High-resolution total-internal-reflection fluorescence microscopy using periodically nanostructured glass slides

• Abstract

• JOSA A, Vol. 26, Issue 12, pp. 2550-2557 (December 2009)
• Anne Sentenac, Kamal Belkebir, Hugues Giovannini, Patrick C. Chaumet

Dual-interference-channel quantitative-phase microscopy of live cell dynamics

• Abstract
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• Optics Letters, Vol. 34, Issue 6, pp. 767-769 (March 2009)
• Natan T. Shaked, Matthew T. Rinehart, Adam Wax

Optical properties of tissues quantified by Fourier-transform light scattering

• Abstract

• Optics Letters, Vol. 34, Issue 9, pp. 1372-1374 (May 2009)
• Huafeng Ding, Freddy Nguyen, Stephen A. Boppart, Gabriel Popescu

Phase contrast coherence microscopy based on transverse scanning

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1750-1752 (June 2009)
• Michael Pircher, Bernhard Baumann, Erich Götzinger, Harald Sattmann, Christoph K. Hitzenberger

Wide-field extended-resolution fluorescence microscopy with standing surface-plasmon-resonance waves

• Abstract

• Optics Letters, Vol. 34, Issue 15, pp. 2366-2368 (August 2009)
• Euiheon Chung, Yang-Hyo Kim, Wai Teng Tang, Colin J. R. Sheppard, Peter T. C. So

Controlling depth of focus in 3D image reconstructions by flexible and adaptive deformation of digital holograms

• Abstract
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• Optics Letters, Vol. 34, Issue 18, pp. 2787-2789 (September 2009)
• P. Ferraro, M. Paturzo, P. Memmolo, A. Finizio

Differential interference contrast imaging using a spatial light modulator

• Abstract

• Optics Letters, Vol. 34, Issue 19, pp. 2988-2990 (October 2009)
• Timothy J. McIntyre, Christian Maurer, Stefan Bernet, Monika Ritsch-Marte

Wide-field high-resolution surface-plasmon interference microscopy

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3110-3112 (October 2009)
• Michael G. Somekh, Graham Stabler, Shugang Liu, Jing Zhang, Chung W. See

High-dynamic-range quantitative phase imaging with spectral domain phase microscopy

• Abstract

• Optics Letters, Vol. 34, Issue 21, pp. 3442-3444 (November 2009)
• Jun Zhang, Bin Rao, Lingfeng Yu, Zhongping Chen

White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4495-4499 (March 2009)
• Maitreyee Roy, Joanna Schmit, Parameswaran Hariharan

Quadriwave lateral shearing interferometry for quantitative phase microscopy of living cells

• Abstract
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• Optics Express, Vol. 17, Issue 15, pp. 13080-13094 (July 2009)
• Pierre Bon, Guillaume Maucort, Benoit Wattellier, Serge Monneret

Isotropic image in structured illumination microscopy patterned with a spatial light modulator

• Abstract
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• Optics Express, Vol. 17, Issue 17, pp. 14710-14721 (August 2009)
• Bo-Jui Chang, Li-Jun Chou, Yun-Ching Chang, Su-Yu Chiang

Characterisation of a resolution enhancing image inversion interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15491-15501 (August 2009)
• Kai Wicker, Simon Sindbert, Rainer Heintzmann

Two-step-only phase-shifting interferometry with optimized detector bandwidth for microscopy of live cells

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15585-15591 (August 2009)
• Natan T. Shaked, Yizheng Zhu, Matthew T. Rinehart, Adam Wax

Phase-shift resolving confocal microscopy with high axial resolution, wide range and reflectance disturbance resistibility

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 16281-16290 (August 2009)
• Jian Liu, Jiubin Tan, Chenguang Zhao, Zhenggui Ge, Daqing Zhang

Creating an extended focus image of a tilted object in Fourier digital holography

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20546-20552 (October 2009)
• Melania Paturzo, Pietro Ferraro

Iterative least square phase-measuring method that tolerates extended finite bandwidth illumination

• Abstract

• Applied Optics, Vol. 48, Issue 6, pp. 1158-1167 (February 2009)
• Florin Munteanu, Joanna Schmit

Measurement of two dimensional refractive index profiles of channel waveguides using an interferometric technique

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5704-5712 (October 2009)
• R. Oven

Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6195-6201 (November 2009)
• Jian Liu, Jiubin Tan, Hu Bin, Yuhang Wang

Suppression of the zero-order term in off-axis digital holography through nonlinear filtering

• Abstract

• Applied Optics, Vol. 48, Issue 34, pp. H186-H195 (December 2009)
• Nicolas Pavillon, Chandra Sekhar Seelamantula, Jonas Kühn, Michael Unser, Christian Depeursinge