Thin films : Thin films, optical properties

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Self-consistent optical constants of sputter-deposited B₄C thin films

• Abstract

• JOSA A, Vol. 29, Issue 1, pp. 117-123 (January 2012)
• Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, José A. Méndez

Off-axis quasi-phase-matched second-order optical nonlinearity from χ⁽²⁾ gratings induced by holographic all-optical poling

• Abstract

• JOSA B, Vol. 29, Issue 1, pp. 23-28 (January 2012)
• Naoto Tsutsumi, Yuki Nagano

Hybrid structures of magnetic semiconductors and plasmonic crystals: a novel concept for magneto-optical devices [Invited]

• Abstract

• JOSA B, Vol. 29, Issue 2, pp. A103-A118 (February 2012)
• Ilya A. Akimov, Vladimir I. Belotelov, Alexey V. Scherbakov, Martin Pohl, Andrey N. Kalish, Alexey S. Salasyuk, Michael Bombeck, Christian Brüggemann, Andrey V. Akimov, Roslan I. Dzhioev, Vladimir L. Korenev, Yuri G. Kusrayev, Victor F. Sapega, Vyacheslav A. Kotov, Dmitri R. Yakovlev, Anatoly K. Zvezdin, Manfred Bayer

Effect of atomic layer deposition on the quality factor of silicon nanobeam cavities

• Abstract

• JOSA B, Vol. 29, Issue 2, pp. A55-A59 (February 2012)
• Michael Gehl, Ricky Gibson, Joshua Hendrickson, Andrew Homyk, Antti Säynätjoki, Tapani Alasaarela, Lasse Karvonen, Ari Tervonen, Seppo Honkanen, Sander Zandbergen, Benjamin C. Richards, J. D. Olitzky, Axel Scherer, Galina Khitrova, Hyatt M. Gibbs, Ju-Young Kim, Yong-Hee Lee

Luminescence in epitaxial Er-doped LiNbO₃ films

• Abstract

• Optics Letters, Vol. 37, Issue 3, pp. 419-421 (February 2012)
• Alexander M. Grishin, Sergey I. Khartsev

Determination of layer thickness and optical constants of thin films by using a modified pattern search method

• Abstract

• Optics Letters, Vol. 37, Issue 4, pp. 449-451 (February 2012)
• R. Miloua, Z. Kebbab, F. Chiker, K. Sahraoui, M. Khadraoui, N. Benramdane

Bound exciton photoluminescence from ion‑implanted phosphorus in thin silicon layers

• Abstract
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• Optics Express, Vol. 19, Issue 25, pp. 25255-25262 (December 2011)
• Hisashi Sumikura, Katsuhiko Nishiguchi, Yukinori Ono, Akira Fujiwara, Masaya Notomi

Strained germanium thin film membrane on silicon substrate for optoelectronics

• Abstract
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• Optics Express, Vol. 19, Issue 27, pp. 25866-25872 (December 2011)
• Donguk Nam, Devanand Sukhdeo, Arunanshu Roy, Krishna Balram, Szu-Lin Cheng, Kevin Chih-Yao Huang, Ze Yuan, Mark Brongersma, Yoshio Nishi, David Miller, Krishna Saraswat

Closed-form Maker fringe formulas for poled polymer thin films in multilayer structures

• Abstract
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• Optics Express, Vol. 20, Issue 1, pp. 173-185 (January 2012)
• Dong Hun Park, Warren N. Herman

Faraday Effect sensor redressed by Nd₂Fe₁₄B biasing magnetic film

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• Optics Express, Vol. 20, Issue 2, pp. 1754-1759 (January 2012)
• Xinbing Jiao, Truong Giang Nguyen, Bo Qian, Chunping Jiang, Lixin Ma

Polarizer-free, high-contrast inverted top-emitting organic light emitting diodes: effect of the electrode structure

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• Optics Express, Vol. 20, Issue 2, pp. 1816-1824 (January 2012)
• Hyunsu Cho, Seunghyup Yoo

Self-referenced composite Fabry-Pérot cavity vapor sensors

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• Optics Express, Vol. 20, Issue 2, pp. 966-971 (January 2012)
• Karthik Reddy, Xudong Fan

Highly absorbing solar cells—a survey of plasmonic nanostructures

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• Optics Express, Vol. 20, Issue 102, pp. A177-A189 (March 2012)
• Ricky B. Dunbar, Thomas Pfadler, Lukas Schmidt-Mende

Absorption coefficient modeling of microcrystalline silicon thin film using Maxwell-Garnett effective medium theory

• Abstract
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• Optics Express, Vol. 20, Issue 102, pp. A197-A204 (March 2012)
• Sheng-Hui Chen, Hsuan-Wen Wang, Ting-Wei Chang

Comparison of two techniques for reliable characterization of thin metal–dielectric films

• Abstract

• Applied Optics, Vol. 50, Issue 33, pp. 6189-6197 (November 2011)
• Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Vesna Janicki, Jordi Sancho-Parramon, Hrvoje Zorc

Optical characterization and reverse engineering based on multiangle spectroscopy

• Abstract

• Applied Optics, Vol. 51, Issue 2, pp. 245-254 (January 2012)
• Alexander V. Tikhonravov, Tatiana V. Amotchkina, Michael K. Trubetskov, Robert J. Francis, Vesna Janicki, Jordi Sancho-Parramon, Hrvoje Zorc, Vladimir Pervak

Optimizing the identification of mono- and bilayer graphene on multilayer substrates

• Abstract

• Applied Optics, Vol. 51, Issue 3, pp. 385-389 (January 2012)
• Christopher Kontis, Marcel R. Mueller, Christian Kuechenmeister, Klaus T. Kallis, Joachim Knoch

Linear and nonlinear optical properties of Au/SiO₂ nanocomposite prepared by P123

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 3, pp. 031601- (March 2012)
• Jingyue Fang, Shiqiao Qin, Xueao Zhang, Shengli Chang

Low-loss amorphous Si waveguides with gradient refractive index cladding structure

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 4, pp. 041601- (April 2012)
• Weibin Qiu, Jiaxian Wang

Linear and nonlinear optical properties of Co₃O₄ nanoparticle-doped polyvinyl-alcohol thin films

• Abstract
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• Optical Materials Express, Vol. 2, Issue 1, pp. 103-110 (January 2012)
• Xiushan Zhu, Jiafu Wang, Dan Nguyen, Jayan Thomas, Robert A. Norwood, N. Peyghambarian

Export and save citations. Select articles then choose an action.
Select all      Select an action... ------------------------ Export Citation in:   ► BibTeX   ► EndNote (RIS)   ► HTML (.html)   ► Plain Text ------------------------ Save to:   ► Personal Library

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