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Thin films : Materials and process characterization


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  • Optics Letters, Vol. 39, Issue 13, pp. 3927-3930 (July 2014)
  • Christopher M. Dodson, Jonathan A. Kurvits, Dongfang Li, Rashid Zia

  • Optics Letters, Vol. 39, Issue 14, pp. 4263-4266 (July 2014)
  • E. Orabona, A. Ambrosio, A. Longo, G. Carotenuto, L. Nicolais, P. Maddalena

  • Optics Express, Vol. 22, Issue 5, pp. 5675-5683 (March 2014)
  • Tuan-Shu Ho, Pochi Yeh, Cheng-Chung Tsai, Kuang-Yu Hsu, Sheng-Lung Huang

  • Optics Express, Vol. 22, Issue 5, pp. 5986-5994 (March 2014)
  • Mateusz Śmietana, Marcin Koba, Predrag Mikulic, Wojtek J. Bock

  • Optics Express, Vol. 22, Issue 8, pp. 8919-8927 (April 2014)
  • Hyungman Lee, Dongjin Lee, Junghwan Hwang, Dongil Nam, Changwan Byeon, Seung Hwan Ko, Seungsub Lee

  • Applied Optics, Vol. 53, Issue 4, pp. A114-A120 (February 2014)
  • M. Trubetskov, T. Amotchkina, A. Tikhonravov, V. Pervak

  • Applied Optics, Vol. 53, Issue 4, pp. A125-A130 (February 2014)
  • S. Wilbrandt, O. Stenzel, H. Nakamura, D. Wulff-Molder, A. Duparré, N. Kaiser

  • Applied Optics, Vol. 53, Issue 4, pp. A339-A350 (February 2014)
  • Samuel F. Pellicori, Carol L. Martinez, Paul Hausgen, David Wilt

  • Applied Optics, Vol. 53, Issue 4, pp. A377-A382 (February 2014)
  • Bo-Huei Liao, Chien-Nan Hsiao

  • Applied Optics, Vol. 53, Issue 4, pp. A52-A55 (February 2014)
  • Ronald R. Willey

  • Applied Optics, Vol. 53, Issue 5, pp. 850-860 (February 2014)
  • Shuvendu Jena, Raj Bahadur Tokas, Nitin M. Kamble, Sudhakar Thakur, Naba Kishore Sahoo

  • Applied Optics, Vol. 53, Issue 7, pp. 1298-1305 (March 2014)
  • Jian Sun, Jianda Shao, Kui Yi, Weili Zhang

  • Applied Optics, Vol. 53, Issue 8, pp. 1663-1673 (March 2014)
  • Laurent Frey, Pascale Parrein, Léopold Virot, Catherine Pellé, Jacques Raby

  • Applied Optics, Vol. 53, Issue 10, pp. B121-B127 (April 2014)
  • Viktor V. Brus, Leonid J. Pidkamin, Maria I. Ilashchuk, Pavlo D. Maryanchuk

  • Applied Optics, Vol. 53, Issue 15, pp. 3196-3202 (May 2014)
  • Matthew R. Abernathy, James Hough, Iain W. Martin, Sheila Rowan, Michelle Oyen, Courtney Linn, James E. Faller

  • Applied Optics, Vol. 53, Issue 15, pp. 3273-3277 (May 2014)
  • Xiao-Hui Tan, Yu Chen, Ye-Xiang Liu

  • Applied Optics, Vol. 53, Issue 19, pp. 4211-4215 (July 2014)
  • Guoying Yan, Zilong Bai, Shufang Wang, Liqing Sun, Jianglong Wang, Guangsheng Fu

  • Optical Materials Express, Vol. 4, Issue 2, pp. 338-345 (February 2014)
  • Hsu-Cheng Huang, Jerry I. Dadap, Irving P. Herman, Hassaram Bakhru, Richard M. Osgood

  • Optical Materials Express, Vol. 4, Issue 2, pp. 384-395 (February 2014)
  • Karel Palka, Tomas Syrovy, Siegmund Schröter, Sven Brückner, Manfred Rothhardt, Miroslav Vlcek

  • Optical Materials Express, Vol. 4, Issue 8, pp. 1696-1707 (August 2014)
  • Olaf Stenzel, Steffen Wilbrandt, Shan Du, Christian Franke, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, Mario Held
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