOSA A, Vol. 25, Issue 5, pp. 1181-1189 (May 2008)
• David H. Wojtas, Bing Wu, Peter K. Ahnelt, Philip J. Bones, R. P. Millane

Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy

• Abstract

• JOSA A, Vol. 25, Issue 8, pp. 2102-2113 (August 2008)
• Brynmor J. Davis, P. Scott Carney

Interferometric polarization coherent anti-Stokes Raman scattering (IP-CARS) microscopy

• Abstract

• Optics Letters, Vol. 33, Issue 6, pp. 602-604 (March 2008)
• Fake Lu, Wei Zheng, Colin Sheppard, Zhiwei Huang

Extended focused imaging of a microparticle field with digital holographic microscopy

• Abstract

• Optics Letters, Vol. 33, Issue 14, pp. 1626-1628 (July 2008)
• Maciej Antkowiak, Natacha Callens, Catherine Yourassowsky, Frank Dubois

Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator

• Abstract

• Optics Letters, Vol. 33, Issue 14, pp. 1629-1631 (July 2008)
• Reto Fiolka, Markus Beck, Andreas Stemmer

Trimodal imaging system capable of quantitative phase imaging without 2π ambiguities: erratum

• Abstract

• Optics Letters, Vol. 33, Issue 16, pp. 1923-1923 (August 2008)
• Kert Edward, Terrill W. Mayes, Bob Hocken, Faramarz Farahi

Method for characterization of diffusion properties of photopolymerisable systems

• Abstract
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• Optics Express, Vol. 16, Issue 12, pp. 8487-8497 (June 2008)
• Tzwetanka Babeva, Izabela Naydenova, Suzanne Martin, Vincent Toal

Quantitative phase imaging by three-wavelength digital holography

• Abstract
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• Optics Express, Vol. 16, Issue 13, pp. 9753-9764 (June 2008)
• Christopher J. Mann, Philip R. Bingham, Vincent C. Paquit, Kenneth W. Tobin

Digital holography of total internal reflection

• Abstract
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• Optics Express, Vol. 16, Issue 13, pp. 9811-9820 (June 2008)
• William M. Ash, Myung K. Kim

A new scanning heterodyne interferometer scheme for mapping both surface structure and effective local reflection coefficient

• Abstract
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• Optics Express, Vol. 16, Issue 17, pp. 13456-13464 (August 2008)
• Kang Hyuck Kwon, Bong Soo Kim, Kyuman Cho

Probing dielectric interfaces on the nanoscale with elastic scattering patterns of single gold nanorods

• Abstract
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• Optics Express, Vol. 16, Issue 19, pp. 14635-14644 (September 2008)
• Tina Züchner, Antonio Virgilio Failla, Mathias Steiner, Alfred J. Meixner

Spectroscopic ultrahigh-resolution full-field optical coherence microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 17082-17091 (October 2008)
• Arnaud Dubois, Julien Moreau, Claude Boccara

Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 22, pp. 17186-17195 (October 2008)
• S. M. Motaghian Nezam, C. Joo, G. J. Tearney, J. F. de Boer

Simultaneous dual-band ultra-high resolution full-field optical coherence tomography

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19434-19446 (November 2008)
• Delphine Sacchet, Julien Moreau, Patrick Georges, Arnaud Dubois

Partially coherent image formation in differential interference contrast (DIC) microscope

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19462-19479 (November 2008)
• Shalin B. Mehta, Colin J. Sheppard

Digital reconstruction based on angular spectrum diffraction with the ridge of wavelet transform in holographic phase-contrast microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 26, pp. 21971-21981 (December 2008)
• Jiawen Weng, Jingang Zhong, Cuiying Hu

Quantitative phase measurements using optical quadrature microscopy

• Abstract

• Applied Optics, Vol. 47, Issue 10, pp. 1684-1696 (April 2008)
• Willie S. Rockward, Anthony L. Thomas, Bing Zhao, Charles A. DiMarzio

Robust, common path, phase shifting interferometer and optical profilometer

• Abstract

• Applied Optics, Vol. 47, Issue 10, pp. B32-B43 (April 2008)
• Remy Tumbar, Daniel L. Marks, David J. Brady

Stabilizing method for reflection interference contrast microscopy

• Abstract

• Applied Optics, Vol. 47, Issue 12, pp. 2070-2075 (April 2008)
• Kipom Kim, Omar A. Saleh

Phase, amplitude, and polarization microscopy with a sampling field sensor

• Abstract

• Applied Optics, Vol. 47, Issue 19, pp. D96-D109 (July 2008)
• Remy Tumbar