Complete polarization state generator with one variable retarder and its application for fast and sensitive measuring of two-dimensional birefringence distribution

• Abstract

• JOSA A, Vol. 28, Issue 3, pp. 410-419 (March 2011)
• Michael Shribak

Anisotropy coefficients of a Mueller matrix

• Abstract

• JOSA A, Vol. 28, Issue 4, pp. 548-553 (April 2011)
• Oriol Arteaga, Enric Garcia-Caurel, Razvigor Ossikovski

Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film

• Abstract

• JOSA A, Vol. 28, Issue 6, pp. 1256-1261 (June 2011)
• R. M. A. Azzam, F. F. Sudradjat

Components of purity of a Mueller matrix

• Abstract

• JOSA A, Vol. 28, Issue 8, pp. 1578-1585 (August 2011)
• José J. Gil

Ellipsoid of the polarization degree: a vectorial, pure operatorial Pauli algebraic approach

• Abstract

• JOSA B, Vol. 28, Issue 4, pp. 596-601 (April 2011)
• Tiberiu Tudor, Vladimir Manea

Investigation of surface plasmon biosensing using gold nanoparticles enhanced ellipsometry

• Abstract

• Optics Letters, Vol. 36, Issue 5, pp. 775-777 (March 2011)
• Rakesh Singh Moirangthem, Yia-Chung Chang, Pei-Kuen Wei

Mueller matrix differential decomposition

• Abstract

• Optics Letters, Vol. 36, Issue 10, pp. 1942-1944 (May 2011)
• Noé Ortega-Quijano, José Luis Arce-Diego

Depolarizing differential Mueller matrices

• Abstract

• Optics Letters, Vol. 36, Issue 13, pp. 2429-2431 (July 2011)
• Noé Ortega-Quijano, José Luis Arce-Diego

Spectrally resolving single-shot polarimeter

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3048-3050 (August 2011)
• Sebastian Knitter, Tim Hellwig, Michael Kues, Carsten Fallnich

Fermionic out-of-plane structure of polarization singularities

• Abstract
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• Optics Letters, Vol. 36, Issue 19, pp. 3765-3767 (October 2011)
• Mark R. Dennis

Differential and product Mueller matrix decompositions: a formal comparison

• Abstract

• Optics Letters, Vol. 37, Issue 2, pp. 220-222 (January 2012)
• Razvigor Ossikovski

Retrieval of a nondepolarizing estimate from an experimental Mueller matrix through virtual experiment

• Abstract

• Optics Letters, Vol. 37, Issue 4, pp. 578-580 (February 2012)
• Razvigor Ossikovski

Integrating fault tolerance algorithm and circularly polarized ellipsometer for point-of-care applications

• Abstract
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• Optics Express, Vol. 19, Issue 6, pp. 5431-5441 (March 2011)
• Chia-Ming Jan, Yu-Hsun Lee, Kuang-Chong Wu, Chih-Kung Lee

Mueller matrix differential decomposition for direction reversal: application to samples measured in reflection and backscattering

• Abstract
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• Optics Express, Vol. 19, Issue 15, pp. 14348-14353 (July 2011)
• Noé Ortega-Quijano, José Luis Arce-Diego

Enpolarization of light by scattering media

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21313-21320 (October 2011)
• J. Sorrentini, M. Zerrad, G. Soriano, C. Amra

Measurement of electron paramagnetic resonance using terahertz time-domain spectroscopy

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 24950-24956 (December 2011)
• Kohei Kozuki, Takeshi Nagashima, Masanori Hangyo

Spatial and temporal variations in vector fields

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 25066-25076 (December 2011)
• C. Macías–Romero, M. R. Foreman, P. Török

Experimental validation of Mueller matrix differential decomposition

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1151-1163 (January 2012)
• Noé Ortega-Quijano, Bicher Haj-Ibrahim, Enric García-Caurel, José Luis Arce-Diego, Razvigor Ossikovski

Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials

• Abstract

• Applied Optics, Vol. 50, Issue 17, pp. 2773-2783 (June 2011)
• Peep Adamson

Accurate analysis of ellipsometric data for thick transparent films

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 5, pp. 053101- (May 2011)
• Yuan Zhao, Mingyu Sheng, Yuxiang Zheng, Liangyao Chen