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Thin films : Interference coatings


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  • Optics Letters, Vol. 39, Issue 7, pp. 1729-1732 (April 2014)
  • Michel Lequime, Boris Gralak, Sébastien Guenneau, Myriam Zerrad, Claude Amra

  • Optics Express, Vol. 22, Issue 9, pp. 10151-10164 (May 2014)
  • Zhichao Liu, Jin Luo, Yi Zheng, Ping Ma, Zhe Zhang, Yaowei Wei, Feng Pan, Songlin Chen

  • Optics Express, Vol. 22, Issue 10, pp. 11892-11899 (May 2014)
  • Minghong Yang, Weijing Xie, Yutang Dai, Dongwen Lee, Jixiang Dai, Yi Zhang, Zhi Zhuang

  • Optics Express, Vol. 22, Issue 16, pp. 19365-19374 (August 2014)
  • Qiushi Huang, Meint de Boer, Jonathan Barreaux, Robert van der Meer, Eric Louis, Fred Bijkerk

  • Optics Express, Vol. 22, Issue 20, pp. 24342-24347 (October 2014)
  • Vadim Veiko, Galina Odintsova, Eduard Ageev, Yulia Karlagina, Anatoliy Loginov, Alexandra Skuratova, Elena Gorbunova

  • Optics Express, Vol. 22, Issue 103, pp. A715-A722 (May 2014)
  • Oliver Höhn, Tobias Kraus, Gerard Bauhuis, Ulrich T. Schwarz, Benedikt Bläsi

  • Applied Optics, Vol. 53, Issue 4, pp. A16-A20 (February 2014)
  • Christian Mühlig, Simon Bublitz, Wolfgang Paa

  • Applied Optics, Vol. 53, Issue 4, pp. A360-A376 (February 2014)
  • Karen Hendrix, Jennifer D. T. Kruschwitz, Jason Keck

  • Applied Optics, Vol. 53, Issue 4, pp. A405-A411 (February 2014)
  • Huasong Liu, Yugang Jiang, Lishuan Wang, Jian Leng, Peng Sun, Kewen Zhuang, Yiqin Ji, Xinbin Cheng, Hongfei Jiao, Zhanshan Wang, Bingjun Wu

  • Applied Optics, Vol. 53, Issue 4, pp. A88-A95 (February 2014)
  • Hans Becker, Diana Tonova, Michael Sundermann, Henrik Ehlers, Stefan Günster, Detlev Ristau

  • Applied Optics, Vol. 53, Issue 7, pp. 1474-1480 (March 2014)
  • Jin-Cherng Hsu

  • Applied Optics, Vol. 53, Issue 9, pp. 1820-1825 (March 2014)
  • P. L. G. Jardim, A. F. Michels, F. Horowitz

  • Applied Optics, Vol. 53, Issue 12, pp. 2616-2624 (April 2014)
  • Marie-Maude de Denus-Baillargeon, Thomas Schmitt, Stéphane Larouche, Ludvik Martinu

  • Applied Optics, Vol. 53, Issue 13, pp. C45-C53 (May 2014)
  • Mary R. Kutteruf, Michael K. Yetzbacher, Michael J. DePrenger, Kyle M. Novak, Corey A. Miller, Trijntje Valerie Downes, Andrey V. Kanaev

  • Applied Optics, Vol. 53, Issue 15, pp. 3347-3354 (May 2014)
  • Shunli Chen, Pengpeng Gao, Yuanan Zhao, Yanzhi Wang, Zhou Fang, Yuxin Leng, Jianda Shao

  • Applied Optics, Vol. 53, Issue 15, pp. 3361-3369 (May 2014)
  • Yi Yu Li, Jiao Jie Chen, Hai Hua Feng, Hao Chen, Qin Mei Wang

  • Applied Optics, Vol. 53, Issue 16, pp. 3448-3453 (June 2014)
  • Jennifer D. T. Kruschwitz, Roy S. Berns

  • Applied Optics, Vol. 53, Issue 28, pp. 6598-6604 (October 2014)
  • Tibor Gál, Örs Sepsi, Paul A. Medwick, Andrew Wagner, Pál Koppa

  • Journal of Optical Technology, Vol. 81, Issue 10, pp. 607-611 (October 2014)
  • Doan Van Bac, E. S. Putilin

  • Optical Materials Express, Vol. 4, Issue 8, pp. 1696-1707 (August 2014)
  • Olaf Stenzel, Steffen Wilbrandt, Shan Du, Christian Franke, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, Mario Held
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