Individual far-field model for photon sieves composed of square pinholes

• Abstract

• JOSA A, Vol. 27, Issue 6, pp. 1342-1346 (June 2010)
• Junyong Zhang, Qing Cao, Xingqiang Lu, Zunqi Lin

Exact space invariant illumination for partially coherent imaging systems

• Abstract

• JOSA A, Vol. 27, Issue 9, pp. 1953-1961 (September 2010)
• Takashi Nakamura, Chang Chang

Soft x-ray laser holography with wavelength resolution

• Abstract

• JOSA B, Vol. 25, Issue 11, pp. 1811-1814 (November 2008)
• P. W. Wachulak, M. C. Marconi, R. A. Bartels, C. S. Menoni, J. J. Rocca

Soft x-ray microscope constructed with a PMMA phase-reversal zone plate

• Abstract

• Optics Letters, Vol. 34, Issue 3, pp. 235-237 (February 2009)
• Jong Ju Park, Deuk Su Kim, Sang Chul Jeon, Juyun Park, Kyoung Hwan Lee, Jae-hwan Lee, Ki Nam Kim, Jung Jae Yoo, Chang Hee Nam

Microscopy of extreme ultraviolet lithography masks with 13.2 nm tabletop laser illumination

• Abstract

• Optics Letters, Vol. 34, Issue 3, pp. 271-273 (February 2009)
• F. Brizuela, Y. Wang, C. A. Brewer, F. Pedaci, W. Chao, E. H. Anderson, Y. Liu, K. A. Goldberg, P. Naulleau, P. Wachulak, M. C. Marconi, D. T. Attwood, J. J. Rocca, C. S. Menoni

Single-shot soft-x-ray digital holographic microscopy with an adjustable field of view and magnification

• Abstract

• Optics Letters, Vol. 34, Issue 5, pp. 623-625 (March 2009)
• Ming-Chang Chou, Ru-Ping Huang, Ping-Hsun Lin, Chang-Tai Huang, Szu-yuan Chen, Hsu-Hsin Chu, Jyhpyng Wang, Jiunn-Yuan Lin

X-ray Schwarzschild objective for the carbon window (λ~4.5 nm)

• Abstract

• Optics Letters, Vol. 34, Issue 19, pp. 2930-2932 (October 2009)
• Igor Artyukov, Yegor Bugayev, Olexander Devizenko, Eric Gullikson, Valeriy Kondratenko, Alexander Vinogradov

Holographic x-ray image reconstruction through the application of differential and integral operators

• Abstract

• Optics Letters, Vol. 35, Issue 7, pp. 928-930 (April 2010)
• Manuel Guizar-Sicairos, Diling Zhu, James R. Fienup, Benny Wu, Andreas Scherz, Joachim Stöhr

Sub-70 nm resolution tabletop microscopy at 13.8 nm using a compact laser–plasma EUV source

• Abstract

• Optics Letters, Vol. 35, Issue 14, pp. 2337-2339 (July 2010)
• Przemyslaw W. Wachulak, Andrzej Bartnik, Henryk Fiedorowicz

Optical ptychography: a practical implementation with useful resolution

• Abstract

• Optics Letters, Vol. 35, Issue 15, pp. 2585-2587 (August 2010)
• Andrew M. Maiden, John M. Rodenburg, Martin J. Humphry

Dynamic sample imaging in coherent diffractive imaging

• Abstract

• Optics Letters, Vol. 36, Issue 11, pp. 1954-1956 (June 2011)
• Jesse N. Clark, Corey T. Putkunz, Evan K. Curwood, David J. Vine, Robert Scholten, Ian McNulty, Keith A. Nugent, Andrew G. Peele

Laboratory soft-x-ray microscope for cryotomography of biological specimens

• Abstract
• 

• Optics Letters, Vol. 36, Issue 14, pp. 2728-2730 (July 2011)
• Michael Bertilson, Olov von Hofsten, Ulrich Vogt, Anders Holmberg, Athanasia E. Christakou, Hans M. Hertz

High-resolution computed tomography with a compact soft x-ray microscope

• Abstract
• 

• Optics Express, Vol. 17, Issue 13, pp. 11057-11065 (June 2009)
• Michael Bertilson, Olov von Hofsten, Ulrich Vogt, Anders Holmberg, Hans M. Hertz

High throughput and wide field of view EUV microscope for blur-free one-shot imaging of living organisms

• Abstract
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• Optics Express, Vol. 18, Issue 7, pp. 7203-7209 (March 2010)
• Takeo Ejima, Fumihiko Ishida, Hiromichi Murata, Mitsunori Toyoda, Tetsuo Harada, Toshihide Tsuru, Tadashi Hatano, Mihiro Yanagihara, Masaki Yamamoto, Haruo Mizutani

Extreme ultraviolet laser-based table-top aerial image metrology of lithographic masks

• Abstract
• 

• Optics Express, Vol. 18, Issue 14, pp. 14467-14473 (July 2010)
• Fernando Brizuela, Sergio Carbajo, Anne Sakdinawat, David Alessi, Dale H. Martz, Yong Wang, Bradley Luther, Kenneth A. Goldberg, Iacopo Mochi, David T. Attwood, Bruno La Fontaine, Jorge J. Rocca, Carmen S. Menoni

Ptychographic coherent x-ray diffractive imaging in the water window

• Abstract
• 

• Optics Express, Vol. 19, Issue 2, pp. 1037-1050 (January 2011)
• K. Giewekemeyer, M. Beckers, T. Gorniak, M. Grunze, T. Salditt, A. Rosenhahn

A 50nm spatial resolution EUV imaging–resolution dependence on object thickness and illumination bandwidth

• Abstract
• 

• Optics Express, Vol. 19, Issue 10, pp. 9541-9550 (May 2011)
• Przemyslaw W. Wachulak, Andrzej Bartnik, Henryk Fiedorowicz, Jerzy Kostecki

Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses

• Abstract
• 

• Optics Express, Vol. 19, Issue 16, pp. 15069-15076 (August 2011)
• Hanfei Yan, Volker Rose, Deming Shu, Enju Lima, Hyon Chol Kang, Ray Conley, Chian Liu, Nima Jahedi, Albert T. Macrander, G. Brian Stephenson, Martin Holt, Yong S. Chu, Ming Lu, Jörg Maser

Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

• Abstract
• 

• Optics Express, Vol. 19, Issue 21, pp. 19919-19924 (October 2011)
• Tsung-Yu Chen, Yu-Tung Chen, Cheng-Liang Wang, Ivan M. Kempson, Wah-Keat Lee, Yong S. Chu, Y. Hwu, G. Margaritondo

Non-linear iterative phase retrieval based on Frechet derivative

• Abstract
• 

• Optics Express, Vol. 19, Issue 23, pp. 22809-22819 (November 2011)
• V. Davidoiu, B. Sixou, M. Langer, F. Peyrin