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Thin films : Interference coatings


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  • Optics Express, Vol. 22, Issue 9, pp. 10151-10164 (May 2014)
  • Zhichao Liu, Jin Luo, Yi Zheng, Ping Ma, Zhe Zhang, Yaowei Wei, Feng Pan, Songlin Chen

  • Optics Express, Vol. 22, Issue 10, pp. 11892-11899 (May 2014)
  • Minghong Yang, Weijing Xie, Yutang Dai, Dongwen Lee, Jixiang Dai, Yi Zhang, Zhi Zhuang

  • Optics Express, Vol. 22, Issue 16, pp. 19365-19374 (August 2014)
  • Qiushi Huang, Meint de Boer, Jonathan Barreaux, Robert van der Meer, Eric Louis, Fred Bijkerk

  • Optics Express, Vol. 22, Issue 20, pp. 24342-24347 (October 2014)
  • Vadim Veiko, Galina Odintsova, Eduard Ageev, Yulia Karlagina, Anatoliy Loginov, Alexandra Skuratova, Elena Gorbunova

  • Optics Express, Vol. 22, Issue 103, pp. A715-A722 (May 2014)
  • Oliver Höhn, Tobias Kraus, Gerard Bauhuis, Ulrich T. Schwarz, Benedikt Bläsi

  • Optics Express, Vol. 23, Issue 4, pp. 4703-4714 (February 2015)
  • Qing-Yuan Cai, Yu-Xiang Zheng, Hai-Han Luo, Dong-Dong Zhao, Xiao-Feng Ma, Ding-Quan Liu

  • Optics Express, Vol. 23, Issue 6, pp. 7120-7130 (March 2015)
  • Haomin Song, Suhua Jiang, Dengxin Ji, Xie Zeng, Nan Zhang, Kai Liu, Chu Wang, Yun Xu, Qiaoqiang Gan

  • Optics Express, Vol. 23, Issue 7, pp. 8609-8619 (April 2015)
  • Xinbin Cheng, Abudusalamu Tuniyazi, Zeyong Wei, Jinlong Zhang, Tao Ding, Hongfei Jiao, Bin Ma, Hongqiang Li, Tongbao Li, Zhanshan Wang

  • Optics Express, Vol. 23, Issue 9, pp. 10938-10956 (May 2015)
  • Maria Principe

  • Applied Optics, Vol. 53, Issue 13, pp. C45-C53 (May 2014)
  • Mary R. Kutteruf, Michael K. Yetzbacher, Michael J. DePrenger, Kyle M. Novak, Corey A. Miller, Trijntje Valerie Downes, Andrey V. Kanaev

  • Applied Optics, Vol. 53, Issue 15, pp. 3347-3354 (May 2014)
  • Shunli Chen, Pengpeng Gao, Yuanan Zhao, Yanzhi Wang, Zhou Fang, Yuxin Leng, Jianda Shao

  • Applied Optics, Vol. 53, Issue 15, pp. 3361-3369 (May 2014)
  • Yi Yu Li, Jiao Jie Chen, Hai Hua Feng, Hao Chen, Qin Mei Wang

  • Applied Optics, Vol. 53, Issue 16, pp. 3448-3453 (June 2014)
  • Jennifer D. T. Kruschwitz, Roy S. Berns

  • Applied Optics, Vol. 53, Issue 28, pp. 6598-6604 (October 2014)
  • Tibor Gál, Örs Sepsi, Paul A. Medwick, Andrew Wagner, Pál Koppa

  • Applied Optics, Vol. 54, Issue 2, pp. 299-305 (January 2015)
  • Kaimin Wu, Yongjun Huang, Tenglong Wanghuang, Weijian Chen, Guangjun Wen

  • Applied Optics, Vol. 54, Issue 9, pp. 2362-2370 (March 2015)
  • C. Franke, O. Stenzel, S. Wilbrandt, J. Wolf, N. Kaiser, A. Tünnermann

  • Applied Optics, Vol. 54, Issue 11, pp. 3433-3439 (April 2015)
  • Jinlong Zhang, Chong Cao, Alexander V. Tikhonravov, Michael K. Trubetskov, Artur Gorokh, Xinbin Cheng, Zhanshan Wang

  • Applied Optics, Vol. 54, Issue 11, pp. 3507-3512 (April 2015)
  • John Hennessy, April D. Jewell, Michael E. Hoenk, Shouleh Nikzad

  • Journal of Optical Technology, Vol. 81, Issue 10, pp. 607-611 (October 2014)
  • Doan Van Bac, E. S. Putilin

  • Optical Materials Express, Vol. 4, Issue 8, pp. 1696-1707 (August 2014)
  • Olaf Stenzel, Steffen Wilbrandt, Shan Du, Christian Franke, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, Mario Held
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